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1. 发明专利

JP2014202525A 超音波探傷方法および超音波探傷装置有权
标题翻译：超声波检测方法和超声波检测装置
公开(公告)号：JP2014202525A
公开(公告)日：2014-10-27
申请号：JP2013076943
申请日：2013-04-02
申请人： Jfeスチール株式会社 , Jfe Steel Corp
发明人： OZEKI TAKAFUMI , YOTSUTSUJI JUNICHI , TAKADA HIDEKI , TOMURA YASUO
IPC分类号： G01N29/04
摘要：【課題】境界エコーの形状が変化しても、未探傷領域を最小限にしつつも誤検出が発生しない超音波探傷方法を提供すること。【解決手段】本発明にかかる超音波探傷方法は、正側および負側の境界エコー検出閾値を設定する条件設定ステップと、探傷信号を取得する探傷信号取得ステップと、探傷信号の正側および負側の境界エコー検出時刻を検出する境界エコー検出ステップと、正側および負側の境界エコー検出時刻のうち何れかを基準時刻として選択する基準時刻選択ステップと、基準時刻から所定時間を減算することによりきずエコー検出ゲートの終点を設定するきずエコー検出ゲート設定ステップと、きずエコー検出ゲート内の探傷信号の振幅を用いてきずエコーの検出を行うきずエコー検出ステップとを含むことを特徴とする。【選択図】図6
摘要翻译：要解决的问题：提供一种超声波探伤方法，即使当边界回波的形状发生变化时也不会使非检测缺陷区域最小化而不会产生错误检测。解决方案：超声波探伤方法包括：条件设定在正侧和负侧设置边界回波检测阈值的步骤; 缺陷检测信号获取步骤，获取探伤信号; 边界回波检测步骤，检测所述探伤信号的正侧和负侧的边界回波检测时间; 在正侧和负侧的边界回波检测时间之中选择任何时间作为参考时间的参考时间选择步骤; 缺陷回波检测门设定步骤，通过从基准时间减去预定时间来设定缺陷回波检测门限的终点; 以及缺陷回波检测步骤，使用所述缺陷回波检测门内的所述缺陷检测信号的振幅来执行所述缺陷回波的检测。

2. 发明专利

JP2013250183A Temperature measurement system and temperature measurement method 审中-公开
标题翻译：温度测量系统和温度测量方法
公开(公告)号：JP2013250183A
公开(公告)日：2013-12-12
申请号：JP2012125821
申请日：2012-06-01
申请人： Jfe Steel Corp , Jfeスチール株式会社 , Chino Corp , 株式会社チノー
发明人： TAKADA HIDEKI , YUZAWA HIDEYUKI , NAKAZAWA SOTARO , TONEGAWA KENJI
IPC分类号： G01J5/10
摘要： PROBLEM TO BE SOLVED: To measure a temperature range that an object to be measured possibly has by one scanning type radiation thermometer.SOLUTION: A temperature measurement system 8a is constituted by connecting a host computer 9a and a scanning type radiation thermometer 1a. After last-time temperature measurement processing and before next-time temperature measurement processing, a measurement range determination processing part 91a of the host computer 9a determines a measurement range of the scanning type radiation thermometer 1a in the next-time temperature processing as a next-time applied measurement range according to a type of an object (steel material) to be measured in the next temperature measurement processing, and notifies the scanning type radiation thermometer 1a of the determined next-time applied measurement range. A thermometer measurement part 3a of the scanning type radiation thermometer 1a performs the next-time temperature measurement processing based upon the measurement range of the scanning type radiation thermometer 1a as the next-time applied measurement range, and measures the temperature of the object to be measured.
摘要翻译：要解决的问题：通过一台扫描型辐射温度计测量被测物体可能具有的温度范围。解决方案：温度测量系统8a通过连接主计算机9a和扫描型辐射温度计1a构成。在上一次温度测量处理之后和下一次温度测量处理之前，主计算机9a的测量范围确定处理部分91a将下一次温度处理中的扫描型辐射温度计1a的测量范围确定为下一次温度测量处理，根据在下一个温度测量处理中要测量的物体（钢材）的类型来测量时间施加的测量范围，并将扫描型辐射温度计1a通知确定的下次施加的测量范围。扫描型辐射温度计1a的温度计测量部分3a基于扫描型辐射温度计1a的测量范围作为下次施加的测量范围进行下一次温度测量处理，并且测量对象的温度测量。

3. 发明专利

JP2013134136A Surface defect inspection system 审中-公开
标题翻译：表面缺陷检查系统
公开(公告)号：JP2013134136A
公开(公告)日：2013-07-08
申请号：JP2011284405
申请日：2011-12-26
申请人： Jfe Steel Corp , Jfeスチール株式会社
发明人： ITO KOJI , HOTTA EISUKE , WATANABE KOSUKE , TAKADA HIDEKI
IPC分类号： G01N21/892 , G01B11/30
摘要： PROBLEM TO BE SOLVED: To provide a surface defect inspection system capable of suppressing excessive detection, reliably detecting a surface defect in an inspected material, and then preventing the unintended outflow of the surface defect.SOLUTION: A surface defect inspection system 1 related to one embodiment of the present invention includes defect detection parts 2, 4. The defect detection part 2 detects a surface defect in an inspected material on the basis of reflection light from the inspected material that is obtained by irradiating the inspected material being conveyed with light. The defect detection part 4 detects a surface defect in the inspected material on the basis of reflection light from the inspected material that is obtained by irradiating the inspected material after detected by the defect detection part 2 with light different from that of the defect detection part 2.
摘要翻译：要解决的问题：提供一种能够抑制过度检测的表面缺陷检查系统，可靠地检测检查材料中的表面缺陷，然后防止表面缺陷的意外流出。解决方案：与一个表面缺陷检查系统1相关本发明的实施例包括缺陷检测部分2,4。缺陷检测部分2基于来自被检查材料的反射光检测被检查材料中的表面缺陷，该被检查材料是通过用光照射被检查材料而获得的。缺陷检测部4基于来自被检查材料的反射光检测被检查材料中的表面缺陷，该反射光通过利用与缺陷检测部2的光不同的光通过用缺陷检测部2检测到的被检查材料进行照射而获得。

4. 发明专利

JP2013022598A Abnormality diagnostic method and abnormality diagnostic device of lap seam welder 审中-公开
标题翻译：拉伸焊接机异常诊断方法及异常诊断装置
公开(公告)号：JP2013022598A
公开(公告)日：2013-02-04
申请号：JP2011157034
申请日：2011-07-15
申请人： Jfe Steel Corp , Jfeスチール株式会社
发明人： YUZAWA HIDEYUKI , TAKADA HIDEKI , SUZUKI KEIJI , SASAKI AKIHIRO
IPC分类号： B23K11/24 , B23K11/06 , G01J5/00
摘要： PROBLEM TO BE SOLVED: To accurately detect abnormality of an electrode ring.SOLUTION: An abnormality diagnostic device 12 utilizes a thermometer 10 to measure the temperature distribution of a welding part in a welding width direction along the width direction of a steel plate. The abnormality diagnostic device 12 utilizes an electrode ring rotating position detection sensor 11 to measure the rotating position of the electrode ring when the temperature distribution of the welding part is measured. The abnormality diagnostic device 12 detects the abnormality of the electrode ring on the basis of the temperature distribution of the welding part in the welding width direction and the rotating position of the electrode ring, which are measured. Also, the abnormality diagnostic device 12 detects attaching position abnormality of the electrode ring on the basis of the highest temperature of the temperature distribution of the welding part and a welding width direction position at which the temperature of the welding part becomes a highest temperature. Thus, the abnormality of the electrode ring is accurately detected.
摘要翻译：要解决的问题：准确地检测电极环的异常。解决方案：异常诊断装置12利用温度计10来测量焊接部件沿着钢板的宽度方向的焊接宽度方向的温度分布。当测量焊接部件的温度分布时，异常诊断装置12利用电极环旋转位置检测传感器11来测量电极环的旋转位置。异常诊断装置12基于焊接部的焊接宽度方向的温度分布和电极环的旋转位置来检测电极环的异常。此外，异常诊断装置12基于焊接部的温度分布的最高温度和焊接部的温度成为最高温度的焊接宽度方向位置来检测电极环的安装位置异常。因此，电极环的异常被精确地检测。版权所有（C）2013，JPO＆INPIT

5. 发明专利

JP2014181950A Ultrasonic flaw detection apparatus and ultrasonic flaw detection method 有权
标题翻译：超声波检测装置和超声波检测方法
公开(公告)号：JP2014181950A
公开(公告)日：2014-09-29
申请号：JP2013055312
申请日：2013-03-18
申请人： Jfe Steel Corp , Jfeスチール株式会社
发明人： TAKADA HIDEKI , OZEKI TAKAFUMI , TOMURA YASUO
IPC分类号： G01N29/04 , G01N29/30
摘要： PROBLEM TO BE SOLVED: To provide an ultrasonic flaw detection apparatus and an ultrasonic flaw detection method capable of improving flaw detection performance without exerting an adverse effect to production and increasing cost and allowed to be updated to a level-up signal processing system.SOLUTION: In an ultrasonic flaw detection apparatus installed in a continuous line for continuously conveying products to inspect internal defects in each product, a signal processing part can operate in parallel existing signal processing based on an existing signal processing system for a flaw detection signal outputted from a detection part and level-up signal processing based on a new signal processing system whose flaw detection performance is leveled up, and a setting part sets gain values of respective signal processing which are determined by executing calibration processing for matching an output in the existing signal processing with an output in the level-up signal processing.
摘要翻译：要解决的问题：提供一种能够提高缺陷检测性能的超声波探伤装置和超声波探伤方法，而不会对生产产生不利影响并增加成本并允许更新到升高信号处理系统。解决方案：在安装在连续输送产品以检查每个产品中的内部缺陷的连续线中的超声波探伤仪中，信号处理部分可以基于用于从检测器输出的缺陷检测信号的现有信号处理系统并行存在的信号处理基于新的信号处理系统的部分和平面信号处理，其缺陷检测性能被调高，并且设置部分设置通过执行用于使现有信号处理中的输出匹配的校准处理确定的各个信号处理的增益值与电平信号处理中的输出。

6. 发明专利

JP2013022597A Welding quality determination method and welding quality determination device of lap seam welding part 审中-公开
标题翻译：焊接质量测定方法和焊缝质量测定装置
公开(公告)号：JP2013022597A
公开(公告)日：2013-02-04
申请号：JP2011157033
申请日：2011-07-15
申请人： Jfe Steel Corp , Jfeスチール株式会社
发明人： YUZAWA HIDEYUKI , TAKADA HIDEKI , SUZUKI KEIJI , SASAKI AKIHIRO
IPC分类号： B23K11/24 , B23K11/06 , G01J5/10 , G01N25/72
摘要： PROBLEM TO BE SOLVED: To accurately determine the quality of a welding part.SOLUTION: A welding quality determination device 12 calculates the area of the temperature distribution of a welding part, and calculates the ratio of the calculated area and the area of the temperature distribution of the welding part at normal time. The welding quality determination device 12 calculates a welding width direction position at which the temperature of the welding part becomes highest from the temperature distribution of the welding part, and calculates a difference value between the calculated welding width direction position and the welding width direction position, which is calculated from the temperature distribution of the welding part at normal time and at which the temperature of the welding part becomes the highest. The welding quality determination device 12 determines the quality of the welding part on the basis of the calculated ratio and difference value. Thus, the quality of the welding part is accurately determined.
摘要翻译：要解决的问题：准确地确定焊接部件的质量。解决方案：焊接质量确定装置12计算焊接部件的温度分布的面积，并且计算正常时的计算面积和焊接部件的温度分布面积的比率。焊接质量判定装置12根据焊接部的温度分布来计算焊接部的温度变得最高的焊接宽度方向位置，并计算出计算出的焊接宽度方向位置与焊接宽度方向位置之间的差值，这是根据焊接部分在正常时间的温度分布和焊接部件的温度变得最高的温度分布计算的。焊接质量确定装置12基于计算的比率和差值来确定焊接部件的质量。因此，准确地确定焊接部件的质量。版权所有（C）2013，JPO＆INPIT

7. 发明专利

JP2012173045A Evaluation apparatus for surface checkup apparatuses and evaluation method for surface checkup apparatuses 有权
标题翻译：表面检查装置的评价装置和表面检查装置的评价方法
公开(公告)号：JP2012173045A
公开(公告)日：2012-09-10
申请号：JP2011033349
申请日：2011-02-18
申请人： Jfe Steel Corp , Jfeスチール株式会社
发明人： TAKADA HIDEKI , TOMURA YASUO , OKUNO MAKOTO , HIROTA AKIHITO
IPC分类号： G01N21/93 , G01N21/892
摘要： PROBLEM TO BE SOLVED: To provide an evaluation apparatus for surface checkup apparatuses and an evaluation method for surface checkup apparatuses that can reliably evaluate performances of surface checkup apparatuses for checking minute surface defects to make possible appropriate calibration.SOLUTION: A calibration device 30 retreats a ring illumination 11 and a camera 13 of a surface checkup apparatus 10 with their relative positional relationship at the time of checkup maintained as it is to separate them from a checkup face 1a, where a calibration plate 40 is arranged. In this process, the distance from the calibration plate 40 to the ring illumination 11 is kept equal to that from the checkup face 1a to the ring illumination 11. Further, a hole 41 of a level equivalent to minute surface defects of a checkup object is formed in advance in the calibration plate 40. In this state, a surface image of the calibration plate 40 is shot with the camera 13 and the image is processed in the same way as at the time of checkup to ascertain whether or not the hole 41 of the calibration plate 40 is appropriately checked thereby to evaluate the checkup performance of the surface checkup apparatus 10.
摘要翻译：要解决的问题：提供一种能够可靠地评价表面检查装置的检查微小表面缺陷的性能的表面检查装置的评价装置和表面检查装置的评价方法，以进行适当的校准。
解决方案：校准装置30将检查保持时的相对位置关系的表面检查装置10的环形照明11和照相机13从检查面1a分离，校准面设置板40。在该过程中，校准板40到环形照明11的距离保持与从校验面1a到环形照明11的距离相等。此外，与校验对象的微小表面缺陷相当的等级的孔41是在该状态下，用相机13拍摄校准板40的表面图像，并且以与检查时相同的方式处理图像，以确定孔41是否适当地检查校准板40，从而评价表面检查装置10的检查性能。版权所有：（C）2012，JPO＆INPIT

8. 发明专利

JP2011209274A Surface inspecting device 有权
标题翻译：表面检测装置
公开(公告)号：JP2011209274A
公开(公告)日：2011-10-20
申请号：JP2011032135
申请日：2011-02-17
申请人： Jfe Steel Corp , Jfeスチール株式会社
发明人： OKUNO MAKOTO , MURATA SAIICHI , TAKADA HIDEKI
IPC分类号： G01N21/84 , G01N21/892
CPC分类号： G01N21/892 , G01N21/8806
摘要： PROBLEM TO BE SOLVED: To enable precise detection of a micropunctate flaw.SOLUTION: A surface inspecting device includes an annular lighting device 3 containing an annular light emitter 3A and a light shielding plate 3B between the light emitter 3A and a steel plate 2 concentrically circular with the light emitter 3A, having an optical opening with a diameter smaller than the internal diameter of the light emitter 3A, and an imaging section 4 arranged on the center line C of the opening of the light shielding plate 3B, to image the surface of the steel plate 2 through the opening, in which the imaging region A to be imaged by the imaging section 4 on the surface of the steel plate 2 is irradiated with only beams diffracted by the edge of the opening of the shielding plate 3B among beams irradiated from the light emitter 3A, and the distance H between the light emitter 3A and the surface of the steel plate 2 is set so that the average brightness level on the imaging region A is a predetermined level or higher, and that each brightness level difference on the imaging region A is within a predetermined range.
摘要翻译：要解决的问题：能够精确地检测微裂纹缺陷。解决方案：表面检查装置包括环形照明装置3，其在发光体3A和钢板2之间包含环形光发射体3A和遮光板3B，同心圆光发射体3A具有直径小于发光体3A的内径的光学开口，以及配置在遮光板3B的开口部的中心线C上的摄像部4，通过开口的钢板2，其中由成像部分4在钢板2的表面上成像的成像区域A仅被辐照的光束照射到由屏蔽板3B的开口的边缘衍射的光束并且将发光体3A与钢板2的表面之间的距离H设定为使得成像区域A上的平均亮度水平为预定值成像区域A中的每个亮度水平差在预定范围内。

9. 发明专利

JP2013040906A Scanning type radiation thermometer 有权
标题翻译：扫描式辐射温度计
公开(公告)号：JP2013040906A
公开(公告)日：2013-02-28
申请号：JP2011179783
申请日：2011-08-19
申请人： Jfe Steel Corp , Jfeスチール株式会社 , Chino Corp , 株式会社チノー
发明人： TAKADA HIDEKI , YUZAWA HIDEYUKI , SUZUKI KEIJI , WATANABE KOSUKE , SASAKI AKIHIRO , NAKAZAWA SOTARO , TONEGAWA KENJI
IPC分类号： G01J5/08 , G01J5/48
摘要： PROBLEM TO BE SOLVED: To install a scanning type radiation thermometer near a measuring object in a state without obstructing a measurement view even in a manufacturing line where apparatuses are closely placed, and measure a temperature profile of the measuring object necessary for determining propriety of the manufacturing line.SOLUTION: A scanning type radiation thermometer 1 according to one embodiment of the present invention that measures a temperature profile of a measuring object in a non-contact manner, includes a light receiving part 2, a light transmission part 3, and a detector 4. The light receiving part 2 has a small-diameter cylindrical body, and divides infrared light radiated from the measuring object for every temperature measurement point and focuses it. The transmission part 3 bundles and stores a plurality of optical fiber groups corresponding to each of the plurality of temperature measurement points on one-to-one basis and transmits the infrared light for every temperature measurement point. The detection part 4 has sensitivity in an infrared light area, receives the infrared light in a plurality of pixels that correspond to each of the plurality of optical fiber groups in the transmission part 3 on one-to-one basis, and detects the intensity of the infrared light for every temperature measuring point.
摘要翻译：要解决的问题：即使在设备紧密放置的生产线中，即使在不阻碍测量视图的状态下将扫描型辐射温度计安装在测量对象附近，并且测量测量所需的测量对象的温度分布生产线的合适性。解决方案：根据本发明的一个实施例的以非接触方式测量测量对象的温度分布的扫描型辐射温度计1包括光接收部分2，光透射部分3和光接收部分2具有小直径的圆柱体，并且对于每个温度测量点分割从测量对象辐射的红外光并对其进行聚焦。发送部分3将对应于多个温度测量点中的每一个的多个光纤组按一对一的方式捆绑并存储，并且传送每个温度测量点的红外光。检测部分4在红外光区域具有灵敏度，一对一地接收与发送部分3中的多个光纤组中的每一个对应的多个像素中的红外光，并且检测每个温度测量点的红外线灯。版权所有（C）2013，JPO＆INPIT

10. 发明专利

JP2012103017A Dross defect inspection device and dross defect inspection method of molten metal plating steel plate 有权
标题翻译：轧制缺陷检查装置和金属镀层钢板的缺陷检查方法
公开(公告)号：JP2012103017A
公开(公告)日：2012-05-31
申请号：JP2010249195
申请日：2010-11-05
申请人： Jfe Steel Corp , Jfeスチール株式会社
发明人： OKUNO MAKOTO , TAKADA HIDEKI , KUNIMORI HIROMI
IPC分类号： G01N21/892 , C23C2/00
摘要： PROBLEM TO BE SOLVED: To provide an inspection device which can stably inspect a dross defect of a molten metal plating steel plate by being separated from formation noise and a slight defect.SOLUTION: A dross defect inspection device has defect determination means (defect determination device 18) for classifying extracted defects into a dross defect and other defects, in which an incident angle of light to be emitted from illumination means (floodlight 12) to the surface of a steel plate 1 is set to an angle between 50° and 80° to the normal direction of the steel plate 1, imaging means (imaging unit 14) is arranged on the same side as that of the illumination means (12) to a normal of the steel plate 1, and a light receiving angle of light to be received by the imaging means (14) is set to an angle between 0° and 40° to the normal direction of the steel plate 1. It is preferable that the defect determination means (18) determines the extracted defects into the dross defect and other defects based on at least one of area of the defects, image luminance of the defects, and forms of the defects.
摘要翻译：要解决的问题：提供一种检查装置，其能够通过与地层噪声和轻微缺陷分离来稳定地检查熔融金属电镀钢板的浮渣缺陷。解决方案：浮渣缺陷检查装置具有用于将提取的缺陷分类为浮渣缺陷的缺陷确定装置（缺陷确定装置18）以及从照明装置（泛光灯12）发射的光的入射角到钢板1的表面被设定为与钢板1的法线方向成50°至80°的角度，成像装置（成像单元14）被布置在与照明装置（12）相同的一侧，并且由成像装置（14）接收的光的受光角度被设定为与钢板1的法线方向成0°至40°的角度。优选地，缺陷确定装置（18）基于缺陷的区域，缺陷的图像亮度和缺陷的形式中的至少一个，将提取的缺陷确定为浮渣缺陷和其他缺陷。版权所有（C）2012，JPO＆INPIT

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