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1. 发明专利

JP2009140589A Test device of data storage device and test method of data storage device 审中-公开
标题翻译：数据存储设备的测试设备和数据存储设备的测试方法
公开(公告)号：JP2009140589A
公开(公告)日：2009-06-25
申请号：JP2007317759
申请日：2007-12-07
申请人： Hitachi Global Storage Technologies Netherlands Bv , ヒタチグローバルストレージテクノロジーズネザーランドビーブイ
发明人： TAKEDA NOBUO , KUWASHIMA MASAKI , TAKAHASHI MASARU , TSUYAMA MASAFUMI
IPC分类号： G11B20/18
CPC分类号： G11B19/048 , G11B2220/2516
摘要： PROBLEM TO BE SOLVED: To cope with data storage devices having different specifications by one processor, in a test device of a data storage device.
SOLUTION: The test device has a processor card 6, and adapter cards a, 3b. The adapter cards 3a, 3b have power supply circuits 33a, 33b, 34a, 34b generating power supply voltage supplied to HDD 1a, 1b. The test device can flexibly correspond to HDDs having various specifications by one processor card by mounting power supply circuits in the adapter card. It is not necessary to mount a plurality of power supply circuits in the processor card to simultaneously test a plurality of HDDs by one processor card, thereby reducing size of the processor card.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：在数据存储设备的测试设备中处理由一个处理器具有不同规格的数据存储设备。
解决方案：测试设备具有处理器卡6和适配器卡a，3b。适配器卡3a，3b具有产生提供给HDD 1a，1b的电源电压的电源电路33a，33b，34a，34b。通过将电源电路安装在适配器卡中，测试装置可以通过一个处理器卡灵活地对应于具有各种规格的HDD。不需要在处理器卡中安装多个电源电路，以通过一个处理器卡同时测试多个HDD，从而减小处理器卡的尺寸。版权所有（C）2009，JPO＆INPIT

2. 发明专利

JP2007184027A Functional testing device of data storage device 审中-公开
标题翻译：数据存储设备的功能测试设备
公开(公告)号：JP2007184027A
公开(公告)日：2007-07-19
申请号：JP2006000903
申请日：2006-01-05
申请人： Hitachi Global Storage Technologies Netherlands Bv , ヒタチグローバルストレージテクノロジーズネザーランドビーブイ
发明人： KUWASHIMA MASAKI , TAKEDA NOBUO , TSUYAMA MASAFUMI , NISHIUCHI SHIGETO
IPC分类号： G11B20/18 , G06F3/06
摘要： PROBLEM TO BE SOLVED: To provide a functional testing device of a data storage device that allows a board to be exchanged easily, has improved space efficiency, and can perform a functional test inexpensively and quickly.
SOLUTION: The testing device of a data storage device comprises: a casing; and a testing board for performing the functional test of the data storage device arranged in a cavity fixed by the casing. In the testing device, the testing board comprises at least: an adaptor board connected to the data storage device; a CPU board in which a CPU for controlling the functional test of the data storage device is mounted; and an interface board positioned between the adaptor board and the CPU board. All the boards for composing the testing board are interconnected so that mounting surfaces of the boards are in parallel substantially.
COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：为了提供允许板容易地交换的数据存储装置的功能测试装置，提高了空间效率，并且可以廉价且快速地执行功能测试。解决方案：数据存储设备的测试设备包括：壳体; 以及用于执行布置在由壳体固定的空腔中的数据存储装置的功能测试的测试板。在测试设备中，测试板至少包括：连接到数据存储设备的适配器板; 安装用于控制数据存储装置的功能测试的CPU的CPU板; 以及位于适配器板和CPU板之间的接口板。用于组成测试板的所有板互连，使得板的安装表面基本平行。版权所有（C）2007，JPO＆INPIT

3. 发明专利

JP2008164570A Test chamber system 审中-公开
标题翻译：测试室系统
公开(公告)号：JP2008164570A
公开(公告)日：2008-07-17
申请号：JP2007000585
申请日：2007-01-05
申请人： Hitachi Global Storage Technologies Netherlands Bv , ヒタチグローバルストレージテクノロジーズネザーランドビーブイ
发明人： KUWASHIMA MASAKI , TAKEDA NOBUO , TSUYAMA MASAFUMI , NISHIUCHI SHIGETO
IPC分类号： G01R31/00
CPC分类号： G01R31/2849
摘要： PROBLEM TO BE SOLVED: To provide test chamber system for maintaining the sealing performance of decompression space on which the device under test is mounted to accurately control air pressure of the decompression space.
SOLUTION: In one embodiment, the decompression space 202 is partitioned from space 204 by connection panel 205. The connection panel 205 transmits a signal between test computer 300a and HDD100a. The connection panel 205 is secured to inner wall 208 demarcating the decompression space 202 and the space 204. Aperture 207 is made on the inner wall 208. The connection panel 205, which is larger than this aperture 207, plugs the aperture 207. For maintaining airtightness of the decompression space 202, the connection panel 205 is secured to the inner wall 208 via gasket 206.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提供用于保持安装有被测设备的减压空间的密封性能的测试室系统，以精确地控制减压空间的空气压力。解决方案：在一个实施例中，减压空间202通过连接面板205与空间204隔开。连接面板205在测试计算机300a和HDD100a之间传输信号。连接面板205固定在分隔减压空间202和空间204的内壁208上。孔207形成在内壁208上。大于该孔207的连接面板205插入孔207.为了维持减压空间202的气密性，连接面板205通过垫片206固定到内壁208.版权所有（C）2008，JPO＆INPIT

4. 发明专利

JP2007293936A Testing device for data storage device 审中-公开
标题翻译：数据存储设备的测试设备
公开(公告)号：JP2007293936A
公开(公告)日：2007-11-08
申请号：JP2006117429
申请日：2006-04-21
申请人： Hitachi Global Storage Technologies Netherlands Bv , ヒタチグローバルストレージテクノロジーズネザーランドビーブイ
发明人： TAKAHASHI MASARU , TSUYAMA MASAFUMI , NISHIUCHI SHIGETO , KUWASHIMA MASAKI
IPC分类号： G11B33/14 , G11B33/12
摘要： PROBLEM TO BE SOLVED: To provide a testing device easily adjusting an internal temperature without enlarging the device.
SOLUTION: This testing device is provided with a room for housing a data storage device, and an adjusting part for adjusting the flow of gas in a flow path in the testing device including the room. The adjusting part is provided with an outside air port 203 for sucking outside air or discharging gas from the inside, a return air port f213 for returning the gas passing through the flow path to the flow path, and a shutter 205 for changing the numerical apertures of the outside air port 203 and the return air port 213. The shutter 205 is changed from a first state where the numerical aperture of the outside air port 203 is lowest to a second state where the numerical aperture of the return air port 213 is lowest. As the shutter 205 shifts to the second state from the first state, the numerical aperture of the outside air port 203 is increased while the numerical aperture of the return air port 213 is reduced.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提供一种容易调节内部温度而不扩大设备的测试装置。解决方案：该测试装置设置有用于容纳数据存储装置的房间和用于调节包括房间的测试装置中的流路中的气体流量的调节部件。调节部设置有用于从内部吸入外部空气或排出气体的外部空气口203，用于将通过流路的气体返回到流路的返回空气端口f213，以及用于改变数值孔径外部空气口203和回气口213.快门205从外部空气口203的数值孔径最低的第一状态改变为回气口213的数值孔径最低的第二状态。当快门205从第一状态转移到第二状态时，外部空气口203的数值孔径增加，同时返回空气口213的数值孔径减小。版权所有（C）2008，JPO＆INPIT

5. 发明专利

JP2007292478A Tester for data storage device, connection adapter, and heat-insulated data storage device 审中-公开
标题翻译：数据存储设备测试仪，连接适配器和绝热数据存储设备
公开(公告)号：JP2007292478A
公开(公告)日：2007-11-08
申请号：JP2006117529
申请日：2006-04-21
申请人： Hitachi Global Storage Technologies Netherlands Bv , ヒタチグローバルストレージテクノロジーズネザーランドビーブイ
发明人： TAKAHASHI MASARU , TSUYAMA MASAFUMI , TAKEDA NOBUO , KUWASHIMA MASAKI
IPC分类号： G01R31/00
摘要： PROBLEM TO BE SOLVED: To facilitate installation of wiring electrically connecting an electronic apparatus to an outside of a heat insulating space, in a state such that the electronic apparatus is accommodated in the heat insulating space.
SOLUTION: The tester 200 of an HDD 100 includes the heat insulating space P accommodating the HDD 100, a test computer 202 for controlling the test of the HDD 100 accommodated in the heat insulation space P, and an adapter 300 for electrically connecting the HDD 100 and the test computer 202. The adapter 300 includes a detachable heat insulating member 304 that closes a through-hole 212a formed on a sidewall of the heat insulation space P, a first connector 302 electrically connected to the HDD 100, a second connector 303 electrically connected to the test computer 202, and wiring 301, connecting the first connector 302 and the second connector 303 via the through-hole 212a and integrated with the heat insulating member 304.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：为了便于将电子设备电气连接到绝热空间的外部的布线的安装，使得电子设备容纳在绝热空间中。解决方案：HDD 100的测试器200包括容纳HDD 100的隔热空间P，用于控制容纳在隔热空间P中的HDD 100的测试的测试计算机202和用于电连接的适配器300 HDD 100和测试计算机202.适配器300包括可拆卸的隔热构件304，其封闭形成在绝热空间P的侧壁上的通孔212a，电连接到HDD 100的第一连接器302，第二电连接到测试计算机202的连接器303以及通过通孔212a连接第一连接器302和第二连接器303并与隔热构件304集成连接的布线301.（C）2008，JPO和INPIT

6. 发明专利

JP2007102653A Method and apparatus for testing function of data storage apparatus 审中-公开
标题翻译：用于测试数据存储设备功能的方法和装置
公开(公告)号：JP2007102653A
公开(公告)日：2007-04-19
申请号：JP2005294305
申请日：2005-10-07
申请人： Hitachi Global Storage Technologies Netherlands Bv , ヒタチグローバルストレージテクノロジーズネザーランドビーブイ
发明人： KUWASHIMA MASAKI , TAKEDA NOBUO , TSUYAMA MASAFUMI , TAKAHASHI MASARU
IPC分类号： G06F3/06 , G06F12/16 , G11B20/10
CPC分类号： G06F13/385
摘要： PROBLEM TO BE SOLVED: To provide a function test apparatus for an HDD with reduced test time and memory resources used, by increasing a transfer volume for one command. SOLUTION: The apparatus for testing a data storage apparatus is provided with a storage part for storing original data, a data generation part for generating transfer data of a size larger than that of the original data by repeatedly using the original data in response to one command to the data storage apparatus, and a transfer part for transferring the generated transfer data to the data storage apparatus. COPYRIGHT: (C)2007,JPO&INPIT

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