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    • 5. 发明公开
    • 반도체 장치, 반도체 장치의 시험 방법 및 반도체 장치시험 시스템
    • 半导体器件,半导体器件的测试方法和半导体器件测试系统
    • KR1020020095028A
    • 2002-12-20
    • KR1020020002029
    • 2002-01-14
    • 후지쯔 가부시끼가이샤
    • 다케시게마사유키히비노스미타카야마다겐지
    • G11C29/00
    • G11C29/40
    • PURPOSE: To provide a semiconductor device capable of shortening the time for testing, to two or more memory circuits with few misjudgment. CONSTITUTION: An address decoder 12 generates two or more selection signals SEL0-SEL3, so as to simultaneously select first to fourth memory circuits RAM 0-RAM3, on the basis of an address signal ADD for accessing to the memory circuit by a CPU 11 in testing mode. A multiplexer 13 outputs the read data from the one memory circuit to be accessed by the CPU 11 to the CPU 11. The CPU 11 confirms whether write data match the read data, and outputs a confirmation signal K1. A comparator 14 compares the read data RD0-RD3 read from the memory circuits RAM0-RAM3, respectively, and outputs a judgment signal K2.
    • 目的:提供能够缩短测试时间的半导体器件到两个或多个具有很少误判的存储器电路。 构成:地址解码器12基于用于由CPU 11访问存储电路的地址信号ADD,同时选择第一至第四存储电路RAM0-RAM3,生成两个或更多个选择信号SEL0-SEL3 测试模式。 复用器13将来自CPU11的一个存储器电路的读取数据输出到CPU 11.CPU 11确认写入数据是否与读取的数据相匹配,并且输出确认信号K1。 比较器14分别比较从存储器电路RAM0-RAM3读取的读取数据RD0-RD3,并输出判断信号K2。