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1. 发明专利

JP2004508569A Method and apparatus for inspecting a printed circuit board using a parallel tester 有权
公开(公告)号：JP2004508569A
公开(公告)日：2004-03-18
申请号：JP2002526164
申请日：2001-08-07
申请人：アーテーゲー、テスト、ジステムス、ゲゼルシャフト、ミット、ベシュレンクテル、ハフツング、ウント、コンパニー、コマンディット、ゲゼルシャフトAtg Test Systems Gmbh & Co. Kg
发明人：ロートハウク，ウベ
IPC分类号： G01R31/02 , G01R31/28 , G01R31/309 , H05K3/00 , H05K13/00
CPC分类号： H05K13/0069 , G01R31/2805 , G01R31/2806 , G01R31/309
摘要：本発明はプリント回路基板を検査するための方法及びその装置であって、プリント回路基板は、その終点が検査のために接触することができる回路基板検査ポイントである導体路を有している。本方法は、以下のステップよりなる。並列テスターを用いて検査すべきプリント回路基板の検査において、検査すべきプリント回路基板の回路基板検査ポイントを並列テスターの接触要素に接触させ、回路基板検査ポイントが並列テスターにより信頼性をもって且つ正確に接触することができないと評価されるか、又は並列テスターにより本質的に接触することができないものかのいずれかを決定し、そして信頼性をもって正確に接触できないと判定された回路基板検査ポイントと、接触することができない回路基板検査ポイントと及び関連する導体路を並列テスターの接触要素から独立している装置によりチェックする。
【選択図】図１

2. 发明专利

JP2002303640A TESTER 审中-公开
公开(公告)号：JP2002303640A
公开(公告)日：2002-10-18
申请号：JP2001323885
申请日：2001-10-22
申请人： TEKTRONIX INC
发明人： TALLMAN JAMES L , KAWABATA FREDERICK Y , CLIMER EUGENE J , NIGHTINGALE MARK W
IPC分类号： G01R1/06 , G01R13/20 , G01R31/309
摘要： PROBLEM TO BE SOLVED: To easily position a probe from a tester even for a fine circuit of a device under test. SOLUTION: The tester 100 has input ports 105, 115 having an input terminal for receiving test signals from a probe 300 and a power output terminal for feeding power, respectively. The input terminal is also available for receiving video signals, and a display 110 of the tester displays pictures provided by the video signals and waveform tracks of test signals. A camera 200 fed with an operating power from the power output terminal of the tester supplies video signals to the input terminal of the tester.

3. 发明专利

JP2002031607A METHOD AND APPARATUS FOR INSPECTING PRINTED WIRING BOARD 失效
公开(公告)号：JP2002031607A
公开(公告)日：2002-01-31
申请号：JP2001146298
申请日：2001-05-16
申请人： LLOYD DOYLE LTD
发明人： DOYLE KEITH GILBERT , LLOYD ROY ANTHONY
IPC分类号： G01B11/24 , G01N21/88 , G01N21/956 , G01R31/309 , H05K3/00
摘要： PROBLEM TO BE SOLVED: To provide an apparatus for correctly and speedily testing printed wiring boards. SOLUTION: Optical scanning means are arranged to supply n×m discrete signals for each scanning in a Y direction. A processing means processes signals which supply signals indicating characteristics of the board along a strip and stores the signals. A control means makes the scanning means repeatedly scan the board in the Y direction and relatively advances the scanning means and the board by a predetermined amount in an X direction at the end of each scanning until a desired section of the board is scanned and the processing means processes a plurality of groups of the signals. Moreover, the processing means is arranged to distinguish a common section of conductive tracks so that a storage means includes information indicating X-Y coordinates of a plurality of data sections and indicating mutually connected data sections when the test is complete. The processing means has a plurality of processors. Each processor works for processing data of a ribbon corresponding to the scanned strip. The scanned strip is divided to a plurality of ribbons.

4. 发明专利

JP3223319B2 失效
公开(公告)号：JP3223319B2
公开(公告)日：2001-10-29
申请号：JP33701090
申请日：1990-11-30
IPC分类号： G02F1/1343 , G01R19/00 , G01R31/308 , G01R31/309 , H01L21/66

5. 发明专利

JP2001509263A 失效
公开(公告)号：JP2001509263A
公开(公告)日：2001-07-10
申请号：JP53240398
申请日：1998-01-29
IPC分类号： G01J5/48 , G01N25/72 , G01R31/309

6. 发明专利

JP3143038B2 失效
公开(公告)号：JP3143038B2
公开(公告)日：2001-03-07
申请号：JP10985695
申请日：1995-05-09
IPC分类号： G01B11/02 , G01B11/24 , G01C3/06 , G01N21/956 , G01R31/309 , G06T1/00

7. 发明专利

JP2000275191A X-RAY INSPECTING METHOD AND APPARATUS 失效
公开(公告)号：JP2000275191A
公开(公告)日：2000-10-06
申请号：JP8250199
申请日：1999-03-25
申请人： TECHNO ENAMI KK
发明人： TERAOKA AKIRA
IPC分类号： H05K3/34 , G01N23/04 , G01R31/04 , G01R31/304 , G01R31/309
摘要： PROBLEM TO BE SOLVED: To provide an X-ray inspecting apparatus capable of clearly judging the mounting state of a small-sized and highly densified electronic parts such as BGA or CSP to a substrate, particularly the lifting inferiority of a solder ball. SOLUTION: In the X-ray inspecting apparatus constituted so that an X-ray source 11 emitting X-rays and an X-ray detecting part 12 detecting X-rays are arranged in opposed relationship with a sample 13 inbetween and X-rays emitted from the X-ray source 11 to be transmitted through a sample are detected by the X-ray detecting part 12, the X-ray detecting part 12 is arranged so that the X-ray incident surface 12a thereof becomes parallel to an axis S and an oscillation means 16 oscillating the X-ray detecting means 12 centering around the axis S while always turning the X-ray incident surface 12a thereof in the same direction and a rotary means 15 rotating the X-ray source 11 around the axis S in synchronous relation to the X-ray detecting part 12.

8. 发明专利

JP3056269B2 失效
公开(公告)号：JP3056269B2
公开(公告)日：2000-06-26
申请号：JP5335491
申请日：1991-02-25
IPC分类号： G01B11/24 , G01B11/245 , G01N21/88 , G01N21/956 , G01R31/309 , H05K13/08

9. 发明专利

JPH09275272A SOLDERING CHECK DEVICE AND METHOD TAKING ADVANTAGE OF RELATIVE NEURON NETWORK 失效
公开(公告)号：JPH09275272A
公开(公告)日：1997-10-21
申请号：JP22418996
申请日：1996-08-26
申请人： SAMSUNG ELECTRONIC
发明人： KIN SHIYOUTEI
IPC分类号： G01R31/317 , B23K1/00 , G01N21/956 , G01R31/04 , G01R31/309 , G06T7/00 , H05K3/34
摘要： PROBLEM TO BE SOLVED: To enable a soldering check device to be applied to a check for the shape of a soldered part, by a method wherein the soldering check device is equipped with a recognition means which is capable of learning the boundary conditions of the hierarchies of an object of recognition to classify receiving picture image data extracted from a measurement means and recognizing the shape of a soldered part imitating a human classifying ability basing on sampled learning data when a new picture image is inputted. SOLUTION: A recognition means which recognizes the shape of a soldered part is capable of calculating a relative relation between pattern hierarchies to classify for the shape of a soldered part 2 converting the optional sampled picture image data extracted from a color picture image acquisition section under specific lighting conditions into vector data for a check for a soldered part 2. A relative neural network 10 which is capable of learning the synapse weight of nerve cells through the result of a comparison between the relative value and the judgment value of a user and recognizing the classification condition of the sampled picture image data of the soldered part. A sampled pattern average error function is obtained comparing the vector relative value with the judgment result of a user, whereby the shape of a soldered part can be checked.

10. 发明专利

JPH07140209A INSPECTION EQUIPMENT OF CIRCUIT WIRING BOARD AND ITS INSPECTION METHOD 失效
公开(公告)号：JPH07140209A
公开(公告)日：1995-06-02
申请号：JP4133394
申请日：1994-03-11
申请人： FUJITSU LTD
发明人： ITO AKIO , OZAKI KAZUYUKI , NAKAZAWA KAZUHIRO
IPC分类号： G01R31/02 , G01R31/302 , G01R31/309 , H01L21/66
摘要： PURPOSE:To conduct at high speed a continuity/insulation test between pads to be tested in a non-contact method in a circuit wing board tester. CONSTITUTION:A circuit wiring board tester has a photoconductive sheet 7, a light transmitting pattern control means 6, 5 which are installed on the photoconductive sheet 7 and controls the shape of an irradiating light 30 from a photoconductive sheet exciting light source 3 to form a first conductive path and a second conductive path in the photoconductive sheet 7, first laser plasma switch control means 1, 11 which control the continuity of a first to-be-tested pad IN in the circuit wiring board 9 to one end of a first conductive path, second laser plasma switch control means 2, 12 which control the continuity of a second to-be-tested pad OUT in the circuit wiring board 9 to one end of a second conductive path, and resistance measuring means 104, 105 which measure the resistance between the other end of the first conductive path and the other end of the second conductive path.

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