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1. 发明专利

JP2012173121A Eddy current-utilizing flaw detection testing apparatus and testing method of the same 审中-公开
标题翻译： EDDY电流 - 使用FLAW检测测试装置及其测试方法
公开(公告)号：JP2012173121A
公开(公告)日：2012-09-10
申请号：JP2011035059
申请日：2011-02-21
申请人： Toshiba Corp , 株式会社東芝
发明人： UENO SOICHI , KOBAYASHI NORIYASU , KITAJIMA YUKO , MARUYAMA SHIGEKI
IPC分类号： G01N27/90
摘要： PROBLEM TO BE SOLVED: To provide an eddy current-utilizing flaw detection testing apparatus capable of raising the detection sensitivity under the constraints of an exciting current attributable to the coil diameter and the number of coil windings attributable to geometric restriction.SOLUTION: An apparatus comprises an exciting coil group 12 in which n exciting coils (n is 3 or more) that generate eddy currents by directly giving a magnetic field to a checkup object 2 are so arranged that sections along the center axes of the coils are n-phase symmetric and detection coil groups 13a and 13b in which n detection coils that detect magnetic fields induced by the eddy currents are so arranged that sections along the center axes of the coils are n-phase symmetric.
摘要翻译：要解决的问题：提供一种涡流利用探伤测试装置，其能够在归因于线圈直径的励磁电流和由几何限制引起的线圈绕组数量的限制下提高检测灵敏度。解决方案：一种装置包括励磁线圈组12，其中通过向校验对象2直接产生磁场而产生涡流的n个励磁线圈（n为3个或更多个）被布置成沿着中心轴线线圈是n相对称的检测线圈组13a和13b，其中检测由涡流感应的磁场的n个检测线圈被布置成使得沿着线圈的中心轴的部分是n相对称的。版权所有（C）2012，JPO＆INPIT

2. 发明专利

JP2010266215A Eddy current flaw detection signal evaluation device, and eddy current flaw detection testing device and method of evaluating eddy current flaw detection signal including the eddy current flaw detection signal evaluation device 审中-公开
标题翻译： EDDY电流检测信号评估装置和EDDY电流检测测试装置以及评估EDDY电流检测信号的方法，包括EDDY电流检测信号评估装置
公开(公告)号：JP2010266215A
公开(公告)日：2010-11-25
申请号：JP2009115362
申请日：2009-05-12
申请人： Toshiba Corp , 株式会社東芝
发明人： KOBAYASHI NORIYASU , NAGAI SATOSHI , MASUDA YUKI
IPC分类号： G01N27/90
摘要： PROBLEM TO BE SOLVED: To evaluate a defect signal from data in flaw detection tests directly and easily, and to reduce inspection time without being affected by noise generated in lift-off.
SOLUTION: An eddy current flaw detection signal evaluation device 15 includes: a lift-off phase angle calculation section 23 acquiring an eddy current flaw detection signal detected by a probe 13 when performing lift-off operation of the probe 13 on an inspecting body 14 to calculate a phase angle following the lift-off operation; and a signal projection section 24 projecting to a two-dimensional rectangular coordinate system with a phase angle obtained by calculating an eddy current flaw detection signal of an eddy current flaw detection test obtained via the probe 13 by the lift-off phase angle calculation section 23 as one axis and ±90° from the phase angle as the other axis.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：直接且容易地从缺陷检测测试中的数据中评估缺陷信号，并且减少检查时间而不受剥离时产生的噪声的影响。涡流探伤信号评估装置15包括：剥离相位角计算部23，在检测探测器13进行探头13的剥离动作时，取得由探头13检测出的涡流探伤信号主体14，用于计算剥离操作之后的相位角; 以及信号投影部24，其通过计算由剥离相位角计算部23经由探头13得到的涡流探伤试验的涡流探伤信号而获得的相位角，投影到二维直角坐标系作为一轴，与相位角为±90°为另一轴。版权所有（C）2011，JPO＆INPIT

3. 发明专利

JP2009087633A X-ray source, and method for manufacturing the same 审中-公开
标题翻译： X射线源及其制造方法
公开(公告)号：JP2009087633A
公开(公告)日：2009-04-23
申请号：JP2007253998
申请日：2007-09-28
申请人： Toshiba Corp , Toshiba Electron Tubes & Devices Co Ltd , 東芝電子管デバイス株式会社 , 株式会社東芝
发明人： AOKI NOBUTADA , SUMIYA AKIKO , KOBAYASHI NORIYASU , MITSUNAKA YOSHIKA
IPC分类号： H01J35/06 , H01J35/08
摘要： PROBLEM TO BE SOLVED: To reduce an X-ray source in size while maintaining the insulation performance.
SOLUTION: The X-ray source has an emitter 4 that is mounted in a vacuum vessel 7 to emit electron when located in a given electric field, a target 6 that emits X-ray when the electron accelerated with a given voltage comes into collision, and an insulator 1 for supporting the emitter 4 and the target 6, for example, to which the voltage is applied within the vacuum vessel such that a given distance is kept. The insulator 1 is provided with a groove 12 crossing a line heading from the emitter 4 toward the target 6 along the top surfaces of the insulator 1 and the vacuum vessel 7. The groove 12 can be also formed by means of laser processing or etching.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：在保持绝缘性能的同时减小X射线源的尺寸。解决方案：X射线源具有安装在真空容器7中以在位于给定电场中时发射电子的发射体4，当以给定电压加速电子时发射X射线的靶6发生以及用于支撑发射器4和靶6的绝缘体1，例如在真空容器内施加电压使得保持给定的距离。绝缘体1设置有沿着绝缘体1和真空容器7的顶表面与从发射体4朝向靶6的线交叉的凹槽12.凹槽12也可以通过激光加工或蚀刻形成。版权所有（C）2009，JPO＆INPIT

4. 发明专利

JP2008268105A X-ray beam source, x-ray beam irradiator, x-ray beam radiographic device, x-ray beam computer tomography device, x-ray element mapping examination apparatus and x-ray beam forming method 审中-公开
标题翻译： X射线光束源，X射线光束辐射器，X射线光束射线装置，X射线光束计算机计算装置，X射线元件测绘装置和X射线光束形成方法
公开(公告)号：JP2008268105A
公开(公告)日：2008-11-06
申请号：JP2007113950
申请日：2007-04-24
申请人： Toshiba Corp , Toshiba Electron Tubes & Devices Co Ltd , 東芝電子管デバイス株式会社 , 株式会社東芝
发明人： KOBAYASHI NORIYASU , SUMIYA AKIKO , AOKI NOBUTADA , MITSUNAKA YOSHIKA
IPC分类号： G21K5/02 , G01N23/04 , G01N23/223 , G21K1/06 , G21K5/08 , H01J35/08 , H05G2/00
摘要： PROBLEM TO BE SOLVED: To obtain a small and light-weight X-ray beam source which forms X-ray beams.
SOLUTION: The X-ray beam source 13 has a lead-in wire 2 inserted into an insulating material 1 to apply voltage, a cathode placed at one end of the lead-in wire 2, a target 6 as an anode placed opposite to the cathode to generate X rays by colliding generated electron beams, a vacuum container 7 which accommodates the lead-in wire 2, the cathode and the target 6 and has an X-ray transmissive window 5 that transmits X rays, a filter 8 placed outside it to selectively extract characteristic X rays from X rays, a housing 10 accommodating the vacuum container 7 and the filter 8 and a Fresnel zone plate (FZP) 9 as an X-ray condensing element placed on the housing 10 to converge the characteristic X rays.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：获得形成X射线束的小而轻的X射线束源。解决方案：X射线束源13具有插入绝缘材料1中的引入线2以施加电压，放置在引入线2的一端的阴极，作为阳极的靶6 与阴极相对地通过碰撞产生的电子束产生X射线;容纳引入线2，阴极和靶6并具有透射X射线的X射线透射窗5的真空容器7;过滤器8 放置在其外部以从X射线中选择性地提取特征X射线，容纳真空容器7和滤光器8的壳体10和作为放置在壳体10上的X射线聚集元件的菲涅耳带状区域（FZP）9，以使特征 X射线版权所有（C）2009，JPO＆INPIT

5. 发明专利

JP2004093382A Electromagnetic wave detecting device 审中-公开
标题翻译：电磁波检测装置
公开(公告)号：JP2004093382A
公开(公告)日：2004-03-25
申请号：JP2002255533
申请日：2002-08-30
申请人： Toshiba Corp , 株式会社東芝
发明人： KOBAYASHI NORIYASU
IPC分类号： G01R29/08 , G01J1/02 , G02F1/01 , H04N5/30
摘要： PROBLEM TO BE SOLVED: To provide an electromagnetic wave detecting device capable of exerting its photoelectric effect efficiently and detecting the electromagnetic wave imaging with high sensitivity even in case the electromagnetic waves emitted and diffused from any object to be detected have a weak intensity. SOLUTION: The electromagnetic wave detecting device is composed of a wave converging optical element 12 to converge the electromagnetic waves emitted from the object to be detected 11, an electro-optical element 13 to be installed in that place including the focus of the electromagnetic waves and its neighboring where the section of either of them is overlapping on the section of a laser beam, a laser beam reflecting mirror 15 to cast the incident laser beam onto the electro-optical element 13, an analyzer 16 to give an intensity distribution to the laser beam substituted from the electromagnetic waves by the element 13, an image acquiring mechanism 18 to reflect the laser beam from the analyzer 16 onto a plane and acquire the image reflected, and an image processing mechanism 19 to detect the acquired image. COPYRIGHT: (C)2004,JPO
摘要翻译：解决的问题：为了提供一种能够有效地发挥其光电效应的电磁波检测装置，即使在从被检测物体发射和扩散的电磁波具有弱的强度的情况下也能以高灵敏度检测电磁波成像。解决方案：电磁波检测装置由聚光光学元件12组成，用于会聚从被检测物体11发射的电磁波，将电光元件13安装在该位置，包括焦点为电磁波及其相邻部分，其中任一个的部分在激光束的部分上重叠，激光束反射镜15将入射的激光束投射到电光元件13上，分析器16给出强度分布通过元件13对由电磁波代替的激光束，将来自分析器16的激光束反射到平面上并获得反射的图像的图像获取机构18以及用于检测所获取的图像的图像处理机构19。版权所有（C）2004，JPO

6. 发明专利

JP2014178200A Eddy current flaw detector and eddy current flaw detection method 有权
标题翻译： EDDY电流检测器和EDDY电流检测方法
公开(公告)号：JP2014178200A
公开(公告)日：2014-09-25
申请号：JP2013052236
申请日：2013-03-14
申请人： Toshiba Corp , 株式会社東芝
发明人： UENO SOICHI , KOBAYASHI NORIYASU
IPC分类号： G01N27/90
摘要： PROBLEM TO BE SOLVED: To provide an eddy current flaw detector capable of sizing of a flaw in pulse excitation eddy current flaw detection and capable of ensuring the inspection accuracy even on an inspection object which requires flaw detection at a deep position.SOLUTION: An eddy current flaw detector 10 includes: exciting means 14 that supplies a pulse-like current to each of excitation coils 11, two or more of which are disposable in an identical plane for forming an eddy current in an inspection object 1; detection means 17 that receives voltage signals detected by detection elements 15 which detect changes in eddy current distribution within the inspection object; holding means 13 that holds the excitation coils and the detection elements so as to perform three-dimensional scanning; calculation and extraction means 18 that calculates flaw position and flaw depth within the inspection object on the basis of the waveforms of the voltage signals detected by the detection means and time-changes of a frequency spectrum; and control means 19 that controls the holding means, when no time-change is generated on the frequency spectrum, to stop and to supply a pulse-like current having a time difference to each of the excitation coils.
摘要翻译：要解决的问题：提供一种能够在脉冲激励涡流探伤中确定缺陷尺寸的涡流探伤仪，并且即使在需要在深位置进行探伤的检查对象上也能够确保检查精度。解决方案：涡流电流探伤器10包括：励磁装置14，其向每个激励线圈11提供脉冲状电流，其中两个或更多个在一个相同的平面中用于在检查对象1中形成涡流; 检测装置17，其接收检测元件15检测出的电压信号，检测元件15检测检查对象内的涡流分布的变化; 保持装置13，其保持激励线圈和检测元件，以进行三维扫描; 计算和提取装置18，其基于由检测装置检测的电压信号的波形和频谱的时间变化来计算检查对象内的缺陷位置和缺陷深度; 以及控制装置19，其在频谱上没有产生时间变化的情况下控制保持装置停止并向每个励磁线圈提供具有时间差的脉冲状电流。

7. 发明专利

JP2014025704A Eddy current flaw detection device 有权
标题翻译： EDDY电流检测装置
公开(公告)号：JP2014025704A
公开(公告)日：2014-02-06
申请号：JP2012163597
申请日：2012-07-24
申请人： Toshiba Corp , 株式会社東芝
发明人： NOMURA KODAI , SENDA ITARU , UENO SOICHI , KOBAYASHI NORIYASU , ICHIKAWA HIROYA
IPC分类号： G01N27/90
摘要： PROBLEM TO BE SOLVED: To provide en eddy current flaw detection device for attaining the miniaturization of a sensor part and excellent reliability and sensitivity in defect detection.SOLUTION: A sensor part 10 of an eddy current flaw detection device includes: a sensing surface 11 adjacent to the front surface of an inspected body; multiple coils 12 (12a, 12b) arrayed to make a right angle with the sensing surface 11 and making an angle with each other; a drive unit for exciting the coils 12 and detecting an induction magnetic field of an eddy current generated in an inspected body 30; and a magnetic core 20 for filling spaces 14 between adjacent end surfaces 13 (13a, 13b) of the multiple coils 12.
摘要翻译：要解决的问题：提供用于实现传感器部件的小型化的涡流探伤装置，并且在缺陷检测中具有优异的可靠性和灵敏度。解决方案：涡流探伤装置的传感器部件10包括：相邻的感测表面11 到被检体的前表面; 多个线圈12（12a，12b）排列成与检测表面11成直角并且彼此成一角度; 用于激励线圈12并检测在检查体30中产生的涡流的感应磁场的驱动单元; 以及用于填充多个线圈12的相邻端面13（13a，13b）之间的空间14的磁芯20。

8. 发明专利

JP2013137318A Eddy current flaw detection probe and eddy current flaw detection testing device using the same 有权
标题翻译： EDDY电流检测探头和EDDY电流检测测试装置使用它
公开(公告)号：JP2013137318A
公开(公告)日：2013-07-11
申请号：JP2013024829
申请日：2013-02-12
申请人： Toshiba Corp , 株式会社東芝
发明人： KOBAYASHI NORIYASU , UENO SOICHI , JINBO NOBORU
IPC分类号： G01N27/90
摘要： PROBLEM TO BE SOLVED: To provide an eddy current flaw detection probe capable of preventing a radiation magnetic field from interfering with a detection magnetic field by radiating a magnetic field only from a magnetic field radiation surface of an exciting coil.SOLUTION: An eddy current flaw detection probe 3 comprises: an exciting coil 4 that is disposed with one end surface opposite to a flaw detection surface 100, radiates a magnetic field to the flaw detection surface 100 and generates an eddy current on the flaw detection surface 100 and inside the flaw detection surface 100; a detection coil 8 that is disposed with one end surface opposite to the flaw detection surface 100 and detects a magnetic field generated by variations in the eddy current; and an exciting coil ferrite core 5 that has an axial core portion 5a provided as an axial core of the exciting coil 4 and a protrusion portion protruding from the end surface of the exciting coil 4 opposite to the flaw detection surface 100. A magnetic field shield member 7 is provided on surfaces excluding a magnetic field radiation surface of the protrusion portion of the exciting coil ferrite core 5 via a magnetic field insulation member 6. The exciting coil ferrite core 5 and the magnetic field shield member 7 are formed of a ferromagnetic material such as iron or ferrite.
摘要翻译：要解决的问题：提供一种涡流探伤探针，其能够仅通过从励磁线圈的磁场辐射表面辐射磁场来防止辐射磁场干扰检测磁场。解决方案：涡流缺陷检测探头3包括：激励线圈4，其设置有与缺陷检测表面100相对的一个端表面，向探伤表面100辐射磁场，并在探伤表面100上和内部的缺陷检测器内产生涡流表面100; 检测线圈8，其设置有与所述探伤面100相反的一个端面，并且检测由所述涡流的变化产生的磁场; 以及具有设置为励磁线圈4的轴芯的轴芯部5a和从励磁线圈4的与瑕疵检测面100相反的端面突出的突出部的励磁线圈铁氧体磁芯5.磁场屏蔽构件7经由磁场绝缘构件6设置在不包括励磁线圈铁氧体磁芯5的突出部分的磁场辐射表面的表面上。励磁线圈铁氧体磁芯5和磁场屏蔽构件7由铁磁材料形成如铁或铁素体。

9. 发明专利

JP2011117872A Eddy current flaw detection probe, and eddy current flaw detection testing apparatus using the same 有权
标题翻译： EDDY电流检测探头和EDDY电流检测测试装置
公开(公告)号：JP2011117872A
公开(公告)日：2011-06-16
申请号：JP2009276583
申请日：2009-12-04
申请人： Toshiba Corp , 株式会社東芝
发明人： KOBAYASHI NORIYASU , UENO SOICHI , JINBO NOBORU
IPC分类号： G01N27/90
摘要： PROBLEM TO BE SOLVED: To provide an eddy current flaw detection probe which sets the lift-off being the interval between the ferrite core, which is inserted in and fitted to a detection coil, and a flaw detection surface having a recessed shape to a proper value and enhances the spatial resolving power of the detection coil in eddy current flaw detection testing apparatus wherein the edge surface of the detection coil is arranged oppositely to the flaw detection surface, and to provide the eddy current flaw detection testing apparatus using the same.
SOLUTION: The eddy current flaw detection probe includes an exciting coil 4 for generating an eddy current in a flaw detection target, the detection coil 8 arranged so that one edge surface thereof is opposed to the flaw detection surface to detect a magnetic field, the ferrite core 9 for the detection coil having the axial center 9b provided as the axial center of the detection coil 8 and the protrusion 9b projected from the edge surface opposed to the flaw detection surface of the detection coil 8, and the magnetic field shielding member 11 provided to the surface excepting a magnetic field penetrating surface 22 of the protrusion 9b of the ferrite core 9 for the detection coil through a magnetic field insulating member 10.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供一种涡流探伤探针，其设置作为插入并装配到检测线圈的铁氧体磁芯与具有凹陷形状的探伤表面之间的间隔的剥离达到适当的值，并提高涡流探伤试验装置中检测线圈的空间分辨能力，其中检测线圈的边缘表面与缺陷检测表面相对地布置，并且使用该涡流探伤检测装置相同。涡流探伤探头包括用于在探伤目标中产生涡流的励磁线圈4，检测线圈8布置成使其一个边缘表面与探伤表面相对以检测磁场用于检测线圈的铁氧体磁芯9具有设置在检测线圈8的轴向中心的轴向中心9b和从与检测线圈8的探伤表面相对的边缘表面突出的突起9b，以及磁场屏蔽构件11通过磁场绝缘构件10提供到除了用于检测线圈的铁氧体磁芯9的突起9b的磁场穿透表面22之外的表面。（C）2011年，JPO和INPIT

10. 发明专利

JP2010038914A Remote field eddy current flaw detecting probe 有权
标题翻译：远场现场电流检测探头
公开(公告)号：JP2010038914A
公开(公告)日：2010-02-18
申请号：JP2009162684
申请日：2009-07-09
申请人： Toshiba Corp , 株式会社東芝
发明人： KOBAYASHI NORIYASU , NAGAI SATOSHI , OCHIAI MAKOTO , JINBO NOBORU , KOMAI MASABUMI
IPC分类号： G01N27/90
摘要： PROBLEM TO BE SOLVED: To provide a remote field eddy current flaw detecting probe capable of enhancing detection sensitivity in defect inspections suppressing an increase in the current of an excitation coil, and suppressing upsizing and complication of the whole probe. SOLUTION: At least one excitation coil 2a to which an exciting current is applied to generate an eddy current in an object to be inspected 3, and at least one detection coil 2b which detects magnetic flux induced by the eddy current, are included. The excitation coil 2a includes a side surface covering member 5a which consists of a magnetic body 2, and which is provided on at least one of two side surfaces organized approximately perpendicular to the center axis of the excitation coil 2a. The side surface covering member 5a forms a magnetic path when the excitation coil 2a produces a magnetic field. COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：解决的问题：提供一种能够提高缺陷检查中的检测灵敏度的远场涡流探伤探针，抑制励磁线圈的电流增加，抑制整个探针的大型化和复杂化。解决方案：至少一个励磁线圈2a，其中施加有励磁电流以在待检查的物体3中产生涡流，并且包括检测由涡流引起的磁通量的至少一个检测线圈2b 。励磁线圈2a包括由磁体2组成的侧表面覆盖部件5a，该侧表面覆盖部件5a设置在大致垂直于励磁线圈2a的中心轴组成的两个侧面中的至少一个上。当激励线圈2a产生磁场时，侧表面覆盖部件5a形成磁路。版权所有（C）2010，JPO＆INPIT

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