专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明专利

JPS6039975B2 失效
公开(公告)号：JPS6039975B2
公开(公告)日：1985-09-09
申请号：JP13218675
申请日：1975-11-05
申请人： TOKYO SHIBAURA ELECTRIC CO
发明人： KOBAYASHI HIDEKI
IPC分类号： G01J5/08 , G01J5/00 , G01J5/20 , G01J5/22 , G01J5/62

2. 发明专利

JPS6015978B2 失效
公开(公告)号：JPS6015978B2
公开(公告)日：1985-04-23
申请号：JP2209277
申请日：1977-03-01
申请人： TOKYO SHIBAURA ELECTRIC CO
发明人： KOBAYASHI HIDEKI
IPC分类号： G06F13/14 , G06F3/00 , G06F12/06 , G06F13/00

3. 发明专利

JPS56130607A MEASURING METHOD FOR GLAZE RISE ANGLE OF THIN FILM CIRCUIT PARTS 失效
公开(公告)号：JPS56130607A
公开(公告)日：1981-10-13
申请号：JP3399480
申请日：1980-03-19
申请人： TOKYO SHIBAURA ELECTRIC CO
发明人： SUGIMOTO KATSUAKI , MIZUNOYA NOBUYUKI , KOBAYASHI HIDEKI
IPC分类号： G01B11/26
摘要： PURPOSE:To perform measurement simply and accurately, by irradiating the light to the part near the rise part of the glaze and by rotating the light source or the substrate to measure the change point of intensity of the reflection light. CONSTITUTION:Half mirror 14 is set above rise part 13 of glaze 12 of thin film circuit parts 11 put on rotary table 10, and the light is irradiated to the part near glaze rise part 13 from light source 15, which is provided in the side of mirror 14, through half mirror 14. Loupe 16 is set above half mirror 14 to see this part directly. Rotary table 10 is rotated with shaft 20 as the center, and the reflection light is observed by loupe 16, and the glaze rise angle is measured on a basis of the rotation angle of rotary table 10.

4. 发明专利

JPS55141606A DIAMETER MEASURING APPARATUS OF THIN WIRE 失效
公开(公告)号：JPS55141606A
公开(公告)日：1980-11-05
申请号：JP4999579
申请日：1979-04-23
申请人： TOKYO SHIBAURA ELECTRIC CO
发明人： KOBAYASHI HIDEKI
IPC分类号： G01B11/08
摘要： PURPOSE:To evaluate fluctuations of diameter of thin wires accurately and at high precision, by displaying and recording the wire diameter measured by radiating laser beam in analog form. CONSTITUTION:In a laser beam diameter measuring apparatus 1, when a laser beam from a laser oscillator 4 is radiated to a thin wire 6, a Fraunhofer diffraction figure 8 is formed in the process of the laser beam passing through a lens group 7. This diffraction figure 8 of laser beam passes through a rotating single hole disc 9 rotated at a specified period and a slit 10 at a specified interval, and is sent to a photoelectric transducer 12. Since the photoelectric element 12 generates a photo signal every time a Fraunhofer diffraction figure is received, the signals are amplified and shaped in a shaping circuit 14, and counted in a counting circuit 15 which outputs a three-digit digital signal expressing the wire diameter. This signal is converted into an analog signal in a digital-analog converter 2, of which output is sent into an analog type display recorder 3.

5. 发明专利

JPH0339590B2 失效
公开(公告)号：JPH0339590B2
公开(公告)日：1991-06-14
申请号：JP9660183
申请日：1983-05-31
申请人： TOKYO SHIBAURA ELECTRIC CO
发明人： KOBAYASHI HIDEKI
IPC分类号： G01N29/04 , G01N29/30

6. 发明专利

JPS5572229A INFORMATION PROCESSING SYSTEM 失效
公开(公告)号：JPS5572229A
公开(公告)日：1980-05-30
申请号：JP14515378
申请日：1978-11-24
申请人： TOKYO SHIBAURA ELECTRIC CO
发明人： KOBAYASHI HIDEKI
IPC分类号： G06F12/00 , G06F3/00 , G06F9/52 , G06F13/38 , G06F15/16 , G06F15/177 , G06T1/20
摘要： PURPOSE:To enable apparently each CPU system to operate nearly in independent mode, by attaining access to a common-use device through hardware by using a simply-constituted circuit. CONSTITUTION:Common-use memory M is provided connecting to 1st and 2nd CPUs in common, X and Y addresses from which are inputted to X and Y decoders 1 and 2, whose outputs are supplied to exclusive acceptance circuit 3 to select either CPU, and addresses are led to timing control circuit 4. At the same time, an acceptance disability signal disabling an output signal from the other CPU is applied to circuit 4 and memory control signal XCONT or YCONT is accepted from selected CPU to supply memory M wih either one as control signal M-CONT in accordance with selective signal SELECT and control enable signal CONT-ENA, so that X or YDATA will be inputted to memory M by M-ADRS from multiplexer 5 through X and Y buffers.

7. 发明专利

JPS5562596A MEMORY DEVICE 失效
公开(公告)号：JPS5562596A
公开(公告)日：1980-05-12
申请号：JP13421578
申请日：1978-10-31
申请人： TOKYO SHIBAURA ELECTRIC CO
发明人： KOBAYASHI HIDEKI
IPC分类号： G06F12/16 , G06F1/00 , G06F1/26 , G11C29/00 , H02J9/06
摘要： PURPOSE:To make it possible to hold contents of a RAM for a long time even if a main power source is broken, by mounting a small-size cell on a substrate and connecting an external large-capacity cell in parallel to the cell above. CONSTITUTION:Small-size and light-weight reversible cell 6 is mounted on substrate 4 together with RAM5, and large-capacity cell 2 is connected in parallel to cell 6. when switch 3 is made, the output of main power source 1 is supplied to cells 6 and 2 and RAM5 through switch 7, abd RAM5 is operated by the output of power source 1, and simultaneously, cells 6 and 2 are charged. When switch 3 is broken and the output of power source 1 is broken, switch 7 switches the power source to cells 6 and 2 immediately. Consequently, outputs of cells connected in parallel are supplied to RAM5, and contents of RAM5 are held. Since power is supplied from cell 2 besides cell 6, RAM5 can be backed up sufficiently even if switch 3 is opened for a long time.

8. 发明专利

JPS5487039A COMPUTER DEBUG CIRCUIT 失效
公开(公告)号：JPS5487039A
公开(公告)日：1979-07-11
申请号：JP15475377
申请日：1977-12-22
申请人： TOKYO SHIBAURA ELECTRIC CO
发明人： KOBAYASHI HIDEKI
IPC分类号： G06F11/28 , G06F9/00 , G06F11/00
摘要： PURPOSE:To obtain several types of the console functions which are required for the debug work by holding the ready signal at logic ''0'' under the optional conditions via the ready queuing action and putting CPU under the optional queuing state. CONSTITUTION:The computer debug circuit consists of the following circuits: selector circuit 31 which selects more than one of various control signals CONTi from CPU via conditional CNDi sent from the control part; inverter circuit 32 to secure matching with the logic connected to the output side of circuit 31; memory circuit 33 consisting of the R-S flip-flop which features the negative logic action and operates on the output signal of circuit 32 to be set; and open collector circit 34 which delivers the output of the Q-output terminal in circuit 33 to CPU in the form of the wired AND enable ready signal RDY.

9. 发明专利

JPS55162002A CONTINUOUS WIREEDIAMETER MEASURING METHOD FOR TUNGSTEN ULTRATHIN WIRE 失效
公开(公告)号：JPS55162002A
公开(公告)日：1980-12-17
申请号：JP6978979
申请日：1979-06-04
申请人： TOKYO SHIBAURA ELECTRIC CO
发明人： KOBAYASHI HIDEKI
IPC分类号： G01B7/12
摘要： PURPOSE:To ensure the continuous and reliable result of the measurement for the tungsten ultrathin wire, by measuring the the electric resistance on the wire and at several points. CONSTITUTION:Ultrathin wire 1 to be measured is wound round lead-out reel 2 and at the same time taken up to reel 3. Wire 1 is given the tension by tension rollers 4 and 4' provided in the course of the wire winding. In this case, an appropriate value is given to the force of tension in accordance with the thickness of wire 1. The connection is given at the area having the fixed space of wire 1 to a pair of power terminals 6 and 6' which are connected to constant DC power source 5, and then the current is supplied to the section between the power terminals. At the same time, a pair of measurement terminals 8 and 8' connected to recorder 7 are placed between terminals 6 and 6' with the fixed space between, and the electric resistance is measured. Recorder 7 carries out the measurement recording by replacing the electric resistance of the measured wire to the wire diameter.

10. 发明专利

JPS55152470A METHOD OF INSPECTING WIRE 失效
公开(公告)号：JPS55152470A
公开(公告)日：1980-11-27
申请号：JP6117279
申请日：1979-05-18
申请人： TOKYO SHIBAURA ELECTRIC CO
发明人： KOBAYASHI HIDEKI
IPC分类号： G01R27/02 , G01N27/04 , G01N27/20 , G01N27/90
摘要： PURPOSE:To enable combined inspection, by setting one of the current feed terminals of a variometer at the ground potential and bringing the ground potential part of an eddy current flaw detector into contact with a wire. CONSTITUTION:The measuring section of a variometer 2 comprises a pair of current feed terminals 7, 7' and a pair of voltage measuring terminals 8, 8'. One current feed terminal 7 at the side of a flaw detector 3 is connected as a grounded terminal to the earth U. The measuring section of the eddy current flaw detector 3 comprises a high-frequency coil 11 and a measuring coil 12. A roller-type grounded terminal 13, which comes into contact with 1, is provided on a part of the measuring section of the flaw detector 3, which is located at the side of the variometer 2. The grounded terminal 13 is connected to the earth U and a current feed circuit 4. The variometer and the eddy current flaw detector are thus provided with grounded potential parts respectively so that a change factor from each of the variometer and the flaw detector toward the other is conducted out. As a result, the homogeneity and surface state of the wire can be jointly inspected.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式