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1. 发明专利

JP2007205964A Specific substance observation device and specific substance observation method 有权
标题翻译：特定物质观测装置和特定物质观测方法
公开(公告)号：JP2007205964A
公开(公告)日：2007-08-16
申请号：JP2006026736
申请日：2006-02-03
申请人： Seiko Instruments Inc , セイコーインスツル株式会社
发明人： WATANABE NAOYA , INOUE AKIRA , SHIRAKAWABE YOSHIHARU
IPC分类号： G01N27/416 , G01Q30/08 , G01Q30/14 , G01Q30/20 , G01Q60/24 , G01Q60/40 , G01Q80/00
摘要： PROBLEM TO BE SOLVED: To allow a specific granular substance to be observed easily, while the substance is being temporarily fixed, and to allow the substance to be observed continuously by readily repeating the fixation and observation many times. SOLUTION: A specific substance observation device for observing the specific granular substance S on a substrate 2 comprises: a probe 3 having a plane lever section 20, an opening 21 formed at the tip of the lever section, a holder section 22 for supporting the lever section, and a deflection measurement means for measuring the deflection of the lever section; a cantilever section 5 having a probe 4; a moving means for moving the cantilever and the probe 3 in three-dimensional directions; and a control means for pressing the specific substance against the substrate and temporarily fixing it, while the specific substance is being fitted into the opening, and controlling the moving means so that the surface of the temporarily fixed specific substance is scanned by the probe. COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：为了容易地观察特定的颗粒状物质，同时物质被暂时固定，并且允许通过多次重复固定和观察来连续观察物质。解决方案：用于观察基材2上的特定粒状物质S的特定物质观察装置包括：具有平面杆部分20的探针3，形成在杆部分的末端的开口21，用于支撑杆部分，以及用于测量杆部分的偏转的偏转测量装置; 具有探头4的悬臂部分5; 用于将悬臂和探针3沿三维方向移动的移动装置; 以及控制装置，用于将特定物质压靠在基板上并临时固定，同时将特定物质装配到开口中，并且控制移动装置，使得临时固定的特定物质的表面被探针扫描。版权所有（C）2007，JPO＆INPIT

2. 发明专利

JP2007120967A Microforce measuring instrument and biomolecule observation method 有权
标题翻译：微米测量仪器和生物分子观测方法
公开(公告)号：JP2007120967A
公开(公告)日：2007-05-17
申请号：JP2005309691
申请日：2005-10-25
申请人： Seiko Instruments Inc , セイコーインスツル株式会社
发明人： MATSUZAWA OSAMU , SHIRAKAWABE YOSHIHARU , SHIGENO MASAJI , WATANABE NAOYA , NIHEI AMIKO , INOUE AKIRA
IPC分类号： G01N33/483 , G01L1/18 , G01Q30/02 , G01Q60/24 , G01Q60/26 , G01Q80/00
摘要： PROBLEM TO BE SOLVED: To observe dynamic properties such as structural analysis or the like by accurately measuring a biomolecule such as a protein molecule or the like while preventing the lowering of sensitivity. SOLUTION: This microforce measuring instrument 1 is equipped with first and second probes 2 and 3 arranged so as to be opposed to each other and formed into a cantilevered state so that the respective leading ends thereof become free ends to fix the biomolecule P to the main surfaces 2a and 3a, a variable means 4 for allowing the first and second probes to approach or separate relatively while keeping a state that the main surfaces are opposed to each other to vary the mutual distance of the main surfaces, a measuring means 5 for respectively measuring the bendings of the first and second probes and an analyzing means 6 for analyzing the biomolecule on the basis of the measuring result of the measuring means 5. During a period varying the mutual distance of the main surfaces by the variable means 4 in a state that the biomolecule is respectively fixed to the first and second probes, the bending change of the first and second probes is measured by the measuring means. COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：待解决的问题：通过精确测量诸如蛋白质分子等的生物分子，同时防止敏感性的降低来观察诸如结构分析等的动态特性。解决方案：该微力测量仪1配备有第一和第二探针2和3，其布置成彼此相对并形成为悬臂状态，使得其前端成为自由端以固定生物分子P 主表面2a和3a具有用于允许第一和第二探针相对接近或分离的可变装置4，同时保持主表面彼此相对的状态以改变主表面的相互距离;测量装置用于分别测量第一和第二探针的弯曲部的分析装置6和用于基于测量装置5的测量结果分析生物分子的分析装置6.在通过可变装置4改变主表面的相互距离的周期期间在生物分子分别固定在第一和第二探针的状态下，通过测量装置测量第一和第二探针的弯曲变化。版权所有（C）2007，JPO＆INPIT

3. 发明专利

JP2008203057A Material supply probe device and scanning probe microscope 有权
标题翻译：材料供应探测器和扫描探针显微镜
公开(公告)号：JP2008203057A
公开(公告)日：2008-09-04
申请号：JP2007038812
申请日：2007-02-20
申请人： Seiko Instruments Inc , セイコーインスツル株式会社
发明人： WATANABE NAOYA , INOUE AKIRA
IPC分类号： G01Q60/00 , G01Q60/32 , G01Q60/38 , G01Q70/10
摘要： PROBLEM TO BE SOLVED: To apply a material onto a sample surface; to introduce it into a sample; and to measure properly the state of the sample surface. SOLUTION: A material supply probe device 1a has a constitution equipped with a hollow glass capillary 21 having a sharpened tip part 21a, a plunger 22 and a linear actuator 23 capable of changing a pressure by being reciprocated in the hollow glass capillary 21, an excitation source 12, a measuring part 14 for detecting displacement of the tip part 21a of the hollow glass capillary 21, and a moving part 13 for moving relatively the tip part 21a of the hollow glass capillary 21 based on a detection result by the measuring part 14. A scanning probe microscope 1 has a constitution equipped with the material supply probe device 1a, a sample capturing probe 15, and a moving part 16 for moving relatively the sample capturing probe 15. COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：将材料施加到样品表面上; 将其引入样品; 并正确测量样品表面的状态。解决方案：材料供应探针装置1a具有配备有中空玻璃毛细管21的结构，该中空玻璃毛细管21具有尖锐部分21a，柱塞22和能够通过在中空玻璃毛细管21中往复运动而改变压力的线性致动器23 激励源12，用于检测中空玻璃毛细管21的前端部21a的位移的测量部14和用于相对于中空玻璃毛细管21的前端部21a移动的移动部13，基于该中空玻璃毛细管21的检测结果扫描探针显微镜1具有配置有材料供给探针装置1a，样本捕获探针15和用于相对于样本捕获探针15移动的移动部16的构造。版权所有（C）2008 ，JPO＆INPIT

4. 发明专利

JP2008003035A Method for aligning probe end 有权
标题翻译：用于校准探头的方法
公开(公告)号：JP2008003035A
公开(公告)日：2008-01-10
申请号：JP2006175197
申请日：2006-06-26
申请人： Seiko Instruments Inc , セイコーインスツル株式会社
发明人： MATSUZAWA OSAMU , SHIRAKAWABE YOSHIHARU , SHIGENO MASAJI , WATANABE NAOYA , NIHEI AMIKO , INOUE AKIRA
IPC分类号： G01B11/00 , G01Q10/02 , G01Q30/02 , G01Q90/00
摘要： PROBLEM TO BE SOLVED: To accurately align an end position of a probe, with a targeted measurement starting position of a material, without forming markers on a cantilever.
SOLUTION: This probe end aligning method is equipped with an acquisition process for previously acquiring data on the external profile line of the cantilever and on the probe end position; a generation process for extracting the end position P2 and the profile line P3 of the cantilever from the acquired data, a guidance marker M is generated by together combining them with their relative positional relations associated with each other; a determination process for determining the measurement starting position P1 from an observation image of the specimen; a first display process for displaying the guidance marker so that it is superimposed on the image, with the end position coinciding with the starting position; a second display process for observing the cantilever, while the observation image of the cantilever is displayed in the image; and an adjustment process for adjusting the position of the cantilever so as to make it coincide with the profile line.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：为了精确地将探头的终端位置与材料的目标测量开始位置对齐，而不在悬臂上形成标记。
解决方案：该探头端对准方法配备有采集过程，用于事先获取悬臂外廓线和探头端位置上的数据; 从获取的数据中提取悬臂的结束位置P2和轮廓线P3的生成处理通过将它们与彼此相关的相对位置关系组合在一起而产生引导标记M; 用于从所述样本的观察图像确定测量开始位置P1的确定处理; 用于显示引导标记以使其重叠在图像上的第一显示处理，其结束位置与起始位置一致; 用于观察悬臂的第二显示过程，同时在图像中显示悬臂的观察图像; 以及用于调整悬臂的位置以使其与轮廓线一致的调整过程。版权所有（C）2008，JPO＆INPIT

5. 发明专利

JP2008003034A Scanning probe microscope 有权
标题翻译：扫描探针显微镜
公开(公告)号：JP2008003034A
公开(公告)日：2008-01-10
申请号：JP2006175196
申请日：2006-06-26
申请人： Seiko Instruments Inc , セイコーインスツル株式会社
发明人： MATSUZAWA OSAMU , SHIRAKAWABE YOSHIHARU , SHIGENO MASAJI , WATANABE NAOYA , NIHEI AMIKO , INOUE AKIRA
IPC分类号： G01Q10/02 , G01Q30/02 , G01Q30/06 , G01Q60/38
摘要： PROBLEM TO BE SOLVED: To inexpensively form a mark showing the position of a probe to a cantilever with high precision, without laboring, and to accurately align the leading end position of the probe with the target measuring start position of a sample using the mark.
SOLUTION: This scanning probe microscope is equipped with: the cantilever 2b having a probe 2a; the mark M formed on at least either one of a first point P1, where a first extending line L1, which extends in a longitudinal direction of the cantilever from the root position of the probe crosses the leading end surface of the cantilever or a second point P2, where a second extending line L2 which extends in the short direction of the cantilever, from the root position of the probe, crosses the side surface of the cantilever; an optical observation device for optically observing the cantilever and a sample; a monitor for displaying the observation image; and a control part for displaying the measuring start position, selected on the basis of the observation image on the monitor as a reference line and aligning the cantilever so as to allow the reference line to coincide with the mark.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：为了低成本地将探针的位置高精度地形成到悬臂的位置，而不需要劳动，并且将探针的前端位置与样品的目标测量开始位置精确对准，使用标记。
解决方案：该扫描探针显微镜配备有：具有探针2a的悬臂2b; 形成在第一点P1中的至少一个上的标记M，其中从悬臂的根部位置在悬臂的纵向方向上延伸的第一延伸线L1与悬臂的前端表面相交，或者第二点 P2，其中从悬臂的短方向延伸的第二延伸线L2从探针的根部位置穿过悬臂的侧表面; 用于光学观察悬臂和样品的光学观察装置; 用于显示观察图像的监视器; 以及控制部分，用于显示基于监视器上的观察图像作为参考线选择的测量开始位置，并使悬臂对准以允许参考线与标记一致。版权所有（C）2008，JPO＆INPIT

6. 发明专利

JP2007205850A Electrochemical measuring device 有权
标题翻译：电化学测量装置
公开(公告)号：JP2007205850A
公开(公告)日：2007-08-16
申请号：JP2006024641
申请日：2006-02-01
申请人： Seiko Instruments Inc , セイコーインスツル株式会社
发明人： MATSUZAWA OSAMU , SHIRAKAWABE YOSHIHARU , SHIGENO MASAJI , WATANABE NAOYA , NIHEI AMIKO , INOUE AKIRA
IPC分类号： G01Q10/04 , G01Q60/32 , G01Q60/38 , G01Q60/60
摘要： PROBLEM TO BE SOLVED: To observe an exact electrochemical reaction process by controlling the potential and electric current density at an observing position on a sample so that they are always constant without being affected by the observing position and the position or the like of the sample when the surface of the sample is scanned by a cantilever. SOLUTION: This electrochemical measuring device is used for observing the reaction process of the sample while controlling the electrochemical reaction in electrolyte. The electrochemical measuring device comprises a solution cell for storing the sample while the sample is dipped in the electrolyte, a cantilever 3 disposed faced to the sample in the dipped state in the electrolyte, a sample electrode electrically coming into contact with the sample, a reference electrode 8 and a counter electrode 9 arranged in the dipped state in the electrolyte, and a current measuring means for controlling the potential of the sample electrode with reference to the potential of the reference electrode and measuring the current flowing between the sample electrode and counter electrode. The cantilever has the reference electrode and counter electrode, and the reference electrode and counter electrode are arranged near a probe 3a. COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：通过控制样品上的观察位置处的电位和电流密度来观察精确的电化学反应过程，使得它们总是恒定的，而不受观察位置和位置等的影响当样品的表面被悬臂扫描时的样品。解决方案：该电化学测量装置用于观察样品的反应过程，同时控制电解液中的电化学反应。电化学测量装置包括用于在样品浸入电解质中时存储样品的溶液池，悬浮液3，其以电解液中浸渍状态的样品设置，与样品电接触的样品电极，参考电极8和布置在电解液中的浸渍状态的对电极9以及电流测量装置，用于根据参考电极的电位来控制样品电极的电位，并测量在样品电极和对电极之间流动的电流。悬臂具有参考电极和对电极，参考电极和对电极设置在探针3a附近。版权所有（C）2007，JPO＆INPIT

7. 发明专利

JP2007147353A Probe, specific material analyzer, and specific material analysis method 有权
标题翻译：探针，特殊材料分析仪和特殊材料分析方法
公开(公告)号：JP2007147353A
公开(公告)日：2007-06-14
申请号：JP2005339934
申请日：2005-11-25
申请人： Seiko Instruments Inc , セイコーインスツル株式会社
发明人： WATANABE NAOYA , INOUE AKIRA
IPC分类号： G01N5/02 , C12M1/00 , G01Q60/24 , G01Q80/00
摘要： PROBLEM TO BE SOLVED: To analyze a specific material highly accurately by measuring accurately the weight of the fine specific material such as a protein correlatively with an actual adhesion state. SOLUTION: A probe 2 includes: a lever part 10 formed flatly with a prescribed thickness and extended in one direction from the base end side toward the tip side; a thin film 11 installed on the main face 10a of the lever part, to which a specific material DNA adheres by being reacted therewith; a holder part 12 for supporting the base end side of the lever part in the cantilever state; and a displacement measuring means 13 for measuring displacement of the lever part. In the probe 2, the thin film is a thin film acquired by exfoliating a layered material laminated in the multilayered state. COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：通过精确地测量与实际粘附状态相关的诸如蛋白质的细小特定材料的重量来高度精确地分析特定材料。解决方案：探头2包括：平坦地形成有规定厚度的杆部10，并从基端侧朝向前端侧沿一个方向延伸; 安装在杠杆部分的主面10a上的薄膜11，特定材料DNA通过与其反应而附着在其上; 用于以悬臂状态支撑杆部的基端侧的保持部12; 以及用于测量杆部的位移的位移测量装置13。在探针2中，薄膜是通过剥离层叠在多层状态的层叠材料而获得的薄膜。版权所有（C）2007，JPO＆INPIT

8. 发明专利

JP2006220546A Chemical sensor 有权
标题翻译：化学传感器
公开(公告)号：JP2006220546A
公开(公告)日：2006-08-24
申请号：JP2005034332
申请日：2005-02-10
申请人： Seiko Instruments Inc , セイコーインスツル株式会社
发明人： MATSUZAWA OSAMU , NIHEI AMIKO , INOUE AKIRA , WATANABE NAOYA , SHIRAKAWABE YOSHIHARU , SHIGENO MASAJI , MURAMATSU HIROSHI , KIN SHIYUMIN
IPC分类号： G01N5/02
摘要： PROBLEM TO BE SOLVED: To perform the analysis of a specific substance by eliminating the effect of the load weight received from a fluid such as air or a liquid to the utmost to detect a change in the weight of the specific substance with high precision.
SOLUTION: This chemical sensor is equipped with: a cantilever 4 which has a predetermined thickness, is formed into a flat sheet shape having first and second main surfaces 2 and 3 and extends in one direction toward its leading end part from its base end part; a holder part 5 for supporting the base end side of the cantilever 4 in a cantilevered state; the sensor part 10 provided to the leading end side of the cantilever 4 and having a reaction film 6 bonded by the reaction of a specific substance DNA; an exciting means for vibrating the cantilever 4 in the direction along the first and second main surfaces 2 and 3 toward the short direction of crossing one direction in a predetermined resonance frequency; a measuring means for measuring the vibration state of the cantilever 4; and a detection means for detecting the specific substance DNA based on the measuring result of the measuring means.
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：通过消除从诸如空气或液体的流体接收的负载重量的影响来最大程度地检测特定物质的分析，以检测具有高的特定物质的重量的变化精确。解决方案：该化学传感器配备有：具有预定厚度的悬臂4，形成具有第一和第二主表面2和3的平板形状，并且从其底部向其前端部沿一个方向延伸端部; 用于以悬臂状态支撑悬臂4的基端侧的保持部5; 传感器部分10设置在悬臂4的前端侧，并具有通过特定物质DNA的反应结合的反应膜6; 用于使悬臂4沿着第一主表面2,3和第二主表面3的方向以预定的共振频率朝向一个方向交叉的短方向振动的激励装置; 用于测量悬臂4的振动状态的测量装置; 以及用于基于测量装置的测量结果检测特定物质DNA的检测装置。版权所有（C）2006，JPO＆NCIPI

9. 发明专利

JP2006145510A Probe and scanning probe microscope 有权
标题翻译：探测和扫描探针显微镜
公开(公告)号：JP2006145510A
公开(公告)日：2006-06-08
申请号：JP2004339847
申请日：2004-11-25
申请人： Seiko Instruments Inc , セイコーインスツル株式会社
发明人： MATSUZAWA OSAMU , SHIRAKAWABE YOSHIHARU , INOUE AKIRA , WATANABE NAOYA , NIHEI AMIKO , SHIGENO MASAJI
IPC分类号： G01B21/30 , G01Q30/14 , G01Q60/30 , G01Q60/32 , G01Q60/38 , G01Q70/10
摘要： PROBLEM TO BE SOLVED: To observe a sample with high precision by reducing the effect of a damping effect or the like that receive from a fluid to the utmost.
SOLUTION: This probe 2 is constituted so as to allow a sharpened probe needle 20 to scan the sample in a state of vibration with a predetermined frequency and amplitude. The probe 2 is equipped with a cantilever 21 having the probe needle 20 provided to its leading end and formed so as to be extended in one direction from its base end side to its leading side and a main body part 22 for fixing the base end side of the cantilever 21 in a state of cantilever so that the cantilever 21 serves as a free end. The ridge part 23 formed in a protruded state along the longitudinal direction of the cantilever 21 is provided at least to either one of one surface opposed to the surface of the sample of the cantilever 21 and the other surface on the side reverse to one surface. The scanning probe microscope having the probe 2 is also disclosed.
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：通过减少从流体接收的阻尼效果等的效果来高精度地观察样品。解决方案：该探针2被构造成允许尖锐的探针20以预定的频率和振幅在振动状态下扫描样品。探头2配备有悬臂21，其具有设置在其前端的探针20，并且形成为从其基端侧到其前侧沿一个方向延伸;主体部22，用于固定基端侧悬臂21处于悬臂状态，使得悬臂21用作自由端。沿着悬臂21的纵向方向形成为突出状态的脊部23至少与悬臂21的样品的表面相对的一个表面和与一个表面相反的一侧的另一个表面中的至少一个。还公开了具有探针2的扫描探针显微镜。版权所有（C）2006，JPO＆NCIPI

10. 发明专利

JP2008092824A Probe for cell invasion, cell invasion apparatus and cell invasion method having the probe for cell invasion 有权
标题翻译：细胞侵入探针，细胞侵入装置和细胞侵入探针的细胞侵入方法
公开(公告)号：JP2008092824A
公开(公告)日：2008-04-24
申请号：JP2006276291
申请日：2006-10-10
申请人： Seiko Instruments Inc , セイコーインスツル株式会社
发明人： INOUE AKIRA , NIHEI AMIKO , WATANABE NAOYA , SHIGENO MASAJI , MATSUZAWA OSAMU , SHIRAKAWABE YOSHIHARU
IPC分类号： C12M1/00 , C12N5/00 , C12N15/09
CPC分类号： C12M35/00
摘要： PROBLEM TO BE SOLVED: To obtain a probe for cell invasion which invades cells, while suppressing the influence on cell membranes, as much as possible, without causing the cells to be killed, and to provide a cell invasion apparatus. SOLUTION: The probe for cell invasion is disposed facing cells S that are being cultured on a substrate 2 in a liquid, being relatively movable in X and Y-directions, in parallel with the surface of the substrate and in a Z direction, perpendicular to the X and Y-directions; and the probe is equipped with an exploring needle 3a having a sharpened tip that is punctured into cells, and a lever part 3b for supporting the exploring needle in a cantilever state and a lipid bimolecular membrane 3c formed on the external surface of the exploring needle. When the exploring needle punctures the cells, the lipid bimolecular membrane fuses with cell membranes on the surfaces of the cells and is integrated. COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：为了获得尽可能多地抑制细胞膜的影响而不导致细胞被杀死的细胞侵袭探针，并且提供细胞侵入装置。解决方案：用于细胞侵袭的探针被布置成正在培养在基板2上的液体中的细胞S，可以在X和Y方向上相对于基板表面平行移动，Z方向垂直于X和Y方向; 并且探针配备有具有被刺入细胞的尖锐尖端的探针3a和用于支撑悬臂状态的探针的杆部3b和形成在探针的外表面上的脂质双分子膜3c。当探针穿刺细胞时，脂质双分子膜与细胞表面的细胞膜融合并整合。版权所有（C）2008，JPO＆INPIT

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