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    • 4. 发明专利
    • MEASURING DEVICE OF WORKING PROPERTIES
    • JPS5677766A
    • 1981-06-26
    • JP15783080
    • 1980-11-10
    • SONY TEKTRONIX CORP
    • ISHIJIMA YASUMORIMUROOKA RIKICHI
    • G01R13/22G01R31/00
    • PURPOSE:To upgrade a measurement precision by making the working property of the device to be measured measurable by giving a comparison between the two waveforms displayed when the device to be measured is inserted and when a direct observation is given to the input signal to be supplied to the terminal each. CONSTITUTION:A comparison is given to the reference voltage between the device 13 to be measured to which the periodical input signal is applied and the D/A converter 14 which responds to the number of the outputs of the device 13 and a series of the inclination signals. Then the working properties of the device 13 are displayed. With variation of the reference voltage of the converter 14 in a range of V1-V3, the inverting time points of the output of the comparator 12 vary as t1- t3 each. For instance, if the converter 14 of 10 bits is used, the reference voltage having a high resolution of 1024 steps can be obtained. The display on the CRT18 at that moment shows the waveform of the working properties of the device 13. The time axis of the waveform is decided by the slope of the high-speed inclination signal. In such constitution, the accuracy of measurement can be increased greatly like an ordinary sampling oscilloscope.