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    • 2. 发明专利
    • Complex probe device for electromagnetic field evaluation
    • 用于电磁场评估的复杂探针装置
    • JP2005291848A
    • 2005-10-20
    • JP2004105555
    • 2004-03-31
    • Kagoshima Prefecture鹿児島県
    • BIZEN HIROSHIUEZONO TAKESHINAGAYOSHI HIROMI
    • G01R29/08
    • PROBLEM TO BE SOLVED: To provide a complex probe device for electromagnetic field evaluation for specifying a spot easily influenced by an external electromagnetic wave efficiently with high resolution, capable of switching accurately and quickly a domain to which an electromagnetic wave is applied, on an electronic circuit board of electronic equipment mounted highly densely.
      SOLUTION: Each frame-shaped loop coil 11, 12, 13 having a different size is disposed on the same support 14, to thereby form a loop antenna 1, and the loop opening face of the loop antenna 1 is faced to the electronic circuit board 100, and a specific electromagnetic wave sensitive spot easily influenced by the external electromagnetic wave is detected and evaluated. Hereby, when detecting by switching from an optional frame-shaped loop coil to a smaller frame-shaped loop coil, positioning of the smaller frame-shaped loop coil can be performed accurately and quickly, and a specific electromagnetic wave sensitive spot can be narrowed efficiently, and EMC evaluation can be executed surely and smoothly.
      COPYRIGHT: (C)2006,JPO&NCIPI
    • 要解决的问题:为了提供用于以高分辨率有效地指定容易受到外部电磁波影响的点的电磁场评估的复杂探测装置,能够精确而快速地切换施加电磁波的区域, 在电子设备的电子电路板上高密度地安装。 解决方案:具有不同尺寸的每个框状环形线圈11,12,13设置在相同的支撑件14上,从而形成环形天线1,环形天线1的环形开口面面向 电子电路板100和容易受外部电磁波影响的特定电磁波敏感点被检测和评估。 因此,当通过从可选的框状环形线圈切换到较小的框状环形线圈进行检测时,可以准确而快速地进行较小的框状环形线圈的定位,并且可以有效地缩小特定的电磁波感应点 ,可以顺利执行EMC评估。 版权所有(C)2006,JPO&NCIPI