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1. 发明专利

JP2003121500A TEST DEVICE AND TEST METHOD OF SEMICONDUCTOR DEVICE 审中-公开
公开(公告)号：JP2003121500A
公开(公告)日：2003-04-23
申请号：JP2001313093
申请日：2001-10-10
申请人： MITSUBISHI ELECTRIC CORP
发明人： YAMADA TAKASHI
IPC分类号： G01R31/28 , H01L21/66
摘要： PROBLEM TO BE SOLVED: To provide a test device and a test method capable of properly testing other semiconductor devices even if one of plural semiconductor devices distributed and connected is a defective of a short circuit mode. SOLUTION: This test device is provided with: a test signal generation- determination device 2 having plural signal terminals and used for generating test signals for the semiconductor devices 1A and 1B from the respective signal terminals and for executing determination from response signals from the semiconductor devices; plural signal lines 3 connected to the respective signal terminals and respectively having plural parallel connection wires 4; and serial connection bodies each comprising a resistor 7 and a probe 5 and connected to the respective signal lines 3 and parallel connection wires 4. The probes connected to the respective signal lines and connection wires are respectively connected to corresponding pads of the plural semiconductor devices 1A and 1B to simultaneously test the plural semiconductor devices.

2. 发明专利

JP2001318126A METHOD FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT, EQUIPMENT FOR TESTING SEMICONDUCTOR, AND SEMICONDUCTOR INTEGRATED CIRCUIT 失效
公开(公告)号：JP2001318126A
公开(公告)日：2001-11-16
申请号：JP2000135610
申请日：2000-05-09
申请人： MITSUBISHI ELECTRIC CORP
发明人： YAMADA TAKASHI
IPC分类号： G01R31/26 , G01R31/28 , G01R31/30 , G11C16/02 , G11C29/00 , G11C29/06 , G11C29/56
摘要： PROBLEM TO BE SOLVED: To shorten the inspection time required for acceleration test at the time of testing a semiconductor integrated circuit including a novolatile memory element. SOLUTION: The method for testing a semiconductor integrated circuit having a novolatile memory element and a peripheral circuit part other than the novolatile memory element comprises a first step for applying a high voltage to all memory cells in the novolatile memory element and a second step for imparting a test pattern to the peripheral circuit part other than the novolatile memory element while applying a high voltage wherein both steps are performed simultaneously.

3. 发明专利

JPH0552913A SEMICONDUCTOR TESTING DEVICE 失效
公开(公告)号：JPH0552913A
公开(公告)日：1993-03-02
申请号：JP24276591
申请日：1991-08-27
申请人： MITSUBISHI ELECTRIC CORP
发明人： YAMADA TAKASHI
IPC分类号： G01R31/26 , G01R31/28 , G06F11/22 , G11C29/00 , G11C29/56
摘要： PURPOSE:To fetch information regarding expected value data to a semiconductor testing device without using any test board by providing the second driver and comparator circuits separately from a driver and comparator circuits for testing devices. CONSTITUTION:When expected value data are fetched, a test head 10 is not used, but a ROM data reader 15 is used. Address data generated by a pattern generator (PG) are sent to an expected value ROM 12 through a pipeline latch (PL) 3a and address driver 11. Upon receiving the address data, the ROM 12 outputs writing data to a data memory 4 through a data comparator 13 and PL 14. The memory 4 writes data upon inputting the address data and writing data. Therefore, the information regarding the expected value data can be fetched to a testing device without using any test board and the burden to the operator can be reduced.

4. 发明专利

JP2006322685A OUTDOOR HEAT EXCHANGER WATER COOLING DEVICE FOR AIR CONDITIONER 审中-公开
公开(公告)号：JP2006322685A
公开(公告)日：2006-11-30
申请号：JP2005148022
申请日：2005-05-20
申请人： MITSUBISHI ELECTRIC CORP
发明人： YAMADA TAKASHI
IPC分类号： F24F11/02 , F25B39/04
摘要： PROBLEM TO BE SOLVED: To solve problems in cooling an outdoor heat exchanger of a conventional air conditioner wherein sufficient cooling cannot be attained because drain of an indoor unit after air-conditioning the indoors is led to the outdoor heat exchanger and used for cooling, and in the case of using tap water instead of drain, an initial cost and a running cost are high due to continuous cooling. SOLUTION: This outdoor heat exchanger water cooling device for the air conditioner comprises the outdoor heat exchanger mounted to an outdoor unit of the air conditioner; a main pipe of cooling water piping disposed at the upper part of the heat exchanger to supply water; a solenoid valve provided at an intermediate part of the cooling water piping for water supply to regulate water supply; and a control part having an outside air temperature sensor part for detecting an outdoor air temperature to adjust the solenoid valve, and a timer part for making adjustment based on time. COPYRIGHT: (C)2007,JPO&INPIT

5. 发明专利

JP2003173696A TEST DEVICE AND TEST METHOD FOR SEMICONDUCTOR MEMORY 审中-公开
公开(公告)号：JP2003173696A
公开(公告)日：2003-06-20
申请号：JP2001373228
申请日：2001-12-06
申请人： MITSUBISHI ELECTRIC CORP
发明人： HIKIYAMA YOSHIYUKI , YAMADA TAKASHI
IPC分类号： G01R31/28 , G11C29/00 , G11C29/56
摘要： PROBLEM TO BE SOLVED: To provide a test device and a test method for semiconductor memory, in which capacity of fail memories required for relieving analysis of a semiconductor memory is reduced and of which the test cost is reduced. SOLUTION: In a semiconductor test device provided with a fail memory storing defect information of a semiconductor memory to be tested having a spare column memory and a spare row memory, the fail memory has such constitution that the memory is divided into a fail memory 110 for semiconductor memory, a fail memory 120 for spare column, a fail memory 130 for spare row, and a fail memory 140 for spare intersection. COPYRIGHT: (C)2003,JPO

6. 发明专利

JP2002343098A TEST METHOD FOR SEMICONDUCTOR MEMORY 失效
公开(公告)号：JP2002343098A
公开(公告)日：2002-11-29
申请号：JP2001149214
申请日：2001-05-18
申请人： MITSUBISHI ELECTRIC CORP
发明人： YAMADA TAKASHI
IPC分类号： G01R31/28 , G01R31/3183 , G11C17/00 , G11C29/10 , G11C29/44 , G11C29/00
摘要： PROBLEM TO BE SOLVED: To provide a test method by which an optimized test is performed for a plurality of semiconductor memories to be tested and considerable number of devices can be saved out of devices discriminated as defective devices which are rejected by a conventional test method. SOLUTION: A plurality of test patterns is set to a test device 6 of a semiconductor memory, a different test pattern is applied to a plurality of semiconductor memories 1 to be tested, while it is discriminated whether test result output of each semiconductor memory 1 to be tested is in the prescribed tolerance or not.

7. 发明专利

JPH0817200A NON-VOLATILE SEMICONDUCTOR STORAGE AND ITS TESTING METHOD 失效
公开(公告)号：JPH0817200A
公开(公告)日：1996-01-19
申请号：JP14472494
申请日：1994-06-27
申请人： MITSUBISHI ELECTRIC CORP
发明人： YAMADA TAKASHI
IPC分类号： G11C17/00 , G11C16/06 , G11C29/00 , G11C29/04 , G11C29/12 , G11C29/56
摘要： PURPOSE:To obtain a non-volatile semiconductor storage which can replace the memory cell with improper erasure operation by a redundant memory cell. CONSTITUTION:A plurality of memory cells of the memory array of a non- volatile semiconductor storage 1 with redundant memory cells are erased collectively. An address signal is given to selection means 6, 8, and 21 from a sequential address generation means 20, a specific number of memory cells out of a plurality of memory cells which are erased collectively are sequentially selected, and data are read from the selected specific number of memory cells. When the erasure operation of at least a specific ratio of memory cells out of data read from a specific number of memory cells where an erasure memory cell counting means 22 is selected is completed, a borrow signal is outputted and the test control means of the erasure operation is subjected to erasure operation completion.

8. 发明专利

JPH07281952A NONVOLATILE SEMICONDUCTOR STORAGE 失效
公开(公告)号：JPH07281952A
公开(公告)日：1995-10-27
申请号：JP7345294
申请日：1994-04-12
申请人： MITSUBISHI ELECTRIC CORP
发明人： YAMADA TAKASHI
IPC分类号： G11C17/00 , G06F12/00 , G06F12/06 , G11C16/02 , G11C16/06
摘要： PURPOSE:To shorten the test time and to increase the overall working speed of a system by providing an erase/write/read control part to simultaneously carry out two or more of erasion, write and read functions in different memory blocks. CONSTITUTION:In a write mode, the write signal/data consisting of a control signal 2, the data 3 and an address 4 are given to an instruction analysis/status data generation part 6 from the outside. The part 6 confirms whether the operating memory block is erased or not and then sends an operation start signal to a write control part 8 through a bus 9i. The part 8 sends a using request of the bus 9 to the part 6 by a request signal 8b and receives the permission in an acknowledge signal 8c for use of the bus 9. Thus the part 8 successively transmits the signals to the bus 9, a latch circuit 11, a bus 12 and a memory block 10 and carries out a write operation. Thus, for example, a read operation can be carried out in a memory block 10c while the erase and write operations are carried out in the memory blocks 10a and 10b respectively.

9. 发明专利

JPS5768904A Antenna device for reflecting mirror 失效
标题翻译：用于反射镜的天线装置
公开(公告)号：JPS5768904A
公开(公告)日：1982-04-27
申请号：JP14465880
申请日：1980-10-16
申请人： Mitsubishi Electric Corp , Nippon Telegr & Teleph Corp
发明人： NAKAJIMA NOBUO , YAMADA TAKASHI , KATAKI TAKASHI , URASAKI SHIYUUJI , HIRUKOI TAKASHI
IPC分类号： H01Q19/12
CPC分类号： H01Q19/12
摘要： PURPOSE:To remarkably reduce the wide angle level of a reflecting mirror antenna providing a power feeding horn, by multistage location of a cone shield for a major reflecting mirror. CONSTITUTION:Cone shield 8 having k-stages in arranged at a side plate 5 of cylindrical type provided to a main reflecting mirror 3. This shield 8 is formed by linking k sets of cone metallic plates with different vertical angle. Diffractive waves are produced from an incident wave Ei0 from the mirror 3 at an edge formed with adjacent cone shields, but since a slope angle theta is set smaller around the inlet, te diffractive waves by the edge can be suppressed. Since the level of an incident wave incident to the k-th edge is sufficiently attenuated via distances S1-Sk, the diffractive waves at the k-th edge can be suppressed. Thus, the wide angle level of the reflecting mirror antenna can be reduced remarkably.
摘要翻译：目的：通过用于主反射镜的锥形屏蔽的多级定位，显着降低提供电源喇叭的反射镜天线的广角水平。构成：具有设置在主反射镜3的圆筒型侧板5上的k级的锥形屏蔽件8.该屏蔽体8通过将k组不同垂直角的锥形金属板连接而形成。衍射波由形成有相邻锥形屏蔽的边缘处的反射镜3的入射波Ei0产生，但是由于倾斜角θ在入口周围设定得较小，所以可以抑制边缘的衍射波。由于入射到第k个边缘的入射波的电平经由距离S1-Sk充分衰减，所以可以抑制第k个边缘处的衍射波。因此，可以显着地降低反射镜天线的广角水平。

10. 发明专利

JPS5717203A HORN REFLECTOR ANTENNA 失效
公开(公告)号：JPS5717203A
公开(公告)日：1982-01-28
申请号：JP9185980
申请日：1980-07-04
申请人： NIPPON TELEGRAPH & TELEPHONE , MITSUBISHI ELECTRIC CORP
发明人： YAMADA TAKASHI , ANDOU MAKOTO , YAMADA YOSHIFUSA , ABE KOUJI
IPC分类号： H01Q19/13 , H01Q21/20
摘要： PURPOSE:To improve the wide angle radiation characteristics of a horn reflector antenna toward the circumferential direction, by reducing diffracted waves of edges, through the provision of an extension opened externally in connection with ridges of antenna aperture side of a pair of side plates. CONSTITUTION:At both sides of antenna aperture of a horn reflector antenna consisting of pyramid type horn 1 for electromagnetic wave conduction, a reflector mirror 2 collecting and reflecting electromagnetic waves and a pair of side plates 3 which couples them and prevents the leakage of current, an extension 7 consisting of a flat plate is provided. One end of the extension 7 is connected along the entire length of a ridge 4 of a side plate 3, and another end is fitted so that it is located to the outside of the plate extending the side plate 3. The intensity of the electromagnetic waves diffracted at the ridge 4 of the side plate 3 is weak, since the degree of discontinuity is made small at the ridge 4 by the provision of the extension 7.

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