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    • 1. 发明专利
    • Semiconductor package
    • 半导体封装
    • JP2012222291A
    • 2012-11-12
    • JP2011089286
    • 2011-04-13
    • Mitsubishi Electric Corp三菱電機株式会社
    • YOSHIMATSU NAOKIKIKUCHI MASAO
    • H01L23/36
    • H01L2924/0002H01L2924/00
    • PROBLEM TO BE SOLVED: To provide a semiconductor package that allows improving reliability.SOLUTION: A semiconductor element 2a is mounted on a heat spreader 1a. A semiconductor element 2b is mounted on a heat spreader 1b. One end of a lead terminal 5b is bonded to the heat spreader 1a. The other end of the lead terminal 5b is bonded to the semiconductor element 2b. A molding resin 4a seals a part of the heat spreader 1a and the semiconductor element 2a. A molding resin 4b seals a part of the heat spreader 1b and the semiconductor element 2b. The molding resin 4b is separated by the molding resin 4a.
    • 要解决的问题:提供允许提高可靠性的半导体封装。 解决方案:半导体元件2a安装在散热器1a上。 半导体元件2b安装在散热器1b上。 引线端子5b的一端接合到散热器1a。 引线端子5b的另一端接合到半导体元件2b。 模制树脂4a密封散热器1a和半导体元件2a的一部分。 模制树脂4b密封散热器1b和半导体元件2b的一部分。 模制树脂4b被模塑树脂4a分离。 版权所有(C)2013,JPO&INPIT
    • 3. 发明专利
    • Semiconductor device
    • 半导体器件
    • JP2011035265A
    • 2011-02-17
    • JP2009181689
    • 2009-08-04
    • Mitsubishi Electric Corp三菱電機株式会社
    • NAKAJIMA YASUSHIYOSHIMATSU NAOKI
    • H01L23/40H01L25/07H01L25/18
    • H01L2924/0002Y02T10/6204H01L2924/00
    • PROBLEM TO BE SOLVED: To improve spring pressure-application controllability of a semiconductor module cooling device. SOLUTION: A first through-hole 12 is formed at a center part of a semiconductor module 10, and a spring 14 is arranged on the upper surface side thereof. A second through-hole 16 is formed on the spring 14. A cooling device 18 is arranged on the undersurface side of the semiconductor module 10, and a screw hole 20 is formed on the upper surface of the cooling device 18. A spring retainer 22 includes a tubular erect part 24 and a spring contact part 26. The erect part 24 is inserted in the second through-hole 16 of the spring 14. The spring contact part 26 extends outward from the upper end of the erect part 24, and supported by the erect part 24 to keep a certain distance from the upper surface of the semiconductor module 10. The spring 14 is sandwiched between the upper surface of the semiconductor module 10 and the spring contact part 26. A screw 28 is screwed to the screw hole 20 of the cooling device 18 through the first through-hole 12 of the semiconductor module 10 and the inside of the erect part 24, and the semiconductor module 10 and the spring retainer 22 are fixed to the cooling device 18. COPYRIGHT: (C)2011,JPO&INPIT
    • 要解决的问题:提高半导体模块冷却装置的弹簧压力施加控制性。 解决方案:第一通孔12形成在半导体模块10的中心部分处,弹簧14布置在其上表面侧。 第二通孔16形成在弹簧14上。冷却装置18布置在半导体模块10的下表面侧,并且在冷却装置18的上表面上形成螺纹孔20.弹簧保持器22 包括管状直立部分24和弹簧接触部分26.直立部分24插入到弹簧14的第二通孔16中。弹簧接触部分26从直立部分24的上端向外延伸,并被支撑 通过直立部分24与半导体模块10的上表面保持一定距离。弹簧14夹在半导体模块10的上表面和弹簧接触部分26之间。螺钉28被螺纹连接到螺钉孔 20通过半导体模块10的第一通孔12和直立部分24的内部,以及半导体模块10和弹簧保持器22固定在冷却装置18上。版权所有: (C)2011,JPO&INPIT
    • 5. 发明专利
    • Current breaking device and its manufacturing method
    • 电流破坏器件及其制造方法
    • JP2009259569A
    • 2009-11-05
    • JP2008106714
    • 2008-04-16
    • Mitsubishi Electric Corp三菱電機株式会社
    • YONEDA YUTAKAHAYASHI KENICHINAKAJIMA YASUSHIYOSHIMATSU NAOKIKIMOTO NOBUYOSHI
    • H01H85/36H01H69/02
    • PROBLEM TO BE SOLVED: To provide a current breaking device for extinguishing arc discharge surely in a short time, and easily forming a low-melting-point conductor part, as well as its manufacturing method.
      SOLUTION: The device is made provided with a first electrode 1, a second electrode 2, a third electrode 3 arranged partly superposed with the second electrode, a flexible conductor 5 with flexibility for connecting the first electrode and the second electrode, a low-melting-point conductor 4 fitted at the superposed part of the second electrode and the third electrode to electrically and mechanically connect the second electrode and the third electrode, and a biasing member 6 deforming the flexible conductor by a biasing force in accordance with softening or melting of the low-melting-point conductor to move the second electrode toward a first electrode side.
      COPYRIGHT: (C)2010,JPO&INPIT
    • 要解决的问题:提供一种在短时间内确定地熄灭电弧放电的电流断路装置,并且容易地形成低熔点导体部件及其制造方法。 解决方案:该器件设置有第一电极1,第二电极2,与第二电极部分重叠的第三电极3,具有用于连接第一电极和第二电极的柔性的柔性导体5, 低熔点导体4,其安装在第二电极和第三电极的重叠部分处,以电连接和机械连接第二电极和第三电极;以及偏置构件6,通过根据软化的偏置力使柔性导体变形 或熔化低熔点导体以将第二电极移向第一电极侧。 版权所有(C)2010,JPO&INPIT
    • 9. 发明专利
    • Semiconductor device and manufacturing method of the same
    • 半导体器件及其制造方法
    • JP2014036077A
    • 2014-02-24
    • JP2012175661
    • 2012-08-08
    • Mitsubishi Electric Corp三菱電機株式会社
    • YOSHIMATSU NAOKIKIKUCHI MASAOUSUI OSAMUMURATA DAISUKE
    • H01L23/48
    • H01L2224/40H01L2224/40137H01L2224/48091H01L2224/48247H01L2224/48472H01L2224/83801H01L2224/84801H01L2924/00014H01L2924/13055H01L2924/181H01L2924/00H01L2924/00012H01L2224/37099H01L2224/37599
    • PROBLEM TO BE SOLVED: To provide a semiconductor device which can bond an inner lead and a semiconductor element at an intended distance in a height direction from each other in a manufacturing process by a simple structure, and provide a semiconductor device manufacturing method which can bond an inner lead and a semiconductor element at an intended distance in a height direction from each other.SOLUTION: A semiconductor device according to the present embodiment comprises: a metal block 2; a semiconductor element bonded on the metal block 2; and an inner lead 1c bonded on a top face of the semiconductor element. The inner lead 1c includes: a first part 1f extending from a lead frame 1a which supports the inner lead 1c to above the semiconductor element; and a second part 1g extending from above the semiconductor element in a cantilever fashion and projecting outward from the metal block 2 in a planar view by at least more than a thickness of the inner lead 1c. The semiconductor element, a bonded part of the inner lead 1c with the semiconductor element and the second part 1g are encapsulated by a resin 3.
    • 要解决的问题:提供一种半导体器件,其可以通过简单的结构在制造过程中将内引线和半导体元件在高度方向上的预定距离彼此接合,并且提供可以键合的半导体器件制造方法 内引线和半导体元件,其高度方向彼此相对于预定距离。本实施方式的半导体器件包括:金属块2; 结合在金属块2上的半导体元件; 以及接合在半导体元件的顶面上的内引线1c。 内引线1c包括:从引线框架1a延伸的第一部分1f,引线框架1a将内引线1c支撑到半导体元件上方; 以及第二部分1g,其以悬臂方式从半导体元件上方延伸,并且在平面视图中从金属块2向外突出至少大于内引线1c的厚度。 半导体元件,具有半导体元件的内引线1c和第二部分1g的接合部分被树脂3封装。