专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明专利

JP2013160573A Tester for power semiconductors 有权
标题翻译：功率半导体测试仪
公开(公告)号：JP2013160573A
公开(公告)日：2013-08-19
申请号：JP2012021370
申请日：2012-02-02
申请人： Top:Kk , 株式会社Top
发明人： KATAYAMA HIROSHI , SHIGEMURA SHINJI , TANAKA KAZUNARI
IPC分类号： G01R31/26
摘要： PROBLEM TO BE SOLVED: To provide a tester for power semiconductors which can perform a switching characteristics test and screening test for power semiconductors under test in parallel on an identical tester with a simple configuration, can perform testing of the power semiconductors at a high speed and low cost, and can measure the response characteristics and avalanche resistance of the devices on the identical tester.SOLUTION: A test voltage is changed by switching between a plurality of capacitor banks without charging or discharging a capacitor each time.
摘要翻译：要解决的问题：为了提供功率半导体的测试仪，可以在具有简单配置的相同测试仪上并行执行测试中的功率半导体的开关特性测试和筛选测试，可以以高速度执行功率半导体的测试，低成本，并且可以测量同一测试仪上的器件的响应特性和抗雪崩电阻。解决方案：每次电容器组之间切换而不需要对电容器进行充电或放电来改变测试电压。

2. 发明专利

JP2013160572A Testing device for power semiconductor 有权
标题翻译：功率半导体测试装置
公开(公告)号：JP2013160572A
公开(公告)日：2013-08-19
申请号：JP2012021369
申请日：2012-02-02
申请人： Top:Kk , 株式会社Top
发明人： KATAYAMA HIROSHI , SHIGEMURA SHINJI , TANAKA KAZUNARI
IPC分类号： G01R31/26
摘要： PROBLEM TO BE SOLVED: To provide a power semiconductor testing device which is highly functional and flexible in a function and a measurement object/measurement range, and is capable of measuring response characteristics and avalanche resistance of a power semiconductor by one device, and to reduce and control influence received by an application waveform and a peak voltage by inductance of a testing circuit.SOLUTION: A bus bar for connection between a connection relay of a P side and an N side or one of them and a power semiconductor is divided into three, a structure in which a position of the bus bar positioned in the middle can be slid and varied is attained, a structure in which a current route can be varied is attained, and inductance is adjusted.
摘要翻译：要解决的问题：提供一种在功能和测量对象/测量范围中功能高且灵活的功率半导体测试装置，并且能够通过一个装置测量功率半导体的响应特性和雪崩阻力，并且减少并通过测试电路的电感来控制由应用波形和峰值电压接收的影响。解决方案：用于连接P侧的连接继电器和N侧或其中一个的功率半导体的汇流条被分为三个可以获得其中位于中间的母线的位置可以滑动和变化的结构，可以实现电流路径可以改变的结构，并且调节电感。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式