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    • 2. 发明专利
    • SEMICONDUCTOR PACKAGE
    • JPH02238655A
    • 1990-09-20
    • JP5901889
    • 1989-03-10
    • NEC CORP
    • SHIRATORI KEI
    • H01L23/50
    • PURPOSE:To constitute a semiconductor package in which a passive element has been formed collectively and to make a mounting operation easy by a method wherein a capacitor is constituted of the following: an inner lead part of a lead part at a lead frame; an insulator; the lead part. CONSTITUTION:A semiconductor element 5 is mounted, by using a brazing material 4, on a die pad 2 at a lead frame 1 composed of a conductive material; an inner lead part 3a is formed separately at a lead part 3 and is connected collectively to a tip part of the lead part 3 via an insulator 8. Accordingly, it is possible to constitute a capacitor where the insulator 8 is used as a dielectric by means of the lead part 3 and the inner lead part 3a is used as an electrode on the other side; when the capacitor must be connected, a metal wire 6 for bonding use is connected to the inner lead part 3a and this whole assembly is sealed with a sealing resin 7. Thereby, when a semiconductor package is mounted, it is not required to prepare a capacitor as a component to be externally mounted; a mounting operation is made easy; a mounting space can be reduced.
    • 3. 发明专利
    • SEMICONDUCTOR PACKAGE
    • JPS63122134A
    • 1988-05-26
    • JP26821586
    • 1986-11-10
    • NEC CORP
    • SHIRATORI KEI
    • H01L21/60
    • PURPOSE:To avoid electric characteristic defect due to the suspension of metal wirings for bonding and the flow of brazing material for mounting by coating the periphery, the side of a semiconductor element placing part in a lead frame and the ends of external leads, and the side with an electric insulator. CONSTITUTION:A semiconductor element 3 is placed on a lead frame in which the periphery, the side of a semiconductor element placing part 1 in a lead frame, the end and sides of external leads 2 are coated with electric insulator 4, and electrodes on the element 3 and external leads 2 are connected by bonding metal wirings 5. Even if the wirings 5 are suspended as designated by a dotted line 6 at the manufacturing and using stages, electric characteristics are not damaged since the periphery and the sides are coated with the insulator 4.
    • 6. 发明专利
    • SEMICONDUCTOR PACKAGE
    • JPH02238639A
    • 1990-09-20
    • JP5901789
    • 1989-03-10
    • NEC CORP
    • SHIRATORI KEI
    • H01L23/12H01L21/52
    • PURPOSE:To prevent the surface of a semiconductor element from being contaminated by a method wherein a hollow part is formed in an a die pad of a lead frame, one end part of an element-fixing sheet composed of an electrically insulating material is inserted and the semiconductor element is held and supported by the other end part of the element-fixing sheet. CONSTITUTION:In a die pad 2 of a lead frame 1 composed of a conductive material, hollow parts 2a toward the center direction are formed on side faces on both of its sides; one-side ends of nearly U-shaped element fixing sheets composed of an electrically insulating material are inserted into them. A semiconductor element 5 is mounted on the die pad 2; both of its side parts are held by the other-side ends of the element-fixing sheets 4; the element is fixed to the element-mounting part 2. Accordingly, since the semiconductor element 5 is fixed to the die pad 2 by using only the element-fixing sheets 4, a brazing material for mounting use is not required. Thereby, it is possible to prevent the surface of the semiconductor element 5 from being contaminated when the brazing material springs up; it is possible to enhance a manufacturing yield of a semiconductor device and to improve its reliability.
    • 7. 发明专利
    • LEAD FRAME
    • JPS63275125A
    • 1988-11-11
    • JP11180687
    • 1987-05-07
    • NEC CORP
    • SHIRATORI KEI
    • H01L21/52H01L23/50
    • PURPOSE:To prevent the short-circuit of external leads and the bonding defect of ground metal wires caused by the flowing of solder material, by providing a groove surrounding partially or totally the periphery of a semiconductor element mounting part. CONSTITUTION:A groove 4 formed by extrusion molding from a mounting surface for semiconductor elements is arranged so as to surround partially or totally the pripheral part of a region for mounting a semiconductor elements. A semiconductor element 5 is mounted with a soldering material 6 for mounting. Electrodes on the semiconductor element 5, and external leads 2 and a mounting part 1 for semiconductor element are connected with a metal wire 7 and a ground metal wire 8. By the effect of the groove 4, the soldering material 6 for mounting can be prevented from flowing out at the time of mounting work, so that the generation of short-circuit between the semiconductor mounting part 1 and an external lead part 2, and the bonding defect of the ground metal wire 8 can be prevented.
    • 10. 发明专利
    • JPH05335383A
    • 1993-12-17
    • JP16177292
    • 1992-05-29
    • NEC CORP
    • SHIRATORI KEI
    • H01L21/66
    • PURPOSE:To provide a pellet structure wherein the characteristic of a semiconductor wafer-shaped pellet can be inspected and, at the same time, the characteristic rank of the pellet which has been judged to be a good product can be judged. CONSTITUTION:The following are connected in the order of elements 12 (fuse elements) 12, for masking use, capable of being blown, electrode pads 13 for external extraction use and elements (fuse elements) 14, for marking use, capable of being blown: pad parts 3, 5, 7, 9, for bonding use, which are situated at four corners of a pellet 1 in the state of a semiconductor wafer; and pad parts 11, for bonding use, which are situated at four corners of other pellets 2 situated so as to be opposite to the pellet. An electric current is applied to the electrode pads for external extraction use at the pad parts for bonding use; the fuses 12 are blown selectively according to a characteristic rank obtained by a characteristic inspection. Thereby, when the four fuses are combined so as to be blown and so as not to be blown, the characteristic rank can be judged.