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1. 发明专利

JP2009070604A Sample support stage for observing three-dimensional structure, protractor and three-dimensional structure observing method 审中-公开
标题翻译：观察三维结构，三维结构和三维结构观察方法的样本支持阶段
公开(公告)号：JP2009070604A
公开(公告)日：2009-04-02
申请号：JP2007235315
申请日：2007-09-11
申请人： Japan Fine Ceramics Center , Univ Nagoya , 国立大学法人名古屋大学 , 財団法人ファインセラミックスセンター
发明人： YOSHIDA KENTA , HIRAYAMA TSUKASA , YAMAMOTO KAZUO , NAE RAI , TANAKA NOBUO , SAITO AKIRA , YAMAZAKI JUN
IPC分类号： H01J37/20
摘要： PROBLEM TO BE SOLVED: To provide a sample support stage for observing a three-dimensional structure of high versatility with a sample constitution while adopting a constitution capable of always holding a sample in the visual field center of an electron microscope, a protractor and a three-dimensional structure observing method.
SOLUTION: This sample support stage 30 has a base 31 and a sample support member 32 rotatably arranged to the base 31, and is arranged via a holder 10 in a tip part of a rotary member 16 rotatable in a ± specific angle range from a reference attitude. The protractor 40 marked with a plurality of angle graduations at a specific angle interval is installed on the sample support stage 30. While adjusting an index 34 of the sample support member 32 to the graduations 42 of the protractor 40, a plurality of turning angle states rotated stepwise at a specific angle interval to the base 31 are maintained, and the sample can be observed from all the directions of 360° by successively rotating a rotary member at the ± specific angle in the respective turning angle states.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：为了提供一种用于在采用能够将样品始终保持在电子显微镜的视场中心的构造的情况下用样品构成观察高通用性的三维结构的样品支撑台，量角器和三维结构观察方法。解决方案：该样品支撑台30具有基部31和可旋转地布置到基部31的样品支撑构件32，并且经由支架10布置在旋转构件16的可在±特定角度范围内旋转的顶端部分从参考态度。在样品支撑台30上安装有以特定角度间隔标记有多个角度刻度的量角器40。在将样品支撑构件32的折痕34调整到量角器40的刻度42时，多个转动角状态保持与基座31成一定角度的间隔逐步旋转，并且可以通过在旋转角度状态下以±特定角度继续旋转旋转部件，从360°的所有方向观察样本。版权所有（C）2009，JPO＆INPIT

2. 发明专利

JP2007231306A Method for producing nanoparticle 有权
标题翻译：生产纳米材料的方法
公开(公告)号：JP2007231306A
公开(公告)日：2007-09-13
申请号：JP2006050942
申请日：2006-02-27
申请人： Osaka Univ , Univ Nagoya , 国立大学法人名古屋大学 , 国立大学法人大阪大学
发明人： TORIMOTO TSUKASA , OKAZAKI KENICHI , TANAKA NOBUO , KUWAHATA SUSUMU
IPC分类号： B22F9/02 , B22F1/00 , B22F9/04
CPC分类号： B82Y30/00 , B22F9/12 , B22F9/24 , B22F2009/245 , B22F2998/00 , Y10S977/788 , Y10S977/81 , B22F1/0018
摘要： PROBLEM TO BE SOLVED: To provide a method for producing a nanoparticle.
SOLUTION: The method for producing the nanoparticle includes attaching an atom or a molecule composing a precursor of the nanoparticle onto an ionic liquid 22. The production method can produce the nanoparticles which hardly agglomerate in a liquid even though the surface of the particle is not chemically modified; can produce the nanoparticle without needing a complicated operation because of producing the nanoparticle directly from the precursor of the nanoparticle; and does not produce a byproduct.
COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：待解决的问题：提供一种制备纳米颗粒的方法。解决方案：制备纳米颗粒的方法包括将构成纳米颗粒的前体的原子或分子附着到离子液体22上。制备方法可以产生在液体中几乎不凝聚的纳米颗粒，即使颗粒的表面没有化学改性; 由于直接从纳米颗粒的前体制备纳米颗粒，所以可以不需要复杂的操作来生产纳米颗粒; 并且不产生副产物。版权所有（C）2007，JPO＆INPIT

3. 发明专利

JP2009178644A Metal fine particle carrier and its manufacturing method 有权
标题翻译：金属微粒载体及其制造方法
公开(公告)号：JP2009178644A
公开(公告)日：2009-08-13
申请号：JP2008019023
申请日：2008-01-30
申请人： Japan Fine Ceramics Center , 財団法人ファインセラミックスセンター
发明人： YOSHIDA KENTA , TANEMURA SAKAE , TANAKA NOBUO , TORIMOTO TSUKASA , NOZAKI TSUTOMU
IPC分类号： B01J37/03 , B01J23/42 , B01J23/52 , B01J35/02 , B01J37/34
摘要： PROBLEM TO BE SOLVED: To provide a manufacturing method of a metal fine particle carrier capable of uniformly and densely supporting metal fine particles having a nano-size even on the surface of a carrier having a relatively large particle size using a smaller consumption of a support metal source than before while precisely controlling the shape or size of the metal fine particles to be supported in a liquid phase method, and the metal fine particle carrier. SOLUTION: A two-phase system of an ionic liquid and a liquid having insoluble relation with respect to the ionic liquid is used as a reaction solvent and metal fine particles are supported on the surface of a carrier particle comprising a semiconductor or a conductor by electrodeposition reaction on light irradiation or voltage application. The obtained metal fine particle carrier is characterized in that the average particle size of the metal fine particles is 5 nm or below with respect to the particle size of 200 nm or above of the carrier particle, the mutual distance between the metal fine particles is three times of the average particle size and the number of the metal fine particles per unit area supported on the surface of the carrier particle is 3×10 16 /m 2 or above. COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：为了提供能够均匀且密集地支撑具有纳米尺寸的金属微粒的金属微粒载体的制造方法，甚至在具有较小粒度的载体的表面上使用较小的消耗的金属源，同时以液相法精确控制待负载的金属微粒的形状或尺寸，并且金属微粒载体。解决方案：使用离子液体和与离子液体不溶关系的液体的两相体系作为反应溶剂，金属微粒负载在载体颗粒的表面上，该载体颗粒包含半导体或导体通过电沉积反应进行光照射或电压施加。得到的金属微粒载体的特征在于，相对于载体颗粒的200nm以上的粒径，金属微粒的平均粒径为5nm以下，金属微粒的相互距离为3 平均粒径和载体颗粒表面上负载的每单位面积的金属微粒的数量的倍数为3×10 16 / SP 2 / SP以上。版权所有（C）2009，JPO＆INPIT

4. 发明专利

JP2009123477A Sample holder for ultraviolet-visible-near infrared absorption spectrum measurement 有权
标题翻译：用于超紫外可见近红外吸收光谱测量的样品支架
公开(公告)号：JP2009123477A
公开(公告)日：2009-06-04
申请号：JP2007295355
申请日：2007-11-14
申请人： Japan Fine Ceramics Center , 財団法人ファインセラミックスセンター
发明人： YOSHIDA KENTA , HIRAYAMA TSUKASA , SASAKI YUKICHI , TANAKA NOBUO , SAITO AKIRA , YAMAZAKI JUN
IPC分类号： H01J37/20 , H01J37/26
CPC分类号： H01J37/228
摘要： PROBLEM TO BE SOLVED: To provide a sample holder for concurrently allowing easy and sure high-resolution observation of a sample as well as ultraviolet-visible-near infrared absorption spectrum measurement by, using an existing electron microscope.
SOLUTION: A sample holder 10 performs structural observation of a sample S by radiating electron beam E in a TEM1. The holder includes an incident side optical fiber 38 which is arranged along the axial direction X of the sample holder 10 for transferring the light in the region of ultraviolet-visible-near infrared from a light source 60 outside an electron microscope, an incident side condenser lens 42 which condenses incident light L
1 transmitted through the incident side optical fiber 38, a transmissive side condenser lens 43 which is arranged on the side counter to the incident side condenser lens 42 through the sample S and condenses light L
2 transmitted through the sample S, and a transmissive side optical fiber 39 which is arranged along the axial direction of the sample holder 10 and transmits the transmissive light L
2 condensed by the transmissive side condenser leans 43 to the outside of the electron microscope.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：提供一种样品架，用于通过使用现有的电子显微镜同时进行样品的容易且可靠的高分辨率观察以及紫外 - 可见 - 近红外吸收光谱测量。解决方案：样品保持器10通过在TEM1中辐射电子束E来进行样品S的结构观察。保持器包括入射侧光纤38，其沿着样品保持器10的轴向X布置，用于将紫外可见近红外区域中的光从电子显微镜外侧的光源60传送入射侧冷凝器透射通过入射侧光纤38的入射光L 1 的透镜42，通过样品S配置在与入射侧聚光透镜42相对的一侧的透射侧聚光透镜43，通过样品S透射的光L 2 和沿着样品保持器10的轴向布置并透射透射光L 2 的透射侧光纤39 通过透射侧冷凝器斜面43到电子显微镜的外部。版权所有（C）2009，JPO＆INPIT

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