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    • 7. 发明专利
    • TEST CIRCUIT
    • JPS55125742A
    • 1980-09-27
    • JP3453279
    • 1979-03-23
    • NIPPON ELECTRIC CO
    • KOIZUMI SHIYOUICHIROUYAMAMOTO SEIICHI
    • G01R31/00H04B17/00H04B17/29
    • PURPOSE:To enable to minimize the interruption of communication due to test, by reducing the test time through the constitution of the circuit for test added only at test to each circuit of the automatic gain control circuit. CONSTITUTION:At test, the selectors 3, 6, 11, 12 are operated to form the circuit for test. That is, the output of the control voltage production circuit 9 is connected to the judgement circuit 14 with the selector 11 to discriminate whether or not the output of the circuit 9 is within the voltage range expected and output 15 is made, and in the selector 12, the test and control voltage generating circuit 13 producing the output voltage preset is connected to the variable gain circuit 7. Further, the selectors 11, 12 interrupt the input and output of the integration circuit 10, but the circuit 10 holds the control voltage immediately before the test start and plays a role of voltage hold circuit. Next, at the end of test, the selectors 3, 6, 12 are restored, the hold voltage of the circuit 10 is inputted to the circuit 7, and the output signal of the same level as that immediately before the start of test is obtained, the selector 11 is restored after that, and normal communication state is obtained.