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    • 3. 发明公开
    • 에러 검출/보정 회로 및 방법과, 전자 메모리 소자 또는메모리 모듈
    • 错误检测/校正电路及相关方法
    • KR1020080054412A
    • 2008-06-17
    • KR1020087009987
    • 2006-09-19
    • 엔엑스피 비 브이
    • 오스테르툰소엔케가르베요아힘크리스토프한스
    • G06F11/10
    • G06F11/1008
    • In order to provide an error detection / correction circuit (100; 100') as well as a method for detecting and/or for correcting at least one error of at least one data word, said data word comprising-information in the form of at least one information bit or at least one pay load data bit, and-redundancy in the form of at least one check bit or at least one redundant bit, wherein the number of the one or more check bits or redundant bits being supplemented to the respective data word is optimized, in particular wherein at least one physical memory space can be used in an optimized way depending on the requirements of the application, it is proposed-to perform at least one first error correction scheme being assigned to at least one first data path (30; 30'), and-to perform at least one second error correction scheme--being assigned to at least one second data path (40; 40'), and--being designed for increasing the information and/or the redundancy, in particular---for increasing the number of the one or more information bits or of the one or more pay load data bits and/or---for increasing the number of the one or more check bits or of the one or more redundant bits, of the respective data word being transmitted through the second data path (40; 40').
    • 为了提供错误检测/校正电路(100; 100')以及用于检测和/或校正至少一个数据字的至少一个错误的方法,所述数据字包括以下形式的信息:以 至少一个信息位或至少一个有效负载数据位,以及至少一个校验位或至少一个冗余位形式的冗余,其中所述一个或多个校验位或冗余位的数量被补充到相应的 数据字被优化,特别是其中至少一个物理存储器空间可以根据应用的要求以优化的方式使用,因此建议执行至少一个第一纠错方案被分配给至少一个第一数据 路径(30; 30'),以及 - 执行至少一个第二错误校正方案 - 被分配给至少一个第二数据路径(40; 40'),并且被设计为增加信息和/或 冗余,特别是---增加数字 一个或多个信息位或一个或多个付费负载数据位和/或用于增加相应数据字中的一个或多个校验位或一个或多个冗余位的数量, 通过第二数据路径(40; 40' )。