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1. 发明专利

JPS61230055A ULTRASONIC FLAW INSPECTING DEVICE 失效
公开(公告)号：JPS61230055A
公开(公告)日：1986-10-14
申请号：JP6990185
申请日：1985-04-04
申请人： NIPPON KOKAN KK
发明人： NAKAGAWA MASAYOSHI , IKEDA MASAHIKO , YASUHARA TATSUYA , FUJIWARA TOMEO , UCHINO KAORU
IPC分类号： G01N29/24
摘要： PURPOSE:To obtain a clear waveform without being influenced by an irregularly reflected echo by inserting a probe into a holder provided with an irregular reflection absorbing member at the lower inner surface and inspecting the flaw of a member to be tested. CONSTITUTION:The holder 2 is provided with a coaxial cut part 3 on the lower inner peripheral surface and therein a circular irregular reflection absorbing member 4 is fitted so that its inner periphery and the lower surface can be made flush with the inner periphery and lower surface of the holder 2 respectively. The probe 1 is inserted into the holder 2 so that its bottom can contact the irregular reflection absorbing member 4, and its lower surface is fixed at a position where it is located upward the lower surface of the holder 2 by a clearance (g). When the holder 2 inserted by the probe 1 is placed on the material to be tested 5, the clearance (g) is formed. When a flaw is searched in this state, all the irregularly reflected echo due to fine cracking on the surface or right under of the material to be tested 5 is absorbed by the irregular reflection absorbing member 4, whereby the extremely clear waveform can be obtained without influence of the irregularly reflected echo.

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