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1. 发明专利

JP2002181829A BIOCHEMICAL AUTOMATIC ANALYZER 失效
公开(公告)号：JP2002181829A
公开(公告)日：2002-06-26
申请号：JP2000381160
申请日：2000-12-15
申请人： HITACHI LTD , HITACHI SCIENCE SYSTEMS LTD
发明人： MOTEGI NAOYA , SAITO KIYOTAKA , MIMURA TOMONORI
IPC分类号： G01N35/00 , G01N21/25 , G01N35/02 , G01N35/04
摘要： PROBLEM TO BE SOLVED: To realize a biochemical automatic analyzer capable of investigating influence of contamination without respect to the degree of knowledge and skill of a user and informing occurrence of a defect in a function suppressing generation of contamination to the user for preventing generation of a measurement error. SOLUTION: An item combination determined to be contaminated is extracted (step S7-1) to be determined whether it is equal to a previous determination result or not (step S7-2). If the determination results are different from each other in the step S7-2, it is determined that a defect occurs in a function of suppressing generation of contamination, that is, in a cleaning mechanism, and in an alarm display part of a CRT, an alarm showing occurrence of the defect in the cleaning mechanism is displayed. In this way, the device condition can be monitored without respect to the degree of skill of the user, and generation of the measurement error due to a defect in the device condition can be prevented.

2. 发明专利

JP2001228158A AUTOMATIC ANALYZER AND AUTOMATIC ANALYZING METHOD 失效
公开(公告)号：JP2001228158A
公开(公告)日：2001-08-24
申请号：JP2000046776
申请日：2000-02-18
申请人： HITACHI LTD , HITACHI SCIENCE SYSTEMS LTD
发明人： KIKUCHI TAKAHIRO , MIMURA TOMONORI , HATTORI MITSUO , HAYASHI MASAMI , USUI SHINOBU , OTAKI TOMOMASA , SAITO NAOKO
IPC分类号： G01N35/02
摘要： PROBLEM TO BE SOLVED: To provide an automatic analyzer of a type in which a carrying rack having a sample placed thereon is carried and measurement is advaced, and which enables the repeated measurement of the same item from the same sample vessel to be performed many times. SOLUTION: In this device, a new function of evaluation mode is added, so that a sample rack number 303 and a position number 304 can be added to the input information of measurement request in addition to a sample number 302, and the same sample rack number and the same position number can be also inputted to perform the repeated measurement of the same item from the same sample vessel. The same sample ID number 401 can be inputted to the input information of measurement request, so that the repeated measurement of the same item from the same sample vessel can be performed. In the input of measurement request, a plurality of requests for the same measurement item can be requested to one sample. A basic performance measurement such as simultaneous reproducibility or the like is instructed on a screen for displaying a basic performance measurement item.

3. 发明专利

JP2000266761A AUTOMATIC ANALYZER 失效
公开(公告)号：JP2000266761A
公开(公告)日：2000-09-29
申请号：JP7232799
申请日：1999-03-17
申请人： HITACHI LTD , HITACHI SCIENCE SYSTEMS LTD
发明人： KIKUCHI TAKAHIRO , SAITO KIYOTAKA , HAYASHI MASAMI , HATTORI MITSUO , MIMURA TOMONORI
IPC分类号： G01N35/04
摘要： PROBLEM TO BE SOLVED: To improve efficiency of an extraction work of a test body sample. SOLUTION: A rack L where a sample vessel is set is conveyed from a rack makeup part 10 to a rack storing part 40 by a conveyance line 50, and the rack L is returned around back to the rack makeup part 10 side by a circulation line 54. A makeup side rack number reading part 60 reads a rack number of the rack L conveyed by the conveyance line 50, and the read order of the rack L is memorized in a memory 72. A storage side rack number reading part 62 is arranged on the storage side, and reads a rack number of the conveyed rack L. If the rack L has a number to be stored, a control part 70 stores the rack L in the rack storing part 40, or otherwise, the control part 70 returns the rack L around back to the rack makeup side through the circulation line 54.

4. 发明专利

JP2002296284A AUTOMATIC ANALYZER 失效
公开(公告)号：JP2002296284A
公开(公告)日：2002-10-09
申请号：JP2001102783
申请日：2001-04-02
申请人： HITACHI LTD , HITACHI SCIENCE SYSTEMS LTD
发明人： OTAKI TOMOMASA , SAITO KIYOTAKA , KIKUCHI TAKAHIRO , HAYASHI MASAMI , MIMURA TOMONORI
IPC分类号： G01N35/00
摘要： PROBLEM TO BE SOLVED: To reduce a part cost in a consumable part of an automatic analyzer, and a burden, onto an operator, of a working volume other than routine work, and to allow the operator to be devoted entirely to inspection work. SOLUTION: Replacing timing of the comsumable part and a part name are determined by combining accumulated values of electrified times in the analyzer and measuring times therein, a date and hour in the last replacement of the part having a life provided by an interactive mode with the operator on an image plane, and information by visual confirmation of an analyzer condition such as a residual amount of a high tergent liquid, and the presence of clogging or the like in an ion-exchanged water nozzle for cell blank.

5. 发明专利

JP2000227434A AUTOMATIC ANALYZER 失效
公开(公告)号：JP2000227434A
公开(公告)日：2000-08-15
申请号：JP2791599
申请日：1999-02-04
申请人： HITACHI LTD , HITACHI SCIENCE SYSTEMS LTD
发明人： MOTEGI NAOYA , SAITO KIYOTAKA , MIMURA TOMONORI
IPC分类号： G01N35/02
摘要： PROBLEM TO BE SOLVED: To efficiently select a function via a screen by limiting a plurality of functions to be executed in an analyzer from multiple built-in functions and displaying a function registration screen for setting their execution procedure. SOLUTION: Using a CRT 20 and an operation panel 23, a function is selected in the following way. Unnecessary functions are removed from all the function built in an automatic analyzer, and only the functions required by a user are registered in a memory unit 33. In addition to the limitedly set functions, the memory unit 33 stores an execution procedure for a combination of the plurality of functions. This registration content is listed on a support screen in the CRT 20, and selective registration by the user and a command for execution of the registered functions are carried out via the screen. Inputting operations for an analyzer can be carried out via the support screen of the CRT 20 alone, so that condition can be set efficiently. In this case, unnecessary functions are not displayed on the support screen of the CRT 20, so that erroneous operation can be prevented.

6. 发明专利

JP2002196005A AUTOMATIC CHEMICAL ANALYZER HAVING RECALCULATING FUNCTION 失效
公开(公告)号：JP2002196005A
公开(公告)日：2002-07-10
申请号：JP2000391812
申请日：2000-12-25
申请人： HITACHI LTD , HITACHI SCIENCE SYSTEMS LTD
发明人： SHIRAISHI SO , YOKOSE TAIZO , MIMURA TOMONORI
IPC分类号： G01N35/00
摘要： PROBLEM TO BE SOLVED: To provide an automatic chemical analyzer reducing a delay of inspection due to a simple error and improving efficiency and speed of data submission of an inspection department by providing a function storing the whole reaction process during an analysis, applied to a concentration calculation of a random sample by a random calibration result and recalculating it. SOLUTION: In this automatic chemical analyzer, reaction processes are stored per analysis. When a calibration fails and a concentration calculation of a sample measured afterward is calculated incorrectly, recalculation of the incorrectly calculated sample can be provided by using a successful result by a recalibration.

7. 发明专利

JP2001091518A AUTOANALYZER 失效
公开(公告)号：JP2001091518A
公开(公告)日：2001-04-06
申请号：JP26496599
申请日：1999-09-20
申请人： HITACHI LTD , HITACHI SCIENCE SYSTEMS LTD
发明人： USUI SHINOBU , SAITO KIYOTAKA , HAYASHI MASAMI , MIMURA TOMONORI
IPC分类号： G01N21/90 , G01N21/15 , G01N21/27 , G01N35/00
摘要： PROBLEM TO BE SOLVED: To provide the deterioration information of a reaction container to an operator with an alarm or the like by measuring the blank value of the reaction container to be made in an analysis for entire wavelength that can be utilized for each reaction container, storing the value along with the measurement data/time in accumulation, preparing a reference value for each reaction container without requiring any measurement of the blank value, and achieving the propriety of the usage of the reaction container, the confirmation of the change in the blank value, and the isolation of the factors of the change in the bland value. SOLUTION: The autoanalyzer is provided with a control part for collecting the blank absorbance (blank value) of a reaction container to be measured when washing the reaction container in an analysis for entire wavelength that can be used by the device, a storage part for accumulating and storing the blank value for each reaction container in time series, an operation part for calculating the amount of change of each reaction container from a plurality of blank values being accumulated and stored according to the regression expression of the blank value and measurement time, and a function for judging the deterioration of the reaction container by comparing the calculated amount of change with the most recent blank value.

8. 发明专利

JP2005030763A AUTOANALYZER 审中-公开
公开(公告)号：JP2005030763A
公开(公告)日：2005-02-03
申请号：JP2003192534
申请日：2003-07-07
申请人： HITACHI HIGH TECH CORP , HITACHI SCIENCE SYSTEMS LTD
发明人： INOUE AKIYOSHI , KIKUCHI TAKAHIRO , SHICHIJI MASARU , MIMURA TOMONORI
IPC分类号： G01N35/02
摘要： PROBLEM TO BE SOLVED: To provide an autoanalyzer constituted so as to report an analyzed result rapidly and efficiently by obtaining a measuring result without re-examining a specimen in high concentration, reducing the photometric failure caused by the air bubbles bonded to the inside and outside of a reaction vessel and sharply reducing a re-examination ratio. SOLUTION: This autoanalyzer is constituted so as to provide stable data by reacting a specimen with a reagent in the reaction vessel having a plurality of light path lengths while rotating the reaction vessel to perform multiple measurement and converting measured values at every measuring length to the values of the measuring lengths to output the average value of them as a measuring result. COPYRIGHT: (C)2005,JPO&NCIPI

9. 发明专利

JP2005030762A AUTOMATIC ANALYSIS SYSTEM 审中-公开
公开(公告)号：JP2005030762A
公开(公告)日：2005-02-03
申请号：JP2003192533
申请日：2003-07-07
申请人： HITACHI HIGH TECH CORP , HITACHI SCIENCE SYSTEMS LTD
发明人： USUI SHINOBU , NISHIDA MASAHARU , MIMURA TOMONORI , SAITO KIYOTAKA
IPC分类号： G01N35/02
摘要： PROBLEM TO BE SOLVED: To provide a function capable of acquiring easily an analysis result by simplifying an analysis work in order to grasp the present operation efficiency and an efficient operation form. SOLUTION: This automatic analysis system is equipped with analysis units for analyzing a sample, a conveyance mechanism for conveying the sample to the analysis unit, and a control mechanism for controlling the analysis units and the conveyance mechanism. In the system, a plurality of analysis units are connected to the conveyance mechanism. The system is also equipped with a storage means for storing information on at least the analysis item and the measuring day of each sample as much as a portion in a period of two days or longer. Since the system has a function for accumulating analysis request information utilized in daily analysis, an operation function and a screen for controlling them, the analysis work by an analyzer becomes possible, while omitting a work for prior information collection. In addition, prior acquisition of the analysis request information, information transfer to a dedicated simulator, result reflection to the analyzer or the like can be performed simply, and analysis can be performed at any time as the need arises, and the efficient operation form of the analyzer can be maintained. COPYRIGHT: (C)2005,JPO&NCIPI

10. 发明专利

JPH11316237A MULTIITEM ANALYZER 失效
公开(公告)号：JPH11316237A
公开(公告)日：1999-11-16
申请号：JP6269499
申请日：1999-03-10
申请人： HITACHI LTD
发明人： MIMAKI HIROSHI , KODAMA RYUICHIRO , MIMURA TOMONORI
IPC分类号： G01N35/04
摘要： PROBLEM TO BE SOLVED: To provide a multiitem analyzer which enhances an average treatment speed by a plurality of analyzing and measuring modules, and which shortens the reporting time of an analyzed and measured result. SOLUTION: A plurality of analyzing and measuring modules are arranged along a conveyance line 3. With reference to the analyzing and measuring modules 4 in which a sample sampling position is formed on the conveyance line 3, a sample sampling operation is executed repeatedly to all measurement- requested specimens on one specimen rack. After that, the specimen rack is fetched on the basis of a judgment on whether it is to be fetched into the analyzing and measuring module 4 having a rack fetch region, and the sampling operation is performed.

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