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1. 发明专利

JPH03131090A CABLE SECURING DEVICE 失效
公开(公告)号：JPH03131090A
公开(公告)日：1991-06-04
申请号：JP26966589
申请日：1989-10-17
申请人： TOSHIBA CORP , SHINKAWA DENKI KK
发明人： OKAMURA CHIAKI , KUROKAWA SHUNICHI , IMAIKE HIROSHI , ITO AYANORI
IPC分类号： H05K7/00 , H01H36/00
摘要： PURPOSE:To improve the adhesive properties of the end of a cable holder with an insulator and to provide a holding force, a sealing effect by caulking the end of the holder for compressing the insulator through the insulator having a high frictional force with a cable. CONSTITUTION:A sleeve 2 made of a material which is not deformed in oil even at a high temperature and has high mechanical strength is inserted between the sheath 1A of a coaxial cable 1 and braided wires 1B. A bush 3 of an insulator for holding the sleeve 2 is compressed in a direction of paired cables by a holding screw 4 of a cable holder to hold and seal the cable 1. Further, an insulator 5 having a high frictional force with the cable 1 is inserted into the inside of the end 4A of the screw 4 for compressing the bush 3, the end 4A of the screw 4 is caulked at one or a plurality of positions to bring the end 4A of the screw 4 into close contact with the insulator 5.

2. 发明专利

JPS57173701A EDDY CURRENT TYPE DEVICE AND METHOD FOR MEASURING RAIL DISPLACEMENT 失效
公开(公告)号：JPS57173701A
公开(公告)日：1982-10-26
申请号：JP5919181
申请日：1981-04-21
申请人： JAPAN NATIONAL RAILWAY , SHINKAWA DENKI KK
发明人： SHIROTA YASUSHI , ITOU HIROSHI , KAMIYA MAKIO , TAKINO YUKIO , MATSUHASHI KANJI , IMAIKE HIROSHI , NAKAMURA KIYOHISA
IPC分类号： G01B7/14 , E01B35/02 , G01B7/00 , G01B7/02
摘要： PURPOSE:To detect the central position of the rail accurately in the eddy current type rail displacement measurement, by using the average of the outputs of a pair of polygonally shaped detecting coils facing opposite to the rail, and compensating the variation in the distance from the wheel tread of the rail. CONSTITUTION:Triangular coils 6 and 7 are mounted on the lower part of a measuring car running on the rails so as to face the rail 3. Since the impedance of the coil is a function of the distance between the rail and the coil, the output, which corresponds to the displacement in the gap between the tread of the rail and the coil and in the span in the right and left directions of the rails, can be detected when a high frequency current is flowed in the detecting coils. When the rectangular coils are used, the detection can be performed in the broad range with excellent linearity. The average of the output of a pair of the coils indicates said gap. Therefore, when the coil output is compensated by the difference between said average and a reference value, the accurate measurement can be performed even though said gap is varied.

3. 发明专利

JPS6344161B2 失效
公开(公告)号：JPS6344161B2
公开(公告)日：1988-09-02
申请号：JP5919181
申请日：1981-04-21
申请人： TETSUDO SOGO GIJUTSU KENKYUSHO , SHINKAWA DENKI KK
发明人： SHIROTA YASUSHI , ITO HIROSHI , KAMYA MAKIO , TAKINO YUKIO , MATSUHASHI KANJI , IMAIKE HIROSHI , NAKAMURA KYOHISA
IPC分类号： G01B7/14 , E01B35/02 , G01B7/00 , G01B7/02

4. 发明专利

JP2549736B2 失效
公开(公告)号：JP2549736B2
公开(公告)日：1996-10-30
申请号：JP26966589
申请日：1989-10-17
申请人： TOSHIBA KK , SHINKAWA DENKI KK
发明人： OKAMURA CHIAKI , KUROKAWA SHUNICHI , IMAIKE HIROSHI , ITO AYANORI
IPC分类号： H05K7/00 , H01H36/00

5. 发明专利

JPS6228674A METHOD AND INSTRUMENT FOR NONCONTACT MEASUREMENT OF CONDUCTIVITY OF SEMICONDUCTOR WAFER 失效
公开(公告)号：JPS6228674A
公开(公告)日：1987-02-06
申请号：JP16930685
申请日：1985-07-30
申请人： SHINETSU ENG CO LTD , SHINKAWA DENKI KK
发明人： KATAGIRI KIYOO , MUTSUKAWA AKINORI , NISHIZAWA TATSU , MATSUHASHI KANJI , IMAIKE HIROSHI
IPC分类号： H01L21/66 , G01R27/02 , G01R31/28
摘要： PURPOSE:To improve the measuring accuracy of the conductivity of a semiconductor wafer, by inserting the semiconductor wafer into the measurement space between a cylindrical exciting coil and cylindrical detecting coil, both of which have initial permeabilities of 750-850 and cores having E-shaped longitudinal cross sections. CONSTITUTION:An exciting coil 4 and detecting coil 5 are provided under a condition where the coils are faced to the measurement space S of a semiconductor wafer W. Both the coils 4 and 5 are provided with cores having E-shaped longitudinal cross sections and have initial permeabilities of 750-850. Then an alternating current of 0.2-5MHz is supplied to the exciting coil 4 from an oscillator 8 and the detected voltage by the detecting coil 5 is amplified by means of an amplifier 9. The amplified detected voltage is discriminated at a wave detecting circuit 10. Therefore, the conductivity of the semiconductor wafer W can be measured surely, because a sufficient eddy electric current is produced in the wafer W at a high frequency.

6. 发明专利

JPS61216902A METHOD AND APPARATUS FOR DETECTING RAIL JOINT PART PLAY AMOUNT IN NON-CONTACT STATE 失效
公开(公告)号：JPS61216902A
公开(公告)日：1986-09-26
申请号：JP5467885
申请日：1985-03-20
申请人： JAPAN NATIONAL RAILWAY , SHINKAWA DENKI KK
发明人： KANAZAWA FUMIO , SANADA HIROSHI , MATSUHASHI KANJI , IMAIKE HIROSHI , SHIROTA YASUSHI
IPC分类号： G01B7/14 , E01B35/00 , E01B35/12 , G01B7/00

7. 发明专利

JPS5722961A Device and method of measuring defect of head top surface of rail 失效
标题翻译：测量轨道顶部表面缺陷的装置和方法
公开(公告)号：JPS5722961A
公开(公告)日：1982-02-06
申请号：JP9749880
申请日：1980-07-18
申请人： Japan National Railway , Shinkawa Denki Kk
发明人： ITOU HIROSHI , SHIROTA YASUSHI , MATSUHASHI KANJI , IMAIKE HIROSHI , NAKAMURA KIYOHISA
IPC分类号： B61K9/08 , B61K9/10 , G01N27/90

8. 发明专利

JPH041805B2 失效
公开(公告)号：JPH041805B2
公开(公告)日：1992-01-14
申请号：JP5467885
申请日：1985-03-20
申请人： TETSUDO SOGO GIJUTSU KENKYUSHO , SHINKAWA DENKI KK
发明人： KANAZAWA FUMIO , SANADA HIROSHI , MATSUHASHI KANJI , IMAIKE HIROSHI , SHIROTA YASUSHI
IPC分类号： G01B7/14 , E01B35/00 , E01B35/12 , G01B7/00

9. 发明专利

JPS6235203A METHOD AND DEVICE FOR POSITIONING AND DETECTION 失效
公开(公告)号：JPS6235203A
公开(公告)日：1987-02-16
申请号：JP17531985
申请日：1985-08-08
申请人： TOHO GAS KK , SHINKAWA DENKI KK
发明人： ICHIKAWA KANJI , IMAIKE HIROSHI , NAKAMURA KIYOHISA
IPC分类号： G01B7/00
摘要： PURPOSE:To perform high-precision positioning by arranging two bodies to be measured whose moving directions are known, detecting those object bodies by eddy current displacement gauges without contacting, and processing signals from the displacement gauges by using a zero method. CONSTITUTION:The two reverse-directional slanting block bodies 7a and 7b to be measured are arranged at the stop indication place of a moving body 10 in parallel to each other in the moving direction. Eddy current displacement gauges 8a and 8b with sensors 1a and 1b are fitted to the body 10 while facing the object bodies 7a and 7b at the same time. The displacement gauges 3a and 8b detect the object bodies 7a and 7b without contacting and the output signals of the displacement gauges 8a and 8b are supplied to an arithmetic comparing device 11, which performs arithmetic processing by the zero method. A controller 1 receives a zero signal from the device 11 to stop the moving body 10. Thus the high-precision positioning is performed.

10. 发明专利

JPS58223029A Eddy current type pressure gage 失效
标题翻译： EDDY电流型压力表
公开(公告)号：JPS58223029A
公开(公告)日：1983-12-24
申请号：JP10738682
申请日：1982-06-21
申请人： Res Inst Electric Magnetic Alloys , Shinkawa Denki Kk
发明人： MASUMOTO RIYOU , SAWATANI SHIYOUHACHI , NAKAMURA NAOJI , MATSUHASHI KANJI , IMAIKE HIROSHI , KONDOU YOSHIMITSU
IPC分类号： G01L9/10
CPC分类号： G01L9/10
摘要： PURPOSE:To make it possible to perform highly accurate measurement by a compact device in a broad temperature range, by detecting the amount of deflection of a diaphragm without contact by an eddy current type sensor, which is protected by ceramics, transducing the result into an electric signal, amplifying the signal, thereby obtaining an output signal. CONSTITUTION:The amount of deflection of a diaphragm 1, which receives pressure, is detected by an eddy current type sensor 2 without contact. The sensor 2 is protected by ceramics which are highly resistance against corrosion. The detected amount of deflection is transduced into an electric signal by a displacement detecting coil 3. The signal is amplified by an insulating type amplifier 4, and the output signal is obtained.
摘要翻译：目的：为了能够通过在宽温度范围内的紧凑型装置进行高精度的测量，通过用陶瓷保护的涡流型传感器检测膜片的偏转量而不接触，将结果转换成电信号，放大信号，从而获得输出信号。构成：接收压力的隔膜1的偏转量由涡电流式传感器2检测而不接触。传感器2由耐腐蚀性高的陶瓷保护。检测到的偏转量由位移检测线圈3转换成电信号。该信号由绝缘型放大器4放大，得到输出信号。

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