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1. 发明专利

JP2012137473A Roughness measuring device 审中-公开
标题翻译：粗糙度测量装置
公开(公告)号：JP2012137473A
公开(公告)日：2012-07-19
申请号：JP2011135315
申请日：2011-06-17
申请人： Kobe Steel Ltd , 株式会社神戸製鋼所
发明人： MANABE CHITAKA , KURIKAWA YU , FUJITA KATSUHIKO
IPC分类号： G01B7/34 , G01N27/72
摘要： PROBLEM TO BE SOLVED: To provide a roughness measuring device capable of measuring roughness of a rough surface having large irregularities in short time without being affected by moisture on the surface to be measured by employing a non-contact and non-optical simple structure.SOLUTION: A roughness measuring device 1a for measuring surface roughness of a measured object 2 comprises: a roughness sensor using a prescribed region on a surface of the measured object 2 as a measurement area for outputting a signal corresponding to surface roughness of the measurement area; and a roughness detection part for outputting a measurement vale of the surface roughness of the measurement area on the basis of the output of the roughness sensor. The roughness measuring device 1a thus constructed can measure the surface roughness of the measured object 2 in a non-contact and non-optical method.
摘要翻译：要解决的问题：提供一种粗糙度测量装置，其能够通过采用非接触和非光学简单的方式在短时间内测量具有大凹凸的粗糙表面的粗糙度而不受待测表面上的水分的影响结构体。＆lt; P＆gt;解决方案：用于测量被测量物体2的表面粗糙度的粗糙度测量装置1a包括：在测量对象2的表面上使用规定区域的粗糙度传感器作为用于输出对应于测量面积; 以及粗糙度检测部，其基于粗糙度传感器的输出输出测量区域的表面粗糙度的测量值。如此构造的粗糙度测量装置1a可以非接触非光学方法测量被测物体2的表面粗糙度。版权所有（C）2012，JPO＆INPIT

2. 发明专利

JP2013036742A Facility monitoring device 审中-公开
标题翻译：设备监控设备
公开(公告)号：JP2013036742A
公开(公告)日：2013-02-21
申请号：JP2011170134
申请日：2011-08-03
申请人： Kobe Steel Ltd , 株式会社神戸製鋼所
发明人： MANABE CHITAKA , MARUYAMA MASAKATSU , KURIKAWA YU
IPC分类号： G01B15/00
摘要： PROBLEM TO BE SOLVED: To provide a facility monitoring device capable of simultaneously performing measurement using a measuring sensor and visual measurement (monitoring) for a monitoring target in a predetermined facility.SOLUTION: The facility monitoring device for observing the monitoring target in a facility E includes: a separator 22 arranged on a common route L of visible light and a microwave to be used for observing the monitoring target and capable of transmitting either one of the visible light and the microwave and reflecting the other to a direction different from the transmission direction; and a microwave detection part 24 arranged in the transmission direction or the reflection direction of the microwave by the separator 22 and capable of detecting a state of the monitoring target based on the microwave.
摘要翻译：要解决的问题：提供能够使用测量传感器同时进行测量的设备监视装置和在预定设施中的监视目标的视觉测量（监视）。解决方案：用于观察设施E中的监视目标的设施监视装置包括：分离器22，布置在可见光的共同路径L和用于观察监视目标的微波中，并且能够发送可见光和微波，并将另一个反射到与传输方向不同的方向; 以及微波检测部24，其通过分离器22布置在微波的传输方向或反射方向上，并且能够基于微波检测监视对象的状态。版权所有（C）2013，JPO＆INPIT

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