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1. 发明专利

JPH09292307A INSPECTING SYSTEM FOR COLOR UNEVENNESS OF COLOR FILTER FOR LIQUID CRYSTAL 失效
公开(公告)号：JPH09292307A
公开(公告)日：1997-11-11
申请号：JP10797796
申请日：1996-04-26
申请人： ISHIKAWAJIMA HARIMA HEAVY IND
发明人： NAKAMURA TOSHIO , OGAWA TOSHIAKI , SHIODA TOMOHIKO , OISHI KEIZO , YAMAMOTO AKIHIRO
IPC分类号： G01N21/88 , G01M11/00 , G01N21/956 , G01N21/958
摘要： PROBLEM TO BE SOLVED: To make it possible to detect the unevenness of color at a high speed by passing respective pixel data through a delay circuit, adding the data by pipeline processing and obtaining the luminance data of each pixel from compressed image data, in correspondence with the pixel at the same time. SOLUTION: The image data from a line sensor are made to be three sets of the pixel data, wherein the data are delayed for by each pixel for pipeline processing in a delay circuit 30. The data are added in adding circuits 31-33, respectively, stored in a memory 34 and inputted into a pixel extracting system 36 of a picture-element detecting circuit 24. At this time, the picture element position data are inputted into a control part 35 of an image-data compressing system. The delay circuit 30 and the respective adding circuits 31-33 are controlled, and the image data, which are added for every picture element, are controlled. At the same time, the picture element, which is acquired by the picture-element-data extracting system 36, is controlled. The picture element data, which are inputted into the picture-element detecting circuit 24, are synthesized as the screen information of a display 1. Noises, which are not related to the picture elements, are removed. The elements are divided into every picture element of each color (RGB). At the same time, the color unevenness of each color is detected.

2. 发明专利

JPH08128920A COLOR FILTER INSPECTION EQUIPMENT 失效
公开(公告)号：JPH08128920A
公开(公告)日：1996-05-21
申请号：JP26655794
申请日：1994-10-31
申请人： ISHIKAWAJIMA HARIMA HEAVY IND
发明人： NAKAMURA TOSHIO , OGAWA TOSHIAKI , SHIODA TOMOHIKO , OISHI KEIZO , MATSUO KENGO
IPC分类号： G01M11/00 , G01N21/956 , G02F1/1335
摘要： PURPOSE: To provide a color filter inspection equipment capable of detecting defects of an each pixel and detecting irregular color at the same time. CONSTITUTION: Color filter inspection equipment for optically inspecting each color pixel 2 in a color filter substrate 1 has an optical detecting device comprising a line light source 6 and a line sensor camera group 7 arranged in the main scanning direction on both sides of the color filter substrate 1. A stage synchronizing control device 10 which relatively moves the optical detecting device and the color filter substrate 1 in the sub-scanning direction and takes pixel information in the line sensor camera group 7 for every pixel in the sub- scanning direction and an image processing device group 9 which takes in image information from the line sensor camera group 7 and detects irregular color or defectives in each pixel 2 are installed.

3. 发明专利

JPH0989660A DETECTION METHOD FOR LUMINANCE OF COLOR FILTER 失效
公开(公告)号：JPH0989660A
公开(公告)日：1997-04-04
申请号：JP25072595
申请日：1995-09-28
申请人： ISHIKAWAJIMA HARIMA HEAVY IND
发明人： YAMAMOTO AKIHIRO , NAKAMURA TOSHIO , OGAWA TOSHIAKI , SHIODA TOMOHIKO , OISHI KEIZO
IPC分类号： G01J1/02 , G01J1/42
摘要： PROBLEM TO BE SOLVED: To obtain a detection method in which the measuring error of luminance data on every pixel due to the deviation of the center line in the transverse direction of the pixel from the position of the pixel is reduced and in which the measuring error of luminance data on the pixel is reduced by faithfully integrating the output curve of the pixel. SOLUTION: In a method, a filter is constituted in such a way that rectangular pixels in an identical shape are arranged side by side in the transverse direction and the longitudinal direction, a plurality of detection elements are allocated to one pixel by using an image sensor composed of detection elements in an identical size which is smaller than that of the pixels, the luminance of the pixels is measured on the basis of their outputs, and the luminance of the color filter is detected. In this case, the output of the detection elements allocated to every pixel is set on the axis of ordinates and positions in the transverse direction of the respective detection elements are set on the axis of abscissas, an output curve which passes the outputs of the respective detection elements is found, and a value obtained by integrating the output curve in a definite range by making use of the center line in the transverse direction of every pixel as a reference is regarded as the one-dimensional luminance of every pixel.

4. 发明专利

JPH0914942A IMAGE PICK-UP DEVICE FOR INSPECTION SCRATCH ON CYLINDRICAL SURFACE 失效
公开(公告)号：JPH0914942A
公开(公告)日：1997-01-17
申请号：JP16575695
申请日：1995-06-30
申请人： ISHIKAWAJIMA HARIMA HEAVY IND
发明人： TAKANO TAKETOSHI , OISHI KEIZO
IPC分类号： G01B11/30 , G01N21/88 , G01N21/952 , G06T1/00
摘要： PURPOSE: To make image processing advantageous and to achieve an automatic inspection by illuminating a cylindrical inspection target with a line-shaped light source along the longitudinal direction of the target and picking up a two-dimensional development image of the entire periphery surface by rotating the inspection target. CONSTITUTION: The image of a specific visual field out of the surface of a rubber roller 4 irradiated by a light source 2 is picked up by a line camera 5. The visual field is along the longitudinal direction of the rubber roller 4 and the light source 2 is also along the longitudinal direction of the rubber roller, thus achieving a uniform lighting. The rubber roller 4 is rotated at a specific anglar velocity around a shaft, the two-dimensional image of the camera 5 is successively read for the rotation, and the image is edited into the two-dimensional development image on the entire- circumferential surface of the rubber roller 4. The complete reflection from the sound part of the rubber roller 4 goes in a direction differing from that of the camera 5, thus obtaining an image with intermediate gradation. However, since the complete reflection from a scratched part 10 goes to the camera 5, halation occurs by that amount, thus obtaining an image with saturated gradation or an image close to it.

5. 发明专利

JPH06288928A SURFACE FLAW INSPECTION APPARATUS 失效
公开(公告)号：JPH06288928A
公开(公告)日：1994-10-18
申请号：JP7566193
申请日：1993-04-01
申请人： ISHIKAWAJIMA HARIMA HEAVY IND
发明人： ASAMI HIDEJI , SHIBATA HIDEO , HOSHINO SHUJI , HIROSE TOSHIO , OISHI KEIZO
IPC分类号： G01N21/88 , G01N21/93 , G01N21/952
摘要： PURPOSE:To provide a surface flaw inspection apparatus which can inspect presence/absence of a flaw on a surface without necessity of an image processor for positioning a rotary angle, etc., of a disclike object. CONSTITUTION:A surface flaw inspection apparatus for inspecting presence/ absence of a flaw on a surface of a disclike object 10 comprises rotating means 13, 12a, 12b for rotating the object 10 conveyed to an inspecting position around a center of the object 10, a linear sensor 15 for imaging a radial surface state of the object 10, and deciding means 17, 18, 19 for detecting presence/ absence of image data from the sensor 15.

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