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    • 1. 发明专利
    • Test chip, apparatus for detecting target substance and method for specifically detecting target substance
    • 检测芯片,用于检测目标物质的装置和特异性检测目标物质的方法
    • JP2010133933A
    • 2010-06-17
    • JP2009226321
    • 2009-09-30
    • Sysmex Corpシスメックス株式会社
    • IWANAGA SHIGEKIKIRIMURA HIROYA
    • G01N27/416C12M1/00C12N15/09C12Q1/68G01N27/327
    • G01N33/5438G01N27/305G01N27/3277
    • PROBLEM TO BE SOLVED: To provide a test chip with improved detection sensitivity for a target substance, an apparatus for detecting a target substance and a method for specifically detecting a target substance. SOLUTION: The test chip for detecting a target substance modified with a modifying substance releasing electrons upon photoexcitation includes: a semiconductor electrode part having a metal layer formed on a semiconductor layer; a probe that captures the target substance and are immobilized on the metal layer; and a counter electrode part having a conductive layer. An apparatus for detecting a target substance modified with a modifying substance releasing electrons upon photoexcitation includes: a test chip receiving part capable of receiving a test chip; a light source for photoexciting the modifying substance modifying the target substance in the test chip inserted in the test chip receiving part; and an electric current measuring part for measuring an electric current flowing from the target substance modified with the modifying substance upon photoexcitation by the light source. COPYRIGHT: (C)2010,JPO&INPIT
    • 要解决的问题:为目标物质提供具有改进的检测灵敏度的测试芯片,用于检测目标物质的装置和用于特异性检测目标物质的方法。 解决方案:用于检测用光激发释放电子的修饰物质改性的目标物质的测试芯片包括:具有在半导体层上形成的金属层的半导体电极部分; 捕获目标物质并固定在金属层上的探针; 以及具有导电层的对电极部。 一种用于检测由光激发释放电子的修饰物质改性的目标物质的装置,包括:能够接收测试芯片的测试芯片接收部分; 光源,用于对插入测试芯片接收部分的测试芯片中修饰目标物质的修饰物质进行光激发; 以及电流测量部件,用于测量由光源光激发后由修饰物质修饰的目标物质流出的电流。 版权所有(C)2010,JPO&INPIT
    • 4. 发明专利
    • Electrochemical detection method of detection substance, electrochemical detection method of test substance, inspection chip, detection set, probe holding substrate and electrode substrate
    • 检测物质的电化学检测方法,试验物质的电化学检测方法,检查芯片,检测装置,探针保持基板和电极基板
    • JP2012093349A
    • 2012-05-17
    • JP2011200815
    • 2011-09-14
    • Sysmex Corpシスメックス株式会社
    • IWANAGA SHIGEKIKIRIMURA HIROYA
    • G01N27/416G01N21/76G01N27/327
    • G01N27/3278
    • PROBLEM TO BE SOLVED: To provide an electrochemical detection method of a detection substance, an electrochemical detection method of a test substance, an inspection chip, a detection set, a probe holding substrate and an electrode substrate which can successfully detect the test substance without depending on size of the test substance, and further reuse a working electrode.SOLUTION: An electrode substrate 20 with a working electrode 51, a counter electrode 53, and a probe holding substrate 30 having a probe for capturing a mark binding substance in which the test substance or a binding substance for capturing the test substance is marked by a mark substance on a substrate body 30a are used, and the electrode substrate 20 and the probe holding substrate 30 are oppositely arranged with a predetermined gap. Then, after making the probe holding substrate 30 capture the test substance, at least the mark substance is induced to the working electrode 51 to be electrochemically detected.
    • 要解决的问题:提供检测物质的电化学检测方法,可以成功检测试验的检测物质的电化学检测方法,检查片,检测组,探针保持基板和电极基板 物质,而不依赖于测试物质的尺寸,并进一步重新使用工作电极。 < P>解决方案:具有工作电极51,对电极53和探针保持基板30的电极基板20,具有用于捕获被检物质或用于捕获被检物质的结合物质的标记结合物质的探针 使用由基板主体30a上的标记物质标记的电极基板20和探针保持基板30以规定的间隙相对配置。 然后,在使探针保持基板30捕获测试物质之后,至少将标记物质感应到工作电极51进行电化学检测。 版权所有(C)2012,JPO&INPIT
    • 7. 发明专利
    • Method for specific detection of object, detection apparatus, and test chip
    • 用于特定检测对象,检测装置和测试芯片的方法
    • JP2010107345A
    • 2010-05-13
    • JP2008279385
    • 2008-10-30
    • Sysmex Corpシスメックス株式会社
    • IWANAGA SHIGEKIKIRIMURA HIROYA
    • G01N27/416
    • G01N33/54366G01N27/305G01N27/3277G01N33/54306
    • PROBLEM TO BE SOLVED: To increase the current flowing between a working electrode and a counter electrode, in order to improve the detection sensitivity for an analyte, by promoting reduction reaction of an electrolyte, using a reducing electrode which is disposed on a test chip and reducing the electrolyte.
      SOLUTION: A method for specifically detecting the analyte is provided, which employs the test chip 4, includes: the working electrode 21 equipped with a conductive layer 32 and an electron acceptor layer 33; a probe 34 fixed on the electron acceptor layer 33; the counter electrode 24; and the reducing electrode 26. A sample containing the analyte 42 is applied to the test chip 4, and the analyte 42 is captured by the probe 34. Then, a coloring matter 41 of the analyte 42, captured by the probe 34, is irradiated with a light, in a state such that the working electrode 21, the counter electrode 24 and the reduction electrode 26 come into contact with an electrolytic solution 43 containing the electrolyte; and the current flowing between the working electrode 21 and the counter electrode 24, which is caused by the electron migration from the coloring matter 41 excited by the light to the working electrode 21, is measured with an ammeter 6. The reducing electrode 26 promotes the reduction reaction of the electrolyte contained in the electrolytic solution 43.
      COPYRIGHT: (C)2010,JPO&INPIT
    • 要解决的问题为了增加工作电极和对电极之间的电流,为了提高分析物的检测灵敏度,通过促进电解质的还原反应,使用设置在电极上的还原电极 测试芯片并减少电解液。 提供了一种用于特异性检测分析物的方法,其采用测试芯片4,包括:装备有导电层32和电子受体层33的工作电极21; 固定在电子受体层33上的探针34; 对电极24; 和还原电极26.将含有分析物42的样品施加到测试芯片4,并且通过探针34捕获分析物42。然后,由探针34捕获的分析物42的着色物质41被照射 在使工作电极21,对电极24和还原电极26与含有电解质的电解液43接触的状态下具有光, 并且由电流计6测量由通过光激发的色素41向工作电极21的电子迁移而引起的工作电极21与对电极24之间的电流。还原电极26促进了 包含在电解液43中的电解质的还原反应。版权所有(C)2010,JPO&INPIT