会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 3. 发明专利
    • MARKING DEVICE FOR ELECTRONIC PART
    • JPH11240132A
    • 1999-09-07
    • JP4201098
    • 1998-02-24
    • ROHM CO LTD
    • NOZAKI MASAFUMI
    • B41F17/36B41K3/04B41K3/62H05K13/00
    • PROBLEM TO BE SOLVED: To provide a marking device wherein marking can be performed on electronic parts by a simple method and a marking agent in a marking pen can be prevented from being evaporated and the marking agent is always kept under a stable condition and marking with excellent quality can be performed. SOLUTION: The titled marking device consists of a marking pen 1 impregnated with a volatile marking agent, a holder for holding the marking pen 1, a moving means 2 for sliding this holder in the axial direction of the marking pen 1 in order to perform marking by bringing the apex 11 of the marking pen 1 into contact with an article 9 to be marked, a rotating means 3 for rotating the marking pen 1 by a definite angle and a cap 4 for covering the apex 11 of the marking pen 1 and the cap 4 is provided at a position where the apex 11 of the marking pen 1 is covered with the cap 4 by sliding the marking pen 1 in the axial direction by the moving means 2 under a condition where this holder is separated from the marking face of the article 9 to be marked and is rotated.
    • 5. 发明专利
    • PRODUCTION OF THERMAL HEAD
    • JPS63278868A
    • 1988-11-16
    • JP11436387
    • 1987-05-11
    • ROHM CO LTD
    • NOZAKI MASAFUMIOKUBO SHINYA
    • B41J2/335B41J2/345
    • PURPOSE:To control the grinding amount on the basis of a conductive pattern and to enhance a production efficiency by a measurement simultaneous with grinding, by a method wherein, on a substrate, a checking conductive film is formed between a heating part and and end part of the substrate in the vicinity of the heating part, and a substrate end face in the vicinity of the heating part is ground with the measurement of a value of electrical resistance between the checking conductive film and a grinding tool. CONSTITUTION:Resistor layers 3, 4 are formed on a substrate 1 and a glaze layer 2, and thereon metallic layers 5, 6, and 7 are formed. The resistor layer 4 and the metallic layer 7 thereon are patterned between a substrate end part in the vicinity of a heating part and used as a checking electrode. Then, in the grinding of a substrate end face, he checking electrode 7 is noncommunicative to a grinding wheel in a range of L1-L2. When the grinding wheel reaches the point L2 to come into contact with the checking electrode 7, a value of resistance is remarkably reduced. When the wheel grinds the substrate end surface further to a point L3, a contact area between the grinding wheel and the checking electrode is reduced, and with this reduction a value of resistance is remarkably raised. In this manner, the detection of the decrease/increase of a value of resistance enables either the point L2 or L3 to be finished as an end face.