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1. 发明专利

JP2003031400A High frequency electron gun 审中-公开
标题翻译：高频电子枪
公开(公告)号：JP2003031400A
公开(公告)日：2003-01-31
申请号：JP2001210415
申请日：2001-07-11
申请人： Kawasaki Heavy Ind Ltd , 川崎重工業株式会社
发明人： ODA FUMIHIKO , YOKOYAMA MINORU
IPC分类号： G21K1/00 , G02F1/03 , H01J37/06 , H01J37/075 , H01S3/30 , H05H7/18
摘要： PROBLEM TO BE SOLVED: To generate uniform electron beams within macro-pulse by offsetting the influence of back bombardment to suppress the change of electron energy with the lapse of time in a hot cathode type high frequency electron gun. SOLUTION: This high frequency electron gun provided with a hot cathode 2 and a high frequency cavity 1, is provided with a laser generating device 14 for generating laser pulse light 4 synchronous with high frequency pulse, and a laser intensity adjusting mechanism 14 for adjusting the intensity of laser pulse light within the duration of the high frequency pulse. The hot cathode 2 is irradiated with the laser pulse light 4 to adjust the amount of electron emission to thereby stabilize the energy of electron beams.
摘要翻译：要解决的问题：通过抵消反向轰击的影响，在宏观脉冲内产生均匀的电子束，以在热阴极型高频电子枪中抑制电子能量随时间的变化。解决方案：设置有热阴极2和高频腔1的高频电子枪设置有用于产生与高频脉冲同步的激光脉冲光4的激光发生装置14和用于调整高频脉冲的激光强度调节机构14 激光脉冲光强度在高频脉冲的持续时间内。用激光脉冲光4照射热阴极2，以调节电子发射量，从而稳定电子束的能量。

2. 发明专利

JP2004294233A X-ray spectral microscopic analyzing method and photoelectric conversion type x-ray microscopic device 有权
公开(公告)号：JP2004294233A
公开(公告)日：2004-10-21
申请号：JP2003086139
申请日：2003-03-26
申请人： Kawasaki Heavy Ind Ltd , 川崎重工業株式会社
发明人： SHINOHARA KUNIO , ITO ATSUSHI , FUJII SADAO , ODA FUMIHIKO , SATO EIJI , NAKAYAMA AKIHIRO
IPC分类号： G01N23/04
摘要： PROBLEM TO BE SOLVED: To provide an X-ray spectral microscopic analyzing method for precisely calculating the compositional distribution of a specimen, especially a physiological specimen constituted of low atomic weight elements.
SOLUTION: A specimen is irradiated with X rays using a photoelectric conversion type X-ray microscopic device while sweeping a wavelength to acquire an X-ray absorbing image at every wavelength and the absorption spectra of the designated part on the specimen at the time of measurement are synthesized to detect elements contained from an absorption terminal structure. A plurality of linear simultaneous equations, which are related to the difference between absorbances at wavelengths on both sides of the absorption terminals of the respective elements detected, the surface densities of the respective elements and the difference between absorption coefficients at respective wavelengths, are solved to calculate the proximity values of the surface densities of the respective elements and residual spectra are formed by subtracting the absorption spectra calculated from the surface density proximity values from absorption spectra at the time of measurement to detect new elements. The same plurality of linear simultaneous equations are formed with respect to all of elements detected and solved. Further, when the new elements can not be detected by calculating the surface density proximity the surface densities of the respective elements are set based on the final surface density proximity values.
COPYRIGHT: (C)2005,JPO&NCIPI

3. 发明专利

JP2003347640A Method and apparatus for varying fel wavelength 有权
标题翻译：改变波形的方法和装置
公开(公告)号：JP2003347640A
公开(公告)日：2003-12-05
申请号：JP2002156432
申请日：2002-05-29
申请人： Kawasaki Heavy Ind Ltd , 川崎重工業株式会社
发明人： YOKOYAMA MINORU , ODA FUMIHIKO
IPC分类号： H05H9/00 , H01S3/30 , H05H13/04
摘要： PROBLEM TO BE SOLVED: To provide a means for varying an FEL wavelength capable of easily selecting any wavelength in an FEL apparatus which employs an unstable electron beam such, for example, as a linac.
SOLUTION: A gap of an undulator 6 is first set to a reference value to position an electron beam at an inlet and an outlet to a predetermined location. Hereby, the intensities of correcting magnets 23, 24, 2, 5, 26 are adjusted for FEL oscillation. Thereafter, the gap of the undulator is changed so as to correspond to a deviation between it and a target FEL wavelength. The FEL wavelength is thus adjusted. Hereupon, the intensities of the correcting magnets 23, 24, 2, 5, 26 are set to values each obtained by adding a value adjusted to actually FEL oscillate to a reference adjusted value for every gap calculated previously.
COPYRIGHT: (C)2004,JPO
摘要翻译：要解决的问题：提供一种用于改变在使用不稳定电子束（例如，直线加速器）的FEL装置中容易选择任何波长的FEL波长的装置。解决方案：首先将波动器6的间隙设置为参考值，以将电子束在入口和出口处定位到预定位置。因此，针对FEL振荡调整校正磁体23,24,2,5,26的强度。此后，改变波动器的间隙以便对应于其与目标FEL波长之间的偏差。因此调整FEL波长。因此，校正磁体23,24,2,5,26的强度被设定为通过将针对实际FEL振荡调整的值与针对先前计算出的每个间隙的参考调整值相加而获得的值。版权所有（C）2004，JPO

4. 发明专利

JP2004347463A Imaging type x-ray microscope 审中-公开
标题翻译：成像型X射线显微镜
公开(公告)号：JP2004347463A
公开(公告)日：2004-12-09
申请号：JP2003145028
申请日：2003-05-22
申请人： Kawasaki Heavy Ind Ltd , 川崎重工業株式会社
发明人： FUJII SADAO , ODA FUMIHIKO , SATO EIJI , NAKAYAMA AKIHIRO
IPC分类号： G21K7/00 , G01T1/00 , H01J31/50 , H01J37/14
摘要： PROBLEM TO BE SOLVED: To provide an X-ray microscope having high resolution and no saturated phenomenon.
SOLUTION: This X-ray microscope is equipped with an X-ray generation part for generating a laser plasma X-ray by introducing incident laser light to an X-ray target 105, a sample holder 107 for supporting a sample on the irradiation position of the X-ray, and an X-ray objective lens optical system 109 for enlarging the X-ray transmitted through the sample and imaging on a photoelectric conversion face 113. In the microscope, an electro-optical system for enlarging an electronic image generated on the photoelectric conversion face 113 is provided on the opposite side of the X-ray objective lens optical system across the photoelectric conversion face, and the X-ray generation part, the sample holder and the X-ray objective lens optical system are stored in one vacuum container 125, and an X-ray image is converted into the electronic image by the photoelectric conversion face 113, enlarged electro-optically, imaged and observed through an imaging element 121.
COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：提供具有高分辨率和没有饱和现象的X射线显微镜。解决方案：该X射线显微镜配备有用于通过将入射激光引入X射线靶105来产生激光等离子体X射线的X射线产生部，用于将样品支撑在X射线靶105上的样品架107。 X射线照射位置，X射线物镜光学系统109，用于放大通过样品透射的X射线，并在光电转换面113上成像。在显微镜中，用于放大电子学的电光学系统在光电转换面上的X射线物镜光学系统的相反侧设置有在光电转换面113上产生的图像，X射线产生部，样本保持部和X射线物镜光学系统存储在一个真空容器125中，并且通过光电转换面113将X射线图像转换成电子图像，通过成像元件121进行电光学，成像和观察。版权所有（C）2005， JPO＆ NCIPI

5. 发明专利

JP2003031883A Resonator system aligning apparatus and resonator chamber 有权
标题翻译：谐振器系统对准装置和谐振器室
公开(公告)号：JP2003031883A
公开(公告)日：2003-01-31
申请号：JP2001210414
申请日：2001-07-11
申请人： Kawasaki Heavy Ind Ltd , 川崎重工業株式会社
发明人： YOKOYAMA MINORU , ODA FUMIHIKO
IPC分类号： H01S3/30 , H01S3/086
摘要： PROBLEM TO BE SOLVED: To provide a resonator system aligning apparatus capable of efficiently aligning a free electron laser generator resonator system and supplying a probe laser for guiding so as to be coincident with a laser beam axis for a free electron laser out of a visible region. SOLUTION: The resonator system aligning apparatus comprises a transit 10 provided out of the resonator system with a pair of resonator mirrors 4, 6 respectively housed in resonator chambers 2, 3 via an inserting light source 1 as an object, and view ports 21, 22, 31 provided in the chambers 2, 3 to see through the mirrors 4, 5 and a reflecting mirror 5 for the probe laser from the transit. Thus, the mirrors or the like can be directly observed without depending upon marks attached to the surfaces of the chambers 2, 3 to regulate a positional attitude.
摘要翻译：要解决的问题：提供一种谐振器系统对准装置，其能够有效地对准自由电子激光发生器谐振器系统并且提供用于引导的探针激光器，以便与可见区域中的自由电子激光器的激光束轴一致。解决方案：谐振器系统对准装置包括通过作为对象的插入光源1分别容纳在谐振器腔室2,3中的一对谐振器反射镜4,6，并且从谐振器系统中提供的通路10和观察端口21,22 ，31设置在腔室2,3中以透视镜4,5以及用于探针激光器从运输的反射镜5。因此，可以不依赖于附接到室2,3的表面的标记直接观察镜子等，以调节位置姿态。

6. 发明专利

JP2003038475A X-ray diagnostic device and x-ray theraputic device 审中-公开
标题翻译： X射线诊断装置和X射线治疗装置
公开(公告)号：JP2003038475A
公开(公告)日：2003-02-12
申请号：JP2001233772
申请日：2001-08-01
申请人： Kawasaki Heavy Ind Ltd , 川崎重工業株式会社
发明人： YOKOYAMA MINORU , IWATA AKIRA , KAWAI TSUTOMU , OKU YASUNARI , MIURA HIDENORI , KURODA MASANORI , ODA FUMIHIKO , SOBASHIMA MASAO
IPC分类号： A61N5/10 , A61B6/00
摘要： PROBLEM TO BE SOLVED: To provide a safe X-ray theraputic and diagnostic device capable of detecting and treating even a small affected part, which is economically reduced in size as it can be set even in a hospital.
SOLUTION: In this X-ray diagnostic device, an X-ray shielding metal complex taken by a subject 7 is selectively accumulated in the affected part, and X-ray from X-ray generators 1 and 2 are radiated thereto to form the X-ray image of the affected part in a radiographic device 6. A metal target 3 for generating a characteristic X-ray belonging to an energy range such that the SN ratio of the X-rays reaching the radiographic device 6 is about 50 or more, the contrast of the X-ray transmitted by the metal complex accumulated in the affected part and the subject 7 is about 2% or more, and the X-ray energy is 40 keV or more is used, and the characteristic X-ray generated by colliding the electron beam generated in an electron generator 1 and accelerated by an electron accelerator 2 to the metal target 3 is used as irradiating X-ray.
COPYRIGHT: (C)2003,JPO
摘要翻译：要解决的问题：提供一种安全的X射线治疗和诊断装置，能够检测和治疗即使在医院也可以设置的小的受影响部位，经济地减小。解决方案：在该X射线诊断装置中，被检体7拍摄的X射线屏蔽金属复合体被选择性地积聚在患部，X射线发生器1和2的X射线照射到X射线诊断装置，射线照相设备中的受影响部分的射线图像6.用于产生属于能量范围的特征X射线的金属靶3，使得到达射线照相装置6的X射线的SN比为约50以上，由累积在受影响部位的金属络合物所发射的X射线的对比度为约2％以上，X射线能量为40keV以上，通过碰撞产生的特征X射线在电子发生器1中产生并被电子加速器2加速到金属靶3的电子束被用作照射X射线。

7. 发明专利

JP2004354356A Laser plasma x-ray microscope 有权
公开(公告)号：JP2004354356A
公开(公告)日：2004-12-16
申请号：JP2003155810
申请日：2003-05-30
申请人： Kawasaki Heavy Ind Ltd , 川崎重工業株式会社
发明人： NAKAYAMA AKIHIRO , ODA FUMIHIKO , SATO EIJI , FUJII SADAO
IPC分类号： G21K7/00 , H01J31/50
摘要： PROBLEM TO BE SOLVED: To supply a sufficient current onto a photoelectric transfer face and to restrain a voltage drop to observe a living organism under a living condition, when irradiated with a nano-second order of very strong short pulse X-ray.
SOLUTION: A charge for replenishing a photoelectron emitted from a photoelectric transfer membrane 4 is supplied by connecting an electric circuit such as a capacitor 7 to a photoelectric transfer plate 1, and by moderating the voltage drop in the photoelectric transfer plate 1, so as to provide an electron image reflected accurately with an X-ray transmission image.
COPYRIGHT: (C)2005,JPO&NCIPI

8. 发明专利

JP2004101185A Image regulating apparatus and image regulating method of x-ray microscope 有权
公开(公告)号：JP2004101185A
公开(公告)日：2004-04-02
申请号：JP2002259031
申请日：2002-09-04
申请人： Kawasaki Heavy Ind Ltd , 川崎重工業株式会社
发明人： ODA FUMIHIKO , SATO EIJI , FUJII SADAO
IPC分类号： G21K7/00 , G01T1/00 , G01T1/28 , G01T7/00 , G21K1/00 , G21K5/04 , H01J37/06 , H01J37/20 , H01J37/21
摘要： PROBLEM TO BE SOLVED: To provide a method and an apparatus for simply performing image regulation of an electronic imaging system in an X-ray microscope to perform photoelectric conversion of a transmitted image generated by allowing X-ray to be incident on a sample by a photoelectric conversion surface and imaging it by the electronic imaging system as an electron image.
SOLUTION: A standard sample 2 is disposed at a sample position before a photoelectric conversion surface, and an electron generator 10 is disposed at the position in which the standard sample is irradiated with output beams. Image regulation of an electronic imaging system 4 is performed by using an electron image which is rapidly obtained in an imaging surface 5 by irradiating a large amount of electron beams 16 radiated from the electron generator 10 on the standard sample 2.
COPYRIGHT: (C)2004,JPO

9. 发明专利

JP2001091690A RADIATION SHIELD FACILITY 失效
公开(公告)号：JP2001091690A
公开(公告)日：2001-04-06
申请号：JP27133499
申请日：1999-09-24
申请人： KAWASAKI HEAVY IND LTD
发明人： YOKOYAMA MINORU , ODA FUMIHIKO
IPC分类号： G21F3/00
摘要： PROBLEM TO BE SOLVED: To provide a radiation shield facility allowing reduction of a radiation stream, especially a neutron duct stream, in a duct penetrating a radiation shield wall. SOLUTION: In this radiation shield facility, a thickness necessary for radiation shield in a part of a radiation shield wall 2 provided in a radiation generator chamber 3 is divided into plural thicknesses to form middle chambers 5, a pit 4 communicating the inside of the radiation generator chamber 3 with the outside thereof is provided such that the pit 4 passes the middle chambers 5 and is parallel to wall faces in the middle chambers 5 by bending the pit 4 plural times, and a duct is stored in the pit 4.

10. 发明专利

JPH11235477A LIGHT OUTPUT DEVICE 失效
公开(公告)号：JPH11235477A
公开(公告)日：1999-08-31
申请号：JP5625498
申请日：1998-02-20
申请人： KAWASAKI HEAVY IND LTD
发明人： YOKOYAMA MINORU , ODA FUMIHIKO , IWATA AKIRA
IPC分类号： A63J5/00 , A63H33/22 , A63J99/00 , A63J23/00
摘要： PROBLEM TO BE SOLVED: To provide a light output device which makes an observer feel a deep interest by a method wherein the characteristics of a sound signal which is actually obtained, are converted into characteristics of light, and especially, a factor which changes the wavelength of light conforming to a music or the like is added. SOLUTION: The sound wave frequency of a sound signal, the light frequency and the light intensity of a light output based on the sound wave strength, or a corresponding relationship with a radiation location are determined in advance, and a sound signal is obtained by a CD player and a microphone, and the frequency and the intensity are analyzed by a real time, and light having a light frequency and an intensity corresponding with the frequency and the intensity or a radiation location, is generated. As a light output method, a computer display and a laser projecting device can be used, and especially when a free electronic laser device is used, a free light motion conforming to a sound can be obtained.

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