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    • 3. 发明专利
    • SEMICONDUCTOR DEVICE AND INTEGRATED SEMICONDUCTOR DEVICE
    • JPH118331A
    • 1999-01-12
    • JP15718997
    • 1997-06-13
    • MATSUSHITA ELECTRIC WORKS LTD
    • HIRATA ISAO
    • H01L23/12H01L25/10H01L25/11H01L25/18
    • PROBLEM TO BE SOLVED: To enhance reliability for connection of stacked semiconductor devices. SOLUTION: A through-hole is cut at such point as separated into almost halves, so a plurality of recessed parts 2 whose cross sections are almost semicircular are provided on a side end surface of a substrate 1, while an outer lead 3 is formed at each of the recessed parts 2. A counterbore part 4 is formed on the one side surface of the substrate 1, where an opening part 5 opened to both surfaces of the substrate 1 is provided. A circuit 6 connected to the outer lead 3 is formed on the surface of the substrate 1, on the side opposite to a surface where the counterbore part 4 is provided. A semiconductor element 7 is mounted on the counterbore part 4, and a wire 8 is bonded between the semiconductor element 7 and the circuit 6 through the opening part 5. While are semiconductor element 7 mounted in the counterbore part 4 does not protrude above the surface of the substrate 1, the connection between the outer loads 3 provided on the substrate 1, with the substrate 1 being directly jointed, allows the electrically connection of a semiconductor device which is loaded.