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1. 发明专利

JP2000163588A CHECKING METHOD FOR CONDUCTIVE BALL 失效
公开(公告)号：JP2000163588A
公开(公告)日：2000-06-16
申请号：JP33872798
申请日：1998-11-30
申请人： MATSUSHITA ELECTRIC IND CO LTD
发明人： MATSUZAKI HIROFUMI
IPC分类号： H01L23/12 , G06T1/00 , G06T7/00 , H01L21/66
摘要： PROBLEM TO BE SOLVED: To decide with high accuracy whether every conductive ball is a dark ball or not by recognizing a conductive ball based on the image data, obtaining the luminance data on the recognized conductive ball and comparing the luminance data with the reference value. SOLUTION: The recognition processing of all conductive balls is confirmed together with the acquisition processing of the luminance data on the balls (ST1). The image data on the balls which are not processed yet are binarized (ST2) and a group of bright image parts is extracted via the labeling processing to recognize the balls (ST3). The luminance data on the balls to be processed are obtained (ST4) and stored (ST5). The average value of luminance data on all balls is calculated (ST6), and the value decided by multiplying the average value of luminance data by a prescribed ratio is set as the reference value (ST7). The luminance data on a relevant ball are compared with the reference value (ST10). If the luminance data are lower than the reference value, the relevant ball is decided as a dark ball (ST11).

2. 发明专利

JPH10318711A DETECTING METHOD FOR POSITION OF PAD ON CHIP 失效
公开(公告)号：JPH10318711A
公开(公告)日：1998-12-04
申请号：JP12664697
申请日：1997-05-16
申请人： MATSUSHITA ELECTRIC IND CO LTD
发明人： MATSUZAKI HIROFUMI
IPC分类号： G01B11/00
摘要： PROBLEM TO BE SOLVED: To provide a detecting method for the position of a pad on a chip, in which the position of the pad on the chip as the bonding position of a wire can be found precisely, before a wire bonding operation in which the pad on the chip and an electrode on a substrate are connected by the wire. SOLUTION: A first longitudinally long frame A which crosses a pad 12 in the X-direction and a second transversely long frame B which crosses the pad in the Y-direction are set inside the search area S of an image which is fetched by a camera. The first frame A is moved in the X-direction, the second frame B is moved in the Y-direction, and edges E1 to E4 as distributions of the ratio of a bright part to a dark part are found. The middle point between the edge E1 and the edge E2 becomes the X-coordinate position of the pad 12, and the middle point between the edge E3 and the edge E4 becomes the Y-coordinate position of the pad 12.

3. 发明专利

JPH10261675A METHOD OF LOADING CONDUCTIVE BALL 失效
公开(公告)号：JPH10261675A
公开(公告)日：1998-09-29
申请号：JP6407597
申请日：1997-03-18
申请人： MATSUSHITA ELECTRIC IND CO LTD
发明人： SAKAI TADAHIKO , MATSUZAKI HIROFUMI , NAKAZATO SHINICHI , KASAI TERUAKI , EGUCHI TOMOFUMI , TAKAHASHI KOICHI
IPC分类号： B23P21/00 , H01L21/60 , H05K3/34 , H01L21/321
摘要： PROBLEM TO BE SOLVED: To provide the method of loading conductive balls, which can surely detect a pickup error and a mis-placing. SOLUTION: A camera 30 is provided for the moving route of a chuck head 11 of conductive balls 1. The lower face of the chuck head 11 is image-picked up. A first search region which is set by surrounding all the chuck holes 11a is set and a second search region in a range except for the first search region, based on the arranging pattern of the chuck holes 11a, which are previously stored in a screen obtained by image-pickup. The presence or absence of the pickup error of the conductive balls is detected according to the first and second search regions. Then, whether or not the conductive balls that are left by means of the placing error exist is detected with the whole range of the lower face of the chuck head 11 as the search regions after the loading of the conductive balls 1.

4. 发明专利

JPH08159727A METHOD FOR SETTING REFERENCE PATTERN IN PATTERN MATCHING 失效
公开(公告)号：JPH08159727A
公开(公告)日：1996-06-21
申请号：JP29838694
申请日：1994-12-01
申请人： MATSUSHITA ELECTRIC IND CO LTD
发明人： MATSUZAKI HIROFUMI
IPC分类号： G01B11/24 , G06T7/00 , G06T7/60
摘要： PURPOSE: To evaluate each position based on each degree of complexity regarding two crossing coordinate axes while updating the position of a reference box in the same shape as the reference pattern and to automatically and objectively set the reference pattern with the image data of the most favorable position as the reference pattern. CONSTITUTION: A CPU 5 stores image data in a window obtained by a camera 4 in an image memory 7, specifies a setting area and an initial reference value Rmin, and sets the position of a reference box to the initial position of the setting area. #1 X/Y conversion and boundary processing are performed to an image in the box at a current position and degree of X and Y complexity CX and CY are obtained. When CX+CY is equal to or less than a threshold, the position is skipped and a next processing is performed. When CX+CY is equal to or more than the threshold, a reference value R=CX/CY-1 is obtained and it is substituted by a reference value Rmin in a RAM 8 along with the coordinate position of the box. This processing is repeated and an ideal position with a small reference value R is stored in the RAM 8.

5. 发明专利

JPH04178543A METHOD OF DETECTING VIRTUAL LINE CONNECTING LEADS 失效
公开(公告)号：JPH04178543A
公开(公告)日：1992-06-25
申请号：JP30742690
申请日：1990-11-13
申请人： MATSUSHITA ELECTRIC IND CO LTD
发明人： MATSUZAKI HIROFUMI
IPC分类号： G01N21/88 , G01B11/24 , G01N21/93 , G01N21/956 , G06T1/00 , G06T7/00 , H04N7/18 , H05K3/34 , H05K13/08
摘要： PURPOSE:To improve the inspection accuracy by observing the vicinity of the leading end portions of plural leads extended from one side of a mold body of a chip, and detecting the leading ends of the leads to find a virtual line for connecting the leading end portions. CONSTITUTION:Four leads L1-L4 are extended from one side of a mold body 3. A search area is set in a wide area including the leading end portion of the lead L1. Subsequently, a check area C is set in the inside of the search area S. While the check area C is scanned in the directions of X and Y, an image of the check area C and a master pattern MP are matched to extract a check area Cx having the best matching rate and find the coordinate (x1, y1) of the middle point A1 of the leading end portion of the lead L1. The middle point of each lead is obtained in the same manner. Subsequently, a virtual line K for connecting the middle points to each other is obtained. The shifting of a chip in the directions of X and Y can be obtained by obtaining an angle of the virtual line K to the reference line N.

6. 发明专利

JPH0242344A INSPECTING METHOD FOR SOLDER FILLET 失效
公开(公告)号：JPH0242344A
公开(公告)日：1990-02-13
申请号：JP19405888
申请日：1988-08-03
申请人： MATSUSHITA ELECTRIC IND CO LTD
发明人： MATSUZAKI HIROFUMI
IPC分类号： G01N21/88 , G01N21/956 , H05K3/34
摘要： PURPOSE:To judge whether or not there is a solder fillet by irradiating a check area with light and observing its light reflection characteristics through a camera. CONSTITUTION:An electronic component 1 is an electronic parts with leads L, which extends from both sides of a molding body 6; and the parts is mounted on the cream solder of a substrate 2 and then sent to a soldering device, where the cream solder is heated. Further, the molding body 6 is formed of a raw material with low brightness such as black synthetic resin, but the leads L are made of metallic raw materials with high brightness. Each lead L has a horizontal base end part (a), a bent part (b), a shape-slope slanting part (c), and a tip part (d) to be grounded to the substrate 2. Then, the position where the solder fillet is expected to the formed is irradiated with the light from above and its reflected light is observed through a camera 3 to judge whether or not there is the solder fillet 10.

7. 发明专利

JPH0221246A APPEARANCE INSPECTION FOR ELECTRONIC COMPONENT 失效
公开(公告)号：JPH0221246A
公开(公告)日：1990-01-24
申请号：JP17120988
申请日：1988-07-08
申请人： MATSUSHITA ELECTRIC IND CO LTD
发明人： MATSUZAKI HIROFUMI
IPC分类号： G01N21/88 , G01N21/93 , H05K13/08
摘要： PURPOSE:To detect a positional deviation and a lift of an electronic component simply and accurately by a method wherein a substrate with the electronic component mounted thereon is irradiated with light to create a contrast, bright and dark, on the surface of the electronic component and the surface thereof is observed with cameras. CONSTITUTION:Light source sections and cameras 6-9 are arranged askew at an angle of 45 deg. up in the air and when one light source section 6 is turned ON while the other light source section 8 is turned OFF, the top surface 1a of a substrate 1 and the side 2b of the electronic component 2 on the side of the light source sections 6 becomes fairly dark and an edge line (a) can be detected as position at which brightness changes. So, the number of pixels is detected with the camera 7 to the edge (a) from reference positions (a) and (b) set on a master substrate. Thus, after the end of the observation on the side 2a, the light source 6 is turned OFF. Likewise, distances Y3 and Y4 to a edge line (b) at which the density of light is changed from bright to dark are detected from positions (c) and (d).

8. 发明专利

JPH01265142A DETECTING METHOD FOR ELECTRODE PART OF ELECTRONIC PARTS 失效
公开(公告)号：JPH01265142A
公开(公告)日：1989-10-23
申请号：JP9376188
申请日：1988-04-15
申请人： MATSUSHITA ELECTRIC IND CO LTD
发明人： MATSUZAKI HIROFUMI
IPC分类号： G01N21/88 , H05K13/08
摘要： PURPOSE:To detect an electrode part without being influenced by an external factor by extracting a part having a luminance exceeding an allowance value instead of a luminance of a sample point. CONSTITUTION:A substrate 1 on which electronic parts 5 is mounted is irradiating by illuminating light electrode parts 8, 9 of the electronic parts 5 are detected by a camera 6. In such a case, the electrode parts 8, 9 are formed by a raw material whose luminance is higher than that of printing patterns 10, 11 such as a metal which is brought to solder plating. SP denotes a sample point which is set onto the printing pattern 10, and its luminance is lower than the luminance of the electrode parts 8, 9. Accordingly, even if the luminance of the sample point SP is fluctuated due to deterioration or replacement of a light source, or disturbance light, etc., if only the part having the luminance exceeding an allowance value N is extracted, the electrode parts 8, 9 can be detected.

9. 发明专利

JPH01265105A FORMATION OF MASK PATTERN FOR APPEARANCE INSPECTION FOR ELECTRONIC PARTS 失效
公开(公告)号：JPH01265105A
公开(公告)日：1989-10-23
申请号：JP9375988
申请日：1988-04-15
申请人： MATSUSHITA ELECTRIC IND CO LTD
发明人： MATSUZAKI HIROFUMI
IPC分类号： G01B11/24 , G01N21/88 , G01N21/93 , G06T1/00 , G06T7/00 , H05K13/08
摘要： PURPOSE:To form the mask pattern by detecting an end surface of an electrode of the electronic parts mounted on a master board and then aligning the side of a frame which is possibly mounted with the end surface. CONSTITUTION:The frame A where the rectangular electronic parts 5 is to be mounted is set and a permissible mount frame B is set at its periphery with permissible deviations in an X direction and a Y direction. Then scanning points (I)-(VI) are set in this expected mount frame A and an optical scan is made from segments connecting the scanning points to the permissible mount frame B to detect the end surfaces Pa and Qa of electrode parts P and Q of the electronic parts 5 mounted on a master board 1 from a difference in the brightness of a printed pattern. Then the expected mount frame is moved so as to align the side of the expected mount frame A with the detected end surfaces of the electrode parts.

10. 发明专利

JP2008116526A Device and method for processing microscope image 审中-公开
标题翻译：用于处理微结构图像的装置和方法
公开(公告)号：JP2008116526A
公开(公告)日：2008-05-22
申请号：JP2006297404
申请日：2006-11-01
申请人： Matsushita Electric Ind Co Ltd , 松下電器産業株式会社
发明人： MATSUZAKI HIROFUMI
IPC分类号： G02B7/28 , G02B7/36 , G02B21/26 , G06T5/00
摘要： PROBLEM TO BE SOLVED: To provide a device and a method for processing a microscope image by which a high-contrast and clear image is obtained for a translucent and specimen having some thickness.
SOLUTION: Image data are acquired by imaging the specimen 1, while changing the focal position Z of a camera 13 in the thickness direction of the specimen 1, and the luminance information of each pixel relative to the moving direction of the focal position Z is read. The peaks p
1 and p
2 of a focus coefficient f are detected from the change of the focus coefficient f relative to the moving direction of the focal position Z, and first and second processing object regions R
1 and R
2 are set in the moving region of the focal position Z, based on the detected peaks p
1 and p
2 . Average luminance, concerning each of first and second processing object regions R
1 and R
2 of each pixel, is calculated from the luminance information of each pixel relative to the moving direction of the focal position Z, and the luminance gradation of each pixel is set, based on the difference of the average luminance.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提供一种用于处理显微镜图像的装置和方法，通过该装置和方法获得具有一定厚度的半透明和样品的高对比度和清晰的图像。解决方案：通过在样本1的厚度方向上改变摄像机13的焦点位置Z并且相对于焦点位置的移动方向的每个像素的亮度信息，通过对样本1进行成像而获取图像数据读取Z。从聚焦系数f相对于焦点位置Z的移动方向的变化来检测聚焦系数f的峰p 1 和p 2 ，首先和基于检测到的峰值p 1 ，在焦点位置Z的移动区域中设置第二处理对象区域R 1 和R 2 p 2 。关于每个像素的第一处理对象区域R＆lt; SB＆gt; 1＆lt; SB＆gt;和R＆lt; SB＆gt; 2＆lt; / SB＆gt;中的每一个的平均亮度，是根据每个像素相对于移动方向的亮度信息基于平均亮度的差设定每个像素的焦点位置Z和亮度等级。版权所有（C）2008，JPO＆INPIT

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