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1. 发明专利

JPH11337629A CALCULATION METHOD FOR PREDICTING CURRENT ZERO-POINT AND DETECTING SYSTEM THEREOF FOR SYNTHESIZING TEST 失效
公开(公告)号：JPH11337629A
公开(公告)日：1999-12-10
申请号：JP14363898
申请日：1998-05-26
申请人： MEIDENSHA ELECTRIC MFG CO LTD
发明人： FURUHATA TAKAAKI , SHIOZAKI MITSUYASU
IPC分类号： G01R31/327 , G01R19/175 , G01R31/333
摘要： PROBLEM TO BE SOLVED: To predict a current zero-point without errors, even if a DC content is included in the current. SOLUTION: Conventionally, a current zero-point is predicted by linear approximation using the data for 2 points of current. However, error becomes large, because current change near zero-point was not linear if the current contains a DC content. Now, the zero-point of current is predicted by three-point approximated value 1, using current 3-point data Ia , Ia-1 , and Ia-2 , for allowing prediction even if curved current changes near a zero-point. From the simultaneous equations, factors A, B, and C are obtained, and a time (t) until a current zero- point is obtained from an equation At +Bt+C=I.

2. 发明专利

JPH02201279A DEVICE FOR TESTING BREAKING-OPERATION OF LEADING CURRENT OF SWITCH 失效
公开(公告)号：JPH02201279A
公开(公告)日：1990-08-09
申请号：JP2230089
申请日：1989-01-31
申请人： MEIDENSHA ELECTRIC MFG CO LTD
发明人： FUKUDA SHIGEHIKO , SHIOZAKI MITSUYASU , MATSUNAMI TAKAKAZU , ARAKAWA SHUNICHI , ONOMOTO SHIYUUJI , MATSUI YOSHIHIKO , IKEMOTO KUNIO
IPC分类号： G01R31/327 , G01R31/333
摘要： PURPOSE:To make the voltage to the ground at the opposite terminals of a switch equal to that in an actual loading test or the like by a method wherein an intermediate tap is provided for a secondary-side coil of a voltage source transformer and grounded while capacitors are provided on the opposite end sides of said secondary-side coil. CONSTITUTION:An intermediate tap 3b is provided for a secondary-side coil of a voltage source transformer 3 and grounded, while capacitors 4a and 4b are provided at the opposite ends of said secondary-side coil, and auxiliary breakers 6a and 6b are provided on the opposite end terminals A and B sides of a breaker 5 to be tested, respectively. The breaker 5 to be tested and the auxiliary breakers 6 are made to let a composite current i (iL + iH) flow beforehand through the breaker 5 to be tested, and the breaker 5 and the auxiliary breaker 6 are opened simultaneously. A superposition of a charging voltage of the capacitor 4a and a voltage Vs1 is impressed on one terminal A of the breaker 5 to be tested, and a superposition of a charging voltage of the capacitor 4b and a voltage Vs2 on the other terminal B thereof. According to this method, a voltage V = VA - VB between the opposite terminals of the breaker 5 to be tested turns to be equal to the one in an actual loading test circuit.

3. 发明专利

JP2000304834A TEST DEVICE FOR CIRCUIT-BREAKER 失效
公开(公告)号：JP2000304834A
公开(公告)日：2000-11-02
申请号：JP11436399
申请日：1999-04-22
申请人： MEIDENSHA ELECTRIC MFG CO LTD
发明人： FURUHATA TAKAAKI , SHIOZAKI MITSUYASU
IPC分类号： G01R31/327 , G01R31/333 , H01H9/54
摘要： PROBLEM TO BE SOLVED: To provide a test device capable of judging the presence or absence of rebreaking after reflash-over and the presence or absence of non-continued electric discharge while suppressing arc current at the time of the reflash-over. SOLUTION: In a single phase direct test circuit, a capacitor 21 is initially charged by a direct current charging device 22 to supply vibration current equal to a short current to a sample circuit-breaker 6 from the capacitor and a reactor 23 due to trigger of a gap 25, and an auxiliary circuit-breaker 5 is opened by breaking operation of the sample circuit-breaker to apply a restoration voltage of a minute current through resistance 17 from the capacitor 15 and detect that reflash-over and non-continued electric discharge occur in the sample circuit-breaker during the application of voltage due to extinction of current by a minute current detector 27. A starter 29 triggers the gap 25 at the time of detection to supply vibration current and judge the occurrence of rebreaking and non-continued electric discharge.

4. 发明专利

JPH0763828A LOOP-CURRENT SWITCHING TESTER FOR DISCONNECTOR 失效
公开(公告)号：JPH0763828A
公开(公告)日：1995-03-10
申请号：JP21240593
申请日：1993-08-27
申请人： MEIDENSHA ELECTRIC MFG CO LTD
发明人： ONOMOTO SHIYUUJI , MATSUNAMI TAKAKAZU , CHIYOU KITSUU , SHIOZAKI MITSUYASU
IPC分类号： G01R31/327 , G01R31/333
摘要： PURPOSE:To improve workability by grounding a gas insulation switching device, setting the insulation strength of the secondary side of the transformer of a first power supply part at the specified value or more, connecting one end of the secondary side of the transformer of a second power supply part to one end of a secondary-side loop, and grounding the other end. CONSTITUTION:A gas insulation switching device 30 is set at the grounding potential. As a transformer 12 of a first power supply part 10, which supplies a loop current and a recovery voltage, the transformer, wherein the insulating strength on the secondary side is V0/sq. rt. 3 (V0 is the rated voltage) or more with respect to the primary side, is used. The conducting loop circuit on the secondary side is not grounded. On end a secondary winging 22b of a transformer 22 of a second power supply part 20 is connected to one end of the loop so as to apply simulated grounding voltage V0/sq. rt. 3. The other end of the winding 22b is grounded. In this way, it is not necessary to apply the simulated ground voltage on a tank 31 of the device 30. It is not necessary to provide high insulation in the device 30, and the workability is improved.

5. 发明专利

JPH0458173A SHORT-CIRCUIT CURRENT BREAK TESTING DEVICE FOR BREAKER 失效
公开(公告)号：JPH0458173A
公开(公告)日：1992-02-25
申请号：JP16955990
申请日：1990-06-27
申请人： MEIDENSHA ELECTRIC MFG CO LTD
发明人： FUKUDA SHIGEHIKO , ARAKAWA SHUNICHI , ONOMOTO SHIYUUJI , SHIOZAKI MITSUYASU
IPC分类号： G01R31/327 , G01R31/333
摘要： PURPOSE:To obtain a proper break current by applying the breaker to be tested with the voltages from two power sources selectively at different timing. CONSTITUTION:This device is provided with the 1st voltage source 7 which generates a voltage when a short-circuit current flowing to the breaker 6 to be tested is cut off and applies the voltage to the breaker 6 to be tested and the 2nd voltage source 19 which applies a DC voltage to the breaker 6 to be tested according to the induced voltage of the 1st voltage source 7. Then when the breaker 6 to be tested is turned off, the 1st power source 7 applies the voltage to the breaker 6 to be tested simultaneously with the cutoff of the short-circuit current. Then the DC voltage is generated by the 2nd power source 19 and applied to the breaker to be tested. Then those power sources 7 and 19 are made different in feed timing and the impedance is adjusted to select the voltage source for voltage application preferentially.

6. 发明专利

JPH02122289A MAKEUP TESTING DEVICE FOR SWITCH 失效
公开(公告)号：JPH02122289A
公开(公告)日：1990-05-09
申请号：JP27694888
申请日：1988-11-01
申请人： MEIDENSHA ELECTRIC MFG CO LTD
发明人： MATSUNAMI TAKAKAZU , ARAKAWA SHUNICHI , FUKUDA SHIGEHIKO , MATSUI YOSHIHIKO , IKEMOTO KUNIO , ONOMOTO SHIYUUJI , SHIOZAKI MITSUYASU
IPC分类号： G01R31/327 , G01R31/333
摘要： PURPOSE:To surely supply a making current by providing a rectifier for starting a supply of a making current by a flashover of a test switch, and an auxiliary making device by which a current is brought to makeup in the first half-wave period in which the making current starts to flow and a current of the rectifier is commutated. CONSTITUTION:Before makeup of a test switch 4, a half-wave voltage E1 and a high voltage obtained by adding a voltage E3 of the opposite polarity to the voltage are applied in a half period of an AC power source 1 by a rectifying operation of rectifiers 12, 14, and in the remaining half period, a half-wave voltage E2 is applied. In this state, when a makeup control of the switch 4 is executed so that a flashover is generated in the switch 4 while the high voltage is applied, the high voltage drops quickly due to the generation of a flashover of the switch 4, and when it becomes lower than the voltage E2 of a tap 2b, the rectifiers 12, 14 conduct and a supply of a making current I2 is started. When auxiliary making devices 13, 15 are brought to makeup while the first half-wave of this current I2 is flowing, the current I2 is commutated to the making devices 13, 15 and the rectifiers 12, 14 becomes an obstructed state, and thereafter, the current I2 is allowed to flow continuously by the making devices 13, 15. In such a way, while reducing the operation duty, comparing with a conventional gap, a making current can be supplied surely.

7. 发明专利

JP2000304835A TEST DEVICE FOR CIRCUIT-BREAKER 失效
公开(公告)号：JP2000304835A
公开(公告)日：2000-11-02
申请号：JP11440099
申请日：1999-04-22
申请人： MEIDENSHA ELECTRIC MFG CO LTD
发明人： FURUHATA TAKAAKI , SHIOZAKI MITSUYASU
IPC分类号： G01R31/327 , G01R31/333 , H01H9/54
摘要： PROBLEM TO BE SOLVED: To provide a test device capable of imitaing breaking phenomenon of a second phase and a third phase in a single body test of a circuit-breaker by a Weil synthetic test method. SOLUTION: In a Weil synthetic test device which supplies a short current to a sample circuit-breaker 6 from a current source circuit to apply a restoration voltage from a voltage source circuit when a current of the sample circuit- breaker is broken, a capacitor 21 is initially charged in a direct current charging device 22, a reactor 23 for generating a vibration current between the capacitor 21 and it is connected in series, and an auxiliary circuit-breaker 24 is turned on during a period of breaking current of a final half wave of the sample circuit-breaker. Consequently, a positive or negative vibration current of half cycle period generated in a series circuit of the capacitor 21 and the reactor 23 is superimposed on a breaking current of the sample circuit-breaker to obtain a breaking current wave shape imitating breaking current wave shapes IE, IR of a second phase and a third phase strictly.

8. 发明专利

JPH07311247A THREE-PHASE COMPOSITE TESTER FOR BREAKER 失效
公开(公告)号：JPH07311247A
公开(公告)日：1995-11-28
申请号：JP10424494
申请日：1994-05-19
申请人： MEIDENSHA ELECTRIC MFG CO LTD
发明人： SHIOZAKI MITSUYASU , MATSUNAMI TAKAKAZU
IPC分类号： G01R31/327 , G01R31/333
摘要： PURPOSE:To facilitate an interphase voltage regulation by supplying a short- circuiting current to the two of the three phases of a breaker under test, connecting a transformed between the contact of the other one phase and the corresponding phase of a three-phase power source, and applying a negative polarity voltage from its secondary winding. CONSTITUTION:A protective breaker 2a and an auxiliary breaker 5 are closed, and a closing switch 4a is closed to supply a short-circuiting current from a generator 1 to a breaker 15 under test in U-phase and V-phase. A negative-phase voltage is induced in the secondary winding 16b of a step-up transformer 16, and a predetermined voltage is applied to the other one set of the breaker 15 via a current suppressing resistor 17. In this case, the windings 16a and 16b of the transformer 16 have reverse polarities. A resistor is inserted to the primary side of the transformer 16 to set the applied initial AC voltage to an aperiodic waveform so that an interphase voltage can be simply regulated. Thus, an interphase insulating strength can be confirmed even under the most severe breaking conditions at the time of a transient recovery voltage.

9. 发明专利

JPH0755898A METHOD OF SYNTHETIC SHORTCIRCUIT TEST OF CIRCUIT BREAKER 失效
公开(公告)号：JPH0755898A
公开(公告)日：1995-03-03
申请号：JP20351393
申请日：1993-08-18
申请人： MEIDENSHA ELECTRIC MFG CO LTD
发明人： MATSUNAMI TAKAKAZU , ONOMOTO SHIYUUJI , CHIYOU TERUMICHI , SHIOZAKI MITSUYASU
IPC分类号： G01R31/327 , G01R31/333
摘要： PURPOSE:To expand the application of the double circuit method up to 84kV to all circuit breakers which are equal or above 100-kV. CONSTITUTION:A high-voltage side coil winding of a booster transformer TF1 of a power supply circuit in the double circuit method is set to a double coil winding with a transformation ratio of 0.715:0.285 (JEC-2300 target) or 0.67:0.33 (IEC-56 target) for cascade connection and then capacitors C1 and C2 are connected to each coil winding on the high-voltage side so that 4 parameter TRV waveform of synthetic shortcircuit test standard which is equal to or above 100kV can be generated at the high-voltage side terminal. When performing test according to the double circuit method, a four parameter TRV waveform for satisfying the synthetic shortcircuit test standard which is equal to or above 100kV is generated at the high-voltage side terminal of the booster transformer TF1. Therefore, the double circuit which was applied to only the synthesis test with a rated voltage of 84kV or less can be applied and expanded to all circuit breakers with a rated voltage of 100kV or higher.

10. 发明专利

JPH0534422A SHORT-TIME CURRENT TESTING METHOD 失效
公开(公告)号：JPH0534422A
公开(公告)日：1993-02-09
申请号：JP19174591
申请日：1991-07-31
申请人： MEIDENSHA ELECTRIC MFG CO LTD
发明人： MATSUNAMI TAKAKAZU , ONOMOTO SHIYUUJI , CHIYOU TERUMICHI , ARAKAWA SHUNICHI , SHIOZAKI MITSUYASU
IPC分类号： G01R31/34
摘要： PURPOSE:To pass a constant current without attenuating transmitted current for a specified period of current transmission time. CONSTITUTION:For a short-time withstand current test performed by connecting electrical equipment CBt to be tested to a short-circuit power generator AG via a switch 89 and via a heavy current transformer TF and by transmitting electricity to the electrical equipment to be tested by means of closing of the switch while a short-circuit power generator is put in a predetermined excited state by an electric setter SD1 for AVR, an overexciting circuit is provided which uses an overexcitation setter SD2 for the overexcitation control of the short-circuit power generator. The short-circuit power generator is thrust- excitated just before or 200 milliseconds before closing of the switch and at a multiple of overexcitation proportional to a value of current transmitted to the electrical equipment, and the transmitted current which increases at an exciting-circuit time constant based on the thrust excitation is used to compensate for decrease in the transmitted current under the predetermined excited state so as to hold the transmitted current constant.

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