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1. 发明专利

JP2008153119A Battery inspection system, and battery inspection method 审中-公开
标题翻译：电池检查系统和电池检查方法
公开(公告)号：JP2008153119A
公开(公告)日：2008-07-03
申请号：JP2006341422
申请日：2006-12-19
申请人： Nippon Steel Corp , Nittetsu Elex Co Ltd , 新日本製鐵株式会社 , 株式会社日鉄エレックス
发明人： SUGIURA MASAHITO , NAITO SHUJI
IPC分类号： H01M10/04 , G01M3/38 , H01M6/50 , H01M10/48
CPC分类号： Y02E60/12
摘要： PROBLEM TO BE SOLVED: To determine what level of thickness an electrolyte located on a surface of a battery has. SOLUTION: An imaging device 3 receiving reflected light of a far-infrared ray emitted to an inspection object surface 10a of the battery 10 from a planar light source 1 is structured to selectively receive only a light having a wavelength in the band of 7-12 μm. Hence, light of a quantity (intensity), in response to the thickness of the electrolyte located on the inspection object surface 10a of the battery 10, can be received by the imaging device 3, and information related to the thickness of the electrolyte can be included in a signal of the image imaged by the imaging device 3. COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：确定位于电池表面的电解质的厚度水平。解决方案：从平面光源1接收从电池10的检查物体表面10a发射的远红外线的反射光的成像装置3被构造成选择性地仅接收波长为 7-12微米。因此，通过成像装置3可以接收位于电池10的检查对象面10a上的电解质的厚度的光量（强度），与电解质的厚度相关的信息可以是包括由成像装置3成像的图像的信号。版权所有（C）2008，JPO＆INPIT

2. 发明专利

JP2012039822A Quick charger 有权
标题翻译：快速充电
公开(公告)号：JP2012039822A
公开(公告)日：2012-02-23
申请号：JP2010179674
申请日：2010-08-10
申请人： Nittetsu Elex Co Ltd , 株式会社日鉄エレックス
发明人： NAITO SHUJI , YAMAGUCHI ZENZO , KISHIMOTO MICHIHIRO , OYAMADA HIDEKI
IPC分类号： H02J7/00 , B60L11/18 , H01M10/44 , H01M10/48 , H02J7/02
CPC分类号： Y02T10/7005 , Y02T90/121
摘要： PROBLEM TO BE SOLVED: To provide a quick charger of which standby time for charging is shortened, and a commercial power source available at a normal business office can be used.SOLUTION: A quick charger 10 includes a buffer high-speed rechargeable battery 17 which accumulates the electric power supplied from a commercial power source 11, and charging current control parts 18-22 which supply the electric power accumulated in the buffer high-speed rechargeable battery 17 for charging onboard secondary batteries 37-41. A consolidated charge/discharge control part 43 stores a charge pattern representing the change in a current value and a voltage value of the electric power supplied to the onboard secondary batteries 37-41 for charging. The consolidated charge/discharge control part 43, makes the charge curent control parts 18-22 terminate charging the onboard secondary batteries 37-41 upon detecting that a charged rate of the onboard secondary batteries 37-41 being charged has reached a preset charge completion value based on a current value of the electric power supplied to the onboard secondary batteries 37-41 being charged from the charge current control parts 18-22 by referencing the charge pattern.
摘要翻译：要解决的问题：提供一种快速充电器，其中充电的待机时间缩短，并且可以使用在正常商务办公室可用的商业电源。解决方案：快速充电器10包括一个缓冲高速可再充电电池17，其累积从商用电源11提供的电力，以及充电电流控制部分18-22，其提供累积在缓冲高压电源中的电力，用于对车载二次电池37-41充电的高速可充电电池17。合并充放电控制部43存储表示电流值的变化的电荷模式和供给到车载蓄电池37-41的充电用电力的电压值。综合充放电控制部43，检测到被充电的车载二次电池37-41的充电率达到预设的充电结束值时，使充电固化控制部18-22终止对车载二次电池37-41的充电基于从充电电流控制部件18-22通过参考充电模式而对提供给车载二次电池37-41的电力的当前值进行充电。版权所有（C）2012，JPO＆INPIT

3. 发明专利

JP2013080631A Apparatus and method for supplying humidified gas to fuel cell 有权
标题翻译：将加氢气体供应给燃料电池的装置和方法
公开(公告)号：JP2013080631A
公开(公告)日：2013-05-02
申请号：JP2011220294
申请日：2011-10-04
申请人： Nittetsu Elex Co Ltd , 株式会社日鉄エレックス
发明人： HIRAKI KATSUHIKO , NAITO SHUJI , AKAHO KAZUAKI
IPC分类号： H01M8/04
CPC分类号： Y02E60/50
摘要： PROBLEM TO BE SOLVED: To provide an apparatus and method for supplying a humidified gas to a fuel cell which can quickly respond to a request to change the dew point or pressure of a humidified gas supplied to a fuel cell.SOLUTION: A humidified gas supply apparatus 10 includes: a first gas supply section 12 for heating a dry gas B into a heated dry gas; a second gas supply section 14 having humidification means 13 for changing a dry gas C into a vapor-saturated gas; a combination section 15 for combining the heated dry gas and the vapor-saturated gas supplied from the first and second gas supply sections 12, 14 into a humidified gas A; a storage tank 16 for improving the homogeneity of the humidified gas A; and control means 18 for determining a split ratio of the heated dry gas to the vapor-saturated gas thus combined on the basis of the dew point of the humidified gas A supplied from the storage tank 16 to a fuel cell 11, supplying the heated dry gas and the vapor-saturated gas to the combination section 15 at flow rates determined from the split ratio and the flow rate of the humidified gas A, and at the same time, controlling the pressure of the dry gas B on the basis of the flow rate of the dry gas B and the pressure of the humidified gas A.
摘要翻译：要解决的问题：提供一种用于将加湿气体供应到燃料电池的装置和方法，所述燃料电池能够快速响应改变供应到燃料电池的加湿气体的露点或压力的要求。＆lt; P＆gt;解决方案：加湿气体供给装置10包括：第一气体供给部12，其用于将干燥气体B加热成加热的干燥气体; 具有用于将干燥气体C变更为气相饱和气体的加湿装置13的第二气体供给部14; 用于将加热的干燥气体和从第一和第二气体供应部分12,14供应的气相饱和气体组合成加湿气体A的组合部分15; 用于改善加湿气体A的均匀性的储罐16; 以及控制装置18，用于基于从储罐16供给到燃料电池11的加湿气体A的露点确定加热的干燥气体与蒸气饱和气体的分流比，供给加热的干燥气体和蒸汽饱和气体以从分流比和加湿气体A的流量确定的流速分配给组合部分15，同时基于流量控制干燥气体B的压力干燥气体B的速率和加湿气体的压力A.版权所有（C）2013，JPO＆INPIT

4. 发明专利

JP2004257884A X-ray method and apparatus for inspecting foreign substance 有权
公开(公告)号：JP2004257884A
公开(公告)日：2004-09-16
申请号：JP2003049545
申请日：2003-02-26
申请人： Nittetsu Elex Co Ltd , 株式会社日鉄エレックス
发明人： NAITO SHUJI , ISHIBASHI AKIRA
IPC分类号： G01N23/04
摘要： PROBLEM TO BE SOLVED: To provide an X-ray method and apparatus for inspecting foreign substances, which breaks through the limitations of the conventional methods, can inspect minute foreign substances in a material to be inspected while keeping high SN ratios, and can continuously carry out the inspection of the material to be inspected. SOLUTION: In the X-ray method for inspecting foreign substances, a material to be inspected is irradiated with X-rays while conveying it by using a conveyer 11, transmitted X-rays are detected as electric signals by using an X-ray detecting means, and the signals are processed, thereby inspecting the foreign substances in the material to be inspected. In the X-ray method, an X-ray image intensifier 14 and a camera 15 using a CCD (charge coupled device) image sensor 25 of time-delay integration types which photographs an image of the X-ray image intensifier 14, are used as the X-ray detecting means, and the charge-transfer speed of the CCD image sensor 25 is controlled so as to synchronize with an X-ray transmission image moving on the imaging surface 23 of the X-ray image intensifier 14, thereby obtaining clear image signals with the high SN ratio. COPYRIGHT: (C)2004,JPO&NCIPI

5. 发明专利

JP2010249691A Creation method of calibration curve 审中-公开
标题翻译：校准曲线的创建方法
公开(公告)号：JP2010249691A
公开(公告)日：2010-11-04
申请号：JP2009100083
申请日：2009-04-16
申请人： Nittetsu Elex Co Ltd , 株式会社日鉄エレックス
发明人： NAITO SHUJI , SUMIKAWA KIYOSHI
IPC分类号： G01B15/02
摘要： PROBLEM TO BE SOLVED: To provide a creation method of a calibration curve, in which a calibration curve of an X-ray detector showing the relationship between the thickness of an object to be measured and an output value is inexpensively created with high accuracy.
SOLUTION: The creation method of a calibration curve showing the relationship between the thickness of the object to be measured 10 and the output value of the X-ray detector 15 includes: a first process for determining a calculation calibration curve showing the relationship between the thickness of the object to be measured 10 and a theoretical output value by calculating the theoretical output value of the X-ray detector 15 when passing a plurality of virtual test specimens, made of the same material as the object to be measured 10 but having a different thickness between the X-ray source 14 and the X-ray detector 15 from data of an interaction cross-section area value of a substance present in a path from X-ray source 14 to the X-ray detector 15 and X-rays; a second process for determining an actual measurement standard output value of the X-ray detector 15 when passing a standard specimen 35 through between the X-ray source 14 and the X-ray detector 15; a third process for determining a conversion factor which matches the theoretical standard output value to the actual measurement standard value calculated; and a fourth process for determining a calibration curve from a calculation calibration curve based on the conversion factor.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供一种校准曲线的创建方法，其中表现出待测对象的厚度与输出值之间的关系的X射线检测器的校准曲线以高成本被廉价地创建准确性。解决方案：显示待测物体10的厚度与X射线检测器15的输出值之间的关系的校准曲线的制作方法包括：用于确定显示关系的计算校准曲线的第一处理在通过由与待测对象10相同的材料制成的多个虚拟测试样本时计算X射线检测器15的理论输出值，而在待测量对象物10的厚度和理论输出值之间，但是根据从X射线源14到X射线检测器15的路径中存在的物质的相互作用横截面积值的数据，X射线源14与X射线检测器15之间的厚度不同，X 射线; 用于在通过X射线源14和X射线检测器15之间通过标准样本35时确定X射线检测器15的实际测量标准输出值的第二过程; 用于确定将理论标准输出值与所计算的实际测量标准值相匹配的转换因子的第三过程; 以及基于转换因子从计算校准曲线确定校准曲线的第四过程。版权所有（C）2011，JPO＆INPIT

6. 发明专利

JP2007017194A Visual examination device of cylindrical matter 有权
标题翻译：圆柱形视觉检查装置
公开(公告)号：JP2007017194A
公开(公告)日：2007-01-25
申请号：JP2005196504
申请日：2005-07-05
申请人： Nittetsu Elex Co Ltd , 株式会社日鉄エレックス
发明人： NAITO SHUJI , MIYAZAKI HIROMITSU , KAMATA NORIYUKI
IPC分类号： G01N21/88
摘要： PROBLEM TO BE SOLVED: To provide an visual examination device of cylindrical matter capable of detecting the dent, flaw and stain present on the side surface and edge face of the cylindrical matter in a short time to display them.
SOLUTION: The visual examination device of the cylindrical matter has a moving means 13 for holding one end part of the cylindrical matter 11 to move it to an inspection position Q present at a standby position P, a truncated cone-shaped mirror 16 equipped with a reflecting surface 15 for surrounding the side surface 14 of the cylindrical matter 11 so that its center axis is allowed to coincide with the axis of the cylindrical matter 11 present at an inspection position Q, a perforated plane mirror 20 having an insertion hole 19 permitting the cylindrical matter 11 to pass formed thereto and arranged so as to be inclined with respect to the axis of the cylindrical matter 11 present at the inspection position Q, a first annular illumination means 23 having an opening 21 provided to its central part, arranged so as to be inclined with respect to the plane mirror 20 and irradiating the side surface 14 of the cylindrical matter 11 with vertical light through the truncated cone-shaped mirror 16 and the perforated flat mirror 20 and a side surface photographing means 26 for photographing the side surface image of the cylindrical matter 11 arranged on the back side of the first annular illumination means 23.
COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：提供一种能够在短时间内检测圆柱形物质的侧面和边缘面上存在的凹痕，缺陷和污迹的圆柱形物体的目视检查装置，以显示它们。解决方案：圆柱形物体的目视检查装置具有移动装置13，用于保持圆柱形物质11的一个端部以将其移动到存在于待机位置P处的检查位置Q，截头圆锥形反射镜16 配备有用于围绕圆柱形物质11的侧表面14的反射表面15，使得其中心轴线与存在于检查位置Q处的圆柱形物质11的轴线重合，具有插入孔的穿孔平面镜20 如图19所示，允许圆柱形物质11通过，并且布置成相对于存在于检查位置Q处的圆柱形物质11的轴线倾斜，第一环形照明装置23具有设置在其中心部分的开口21，被布置成相对于平面镜20倾斜，并且通过垂直光照射圆柱形物质11的侧面14穿过截头圆锥形的微米棱镜16和穿孔的平面镜20以及用于拍摄布置在第一环形照明装置23的背面上的圆柱形物质11的侧面图像的侧面拍摄装置26.版权所有（C）2007，JPO＆INPIT

7. 发明专利

JP2005069887A Defect inspection method and apparatus 有权
标题翻译：缺陷检查方法和装置
公开(公告)号：JP2005069887A
公开(公告)日：2005-03-17
申请号：JP2003300258
申请日：2003-08-25
申请人： Nippon Steel Corp , 新日本製鐵株式会社
发明人： KONNO YUSUKE , NAITO SHUJI
IPC分类号： G01N21/88 , G06T1/00 , G06T5/00
摘要： PROBLEM TO BE SOLVED: To provide a surface inspection method and an apparatus capable of high-speed and efficient processing.
SOLUTION: An input image is divided into overlapping rectangles (S60). The insides of the rectangles are binarized by a prescribed luminance threshold (S70). The number of prescribed ("0" or "1") pixels among binarized pixels is computed (S80). In the case that the number of pixels exceeds a prescribed pixel number threshold, it is determined that the rectangles are flawed rectangles (S90). It is possible to specify the locations of flaws on the basis of a flawed rectangle mask image (S110) constituted of the flawed rectangles. By further taking the AND of a normal binarized image (S130) and the flawed rectangle mask image (S110), it is possible to acquire a binarized image in which only flaws are detected.
COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：提供能够高速且高效处理的表面检查方法和装置。
解决方案：输入图像被分成重叠的矩形（S60）。矩形的内部通过规定的亮度阈值进行二值化（S70）。计算二值化像素中的规定（“0”或“1”）像素的数量（S80）。在像素数超过规定像素数阈值的情况下，确定矩形是有缺陷的矩形（S90）。可以基于由有缺陷的矩形构成的有缺陷的矩形掩模图像（S110）来指定瑕疵的位置。通过进一步获取正常二值化图像（S130）的AND和有缺陷的矩形掩模图像（S110），可以获取仅检测到缺陷的二值化图像。版权所有（C）2005，JPO＆NCIPI

8. 发明专利

JP2007127672A Device and method for measuring width of oven 有权
标题翻译：用于测量烤箱宽度的装置和方法
公开(公告)号：JP2007127672A
公开(公告)日：2007-05-24
申请号：JP2007036448
申请日：2007-02-16
申请人： Nippon Steel Corp , 新日本製鐵株式会社
发明人： SUGIURA MASAHITO , NAITO SHUJI , YOKOMIZO MASAHIKO , SAKAIDA MICHITAKA , EGAWA HIDE , KAJIYA TAKANORI
IPC分类号： G01B11/02
摘要： PROBLEM TO BE SOLVED: To provide an oven-width measuring method which does not require any cooling water pipe and is capable of resisting a high temperature during the time necessary for inserting the measuring apparatus into the oven, performing measurement, and extracting it, thereby enabling the oven-width of a high temperature oven chamber such as a coke oven carbonizing chamber to be measured rapidly and easily.
SOLUTION: The oven-width measuring apparatus is used for measuring the distance between oven walls facing each other, a measuring unit 2 for measuring the oven width includes an oven-width measuring instrument 8 and a power supply unit 10, and is accommodated in a jacket filled with liquid 7 having endothermic ability, and the outside of the jacket is covered with heat insulating material 4. The measuring unit 2 also includes a wireless transmitter 18 for transmitting the data of the measured oven-widths to an external data storage device 22, or the wireless transmitter and a data-recording unit 9. The data-recording unit records data of the horizontal measured present position as well as the data of the measured oven-widths.
COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：提供一种不需要任何冷却水管并能够在将测量装置插入烘箱所需的时间内耐高温的烤箱宽度测量方法，进行测量和提取从而能够快速且容易地测量焦炉碳化室等高温烘箱的炉宽。
解决方案：烤箱宽度测量装置用于测量彼此相对的炉壁之间的距离，用于测量烘箱宽度的测量单元2包括烤箱宽度测量仪器8和电源单元10，并且是容纳在填充有具有吸热能力的液体7的护套中，并且护套的外部被隔热材料4覆盖。测量单元2还包括无线发射器18，用于将测量的烤箱宽度的数据传输到外部数据存储装置22或无线发射器和数据记录单元9.数据记录单元记录水平测量的当前位置的数据以及测量的烤箱宽度的数据。版权所有（C）2007，JPO＆INPIT

9. 发明专利

JP2008026060A Flaw inspection device of insulating film covered belt-like body 审中-公开
标题翻译：绝缘胶片覆盖皮肤体的FLAW检查装置
公开(公告)号：JP2008026060A
公开(公告)日：2008-02-07
申请号：JP2006196879
申请日：2006-07-19
申请人： Nippon Steel Corp , 新日本製鐵株式会社
发明人： YAMAJI HIRONAO , KONNO YUSUKE , NAITO SHUJI
IPC分类号： G01N21/892
摘要： PROBLEM TO BE SOLVED: To inspect with higher detection performance by a simpler constitution in comparison with hitherto, when discriminating and detecting respectively each flaw on a lower layer and on an upper layer of an insulating film covered belt-like body.
SOLUTION: The surface of the insulating film covered belt-like body 1 comprising an insulating opaque film layer and an insulating transparent film layer is illuminated, and the surface of the covered belt-like body 1 is imaged by an imaging part 20, to thereby detect a flaw. An illumination device 10 illuminates over the width direction of the insulating film covered belt-like body 1 at approximate Brewster angle of the insulating transparent film layer, and in the imaging part 20 for imaging reflected light at an approximate regular reflection angle, the first imaging device 21 for imaging through a P-polarizing filter and the second imaging device 22 for imaging through an S-polarizing filter are arranged in the width direction. In addition, the first imaging device 21 and the second imaging device 22 are arranged in the state where optical axes of each imaging lens are shifted as much as a prescribed distance in a mutually approaching direction in the width direction of the belt-like body 1, to thereby allow each imaging domain of the first and second imaging devices 21, 22 to agree with each other.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：与迄今为止相比，通过比较简单的结构来检查具有较高检测性能的情况下，分别鉴别和检测绝缘膜覆盖的带状物体的下层和上层上的每个缺陷。解决方案：照射包括绝缘不透明膜层和绝缘透明膜层的绝缘膜覆盖带状体1的表面，并且被覆盖的带状体1的表面由成像部20成像，从而检测缺陷。照明装置10在绝缘膜覆盖带状体1的宽度方向上以绝缘透明膜层的布鲁斯特角近似地照射，并且在用于以近似规则的反射角成像反射光的成像部20中，第一成像用于通过P偏振滤光器成像的装置21和用于通过S偏振滤光器成像的第二成像装置22布置在宽度方向上。此外，第一成像装置21和第二摄像装置22配置在带状体1的宽度方向上的各摄像透镜的光轴相互接近的方向上移动规定距离的状态从而允许第一和第二成像设备21,22的每个成像域彼此一致。版权所有（C）2008，JPO＆INPIT

10. 发明专利

JP2004003930A Optical shape measuring device and optical shape measuring method 有权
公开(公告)号：JP2004003930A
公开(公告)日：2004-01-08
申请号：JP2002293648
申请日：2002-10-07
申请人： Nippon Steel Corp , 新日本製鐵株式会社
发明人： KONNO YUSUKE , NAITO SHUJI
IPC分类号： G01B11/24
摘要： PROBLEM TO BE SOLVED: To provide an optical shape measuring device and an optical shape measuring method capable of measuring the shape of a measuring object highly accurately. SOLUTION: When the measuring object is irradiated with a periodically-modulated linear laser beam, a delay integration type camera 30 images reflected light and outputs an optically-cut image. A stripe image is acquired from each optically-cut image. Sliced stripe image data on each position in the longitudinal direction are multiplied by standard sine wave data from an orthogonal sine wave generation part 53, and then a stripe frequency component and its harmonic component are removed in low-pass filter parts 54a, 54b. A phase calculation part 55 calculates a phase shift of each sliced stripe image data based on removal result data, and an amplitude calculation part 56 calculates the amplitude of each sliced stripe image data. A phase continuation processing part 58 specifies a deficient region based on an amplitude image, and realizes continuation of the phase shift based on a phase image wherein a region corresponding to the deficient region is masked. COPYRIGHT: (C)2004,JPO

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