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    • 2. 发明专利
    • Slicing device, slicing method and cell observation method of biological specimen
    • 切片装置,切片方法和生物样本细胞观察方法
    • JP2014102147A
    • 2014-06-05
    • JP2012254175
    • 2012-11-20
    • Dastech Inc株式会社ダステックTsukasa Matsumoto司 松元
    • YOSHIDA SHUNJITAKAHASHI NOBUYUKIMATSUMOTO TSUKASA
    • G01N1/06C12Q1/02G01N1/28G01N1/30
    • G01N1/06G01N1/42Y10T83/041Y10T83/283
    • PROBLEM TO BE SOLVED: To hold a cell in a live state and slice a work piece of a biological specimen.SOLUTION: A slicing device for slicing a work piece W of a biological specimen comprises: a substrate 4 on which a work piece W is placed: means for freezing and fixing the work piece W on the substrate 4; and a blade 1 for slicing the work piece W freezed and fixed on the substrate 4 by rotation in a fixed rotation direction r. The shape of the tip 11 of the blade 1 is a curve in which a distance from a rotating shaft C is monotonously increased from an end being the nearest point Pmin having a distance Rmin shortest from the rotating shaft C to the other end being the farthest point Pmax having a distance Rmax longest from the rotating shaft C. The farthest point Pmax is behind positioned in the rotation direction r from the nearest point Pmin, and the curve is convex on the opposite side of the rotating shaft C to a straight line Q connecting the nearest point Pmin and the farthest point Pmax.
    • 要解决的问题:将细胞保持在活状态并切片生物样品的工件。解决方案:用于切片生物样品的工件W的切片装置包括:基板4,工件W在其上 放置:将工件W冷冻固定在基板4上的装置; 以及刀片1,用于通过沿固定旋转方向r旋转将工件W冷冻固定在基板4上。 叶片1的尖端11的形状是从旋转轴C的距离从距离旋转轴C最短距离最远的距离Rmin最近的最近点Pmin的端部单调增加到最远的一端的曲线 点Pmax距离旋转轴C最远的距离Rmax。最远点Pmax从最近点Pmin开始位于旋转方向r的后方,曲线在旋转轴C的相反侧成直线Q 连接最近点Pmin和最远点Pmax。
    • 5. 发明专利
    • Method of and apparatus for manufacturing semiconductor device
    • 制造半导体器件的方法和装置
    • JP2005252178A
    • 2005-09-15
    • JP2004064222
    • 2004-03-08
    • Toshiba Corp株式会社東芝
    • SHIMIZU NORIKOKUROSAWA TETSUYATAKU SHINYA
    • H01L21/301B28D5/00H01L21/78
    • B28D5/0011B23K26/364B23K26/40B23K2201/40B23K2203/50H01L21/304H01L21/78Y10T83/041Y10T225/30
    • PROBLEM TO BE SOLVED: To provide a method of and an apparatus for manufacturing semiconductor devices which enhance the manufacturing yield and also reduce the time required for dividing process. SOLUTION: Regions that become the starting points for cleavage consisting of at least either a plurality of grooves 12-1, 12-2, 12-3, ... or through holes are formed on pelletizing lines or dicing lines along cleavage faces of a wafer 10 in which semiconductor elements are formed, and a liquid substance is poured into the regions that become the starting points for cleavage. An external factor that physically changes the liquid substance is applied to make the change, and by utilizing the change, the wafer 10 is cleaved to divide it into individual semiconductor chips 13-1, 13-2, 13-3, .... Since the wafer 10 can be cleaved collectively, without applying external forces, the dividing method enhances the manufacturing yield and reduces the time required for the dividing process. COPYRIGHT: (C)2005,JPO&NCIPI
    • 要解决的问题:提供一种提高制造成品率并减少分割处理所需时间的半导体装置的制造方法和装置。 解决方案:成为切割起点的区域由至少多个槽12-1,12-2,12-3,...或通孔中的至少一个形成,在切割线或切割线上沿切割形成 其中形成有半导体元件的晶片10的表面,并且将液体物质注入到成为切割起点的区域中。 施加物理地改变液体物质的外部因素以改变,并且通过利用该变化,晶片10被切割以将其分成单独的半导体芯片13-1,13-2,13-3,.... 由于可以在不施加外力的情况下集中地切割晶片10,所以分割方法提高了制造成品率,并且缩短了分割处理所需的时间。 版权所有(C)2005,JPO&NCIPI