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JP2010281704A Nitrogen concentration analysis method and nitrogen concentration analyzer of metal sample 有权
标题翻译：硝化浓度分析方法和氮浓度分析仪的金属样品
公开(公告)号：JP2010281704A
公开(公告)日：2010-12-16
申请号：JP2009135698
申请日：2009-06-05
申请人： Sumitomo Kinzoku Technol Kk , 住友金属テクノロジー株式会社
发明人： SATO TATSU , KUSAMA KAZUNORI , USUKI TOMOAKI
IPC分类号： G01N31/00 , G01N1/28 , G01N23/225 , G01N27/62
摘要： PROBLEM TO BE SOLVED: To provide a nitrogen concentration analysis method and a nitrogen concentration analyzer of a metal material capable of analyzing a nitrogen concentration highly accurately.
SOLUTION: This nitrogen concentration analyzer 10 includes a storage chamber 11, a primary ion irradiation device 12, a neutralization electron irradiation device 13, a communication tube 14, a flight chamber 15 and a secondary ion detection device 16. A metal sample 17 is stored in the storage chamber 11. A carbonaceous material adheres onto the surface of the metal sample 17. Pulsing primary ion is irradiated from the primary ion irradiation device 12 toward the surface of the metal sample 17. Hereby, cyanide ion is discharged from the metal sample 17. The cyanide ion discharged from the metal sample 17 is detected as secondary ion by the secondary ion detection device 16.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供能够高精度地分析氮浓度的金属材料的氮浓度分析方法和氮浓度分析仪。解决方案：该氮浓度分析仪10包括储存室11，初级离子照射装置12，中和电子照射装置13，连通管14，飞行室15和二次离子检测装置16.金属样品 17存储在储存室11中。碳质材料粘附到金属样品17的表面上。脉冲一次离子从初级离子照射装置12照射到金属样品17的表面。因此，氰离子从从金属样品17排出的氰化物离子被二次离子检测装置16检测为二次离子。版权所有（C）2011，JPO＆INPIT

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