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    • 1. 发明专利
    • Fluorescence microscope device
    • 荧光显微镜装置
    • JP2011180570A
    • 2011-09-15
    • JP2010109527
    • 2010-05-11
    • Jeol LtdKyoto Univ国立大学法人京都大学日本電子株式会社
    • SHIRAKAWA MASAHIROHARADA YOSHISHIGEYOKOTA HIROAKIYOSHINARI YOSUKETSUJI SEIGO
    • G02B21/06G01N21/64
    • PROBLEM TO BE SOLVED: To provide a fluorescence microscope device achieving selective visual field-observation of aimed fluorescence.
      SOLUTION: The fluorescence microscope device includes: an optical microscope 3 which irradiates a sample 16 including a phosphor 1 whose fluorescence intensity is varied by magnetic resonance with exciting light to observe the fluorescence of the phosphor 1; a high-frequency magnetic field generation part 5 which irradiates the sample 16 with high-frequency magnetic field for generating electron spin magnetic resonance; a modulation part 7 which generates a modulation signal for modulating the high-frequency magnetic field; a detector 9 which detects light intensity on a surface of the sample observed by the optical microscope 3 in each of a plurality of pixels at each sampling time while modulating the high-frequency magnetic field; and a processing unit 10 which extracts an object pixel in which time-sequential variation of the light intensity correlates with the modulation signal from the plurality of pixels.
      COPYRIGHT: (C)2011,JPO&INPIT
    • 要解决的问题:提供实现目标荧光的选择性视场观察的荧光显微镜装置。 解决方案:荧光显微镜装置包括:光学显微镜3,其照射包括荧光体1的样品16,荧光体1的荧光强度通过磁共振用激发光改变以观察荧光体1的荧光; 用于产生电子自旋磁共振的高频磁场照射样本16的高频磁场产生部分5; 生成用于调制高频磁场的调制信号的调制部7; 检测器9,其在调制高频磁场的同时,在每个采样时间检测由多个像素中的每个中的光学显微镜3观察到的样品的表面上的光强度; 以及处理单元10,其提取其中光强度的时间顺序变化与来自多个像素的调制信号相关的对象像素。 版权所有(C)2011,JPO&INPIT