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1. 发明专利

JPH04206375A ARRESTER DEGRADATION DETECTOR 失效
公开(公告)号：JPH04206375A
公开(公告)日：1992-07-28
申请号：JP33070390
申请日：1990-11-30
申请人： HITACHI LTD
发明人： SHIRAKAWA SHINGO , MIZUKOSHI AKIO , ITO MORIO
IPC分类号： H01T4/02
摘要： PURPOSE:To precisely detect degradation in unlimited application by providing a thermocamera which detects the temperature of an arrester and an abnormality judging means which gives output when a detection value by the thermocamera is over a preset value. CONSTITUTION:Each arrester 1 has a housing 5 at the lower part of which a monitoring window 2 is provided, through which infrared light is passed and via which a thermocamera 4 is installed on the earth side to measure the temperature of an inside element, e.g. a zinc oxide element, in the housing 5. The output side of the thermocamera 4 is connected to an abnormality judging means 7 via a detecting circuit 6. To the abnormality judging means 7, the output side of an ambient temperature detector 10 which consists of a sensor 8 to measure ambient temperature and a detecting circuit 9 is connected. The abnormality judging means 7 gives output as abnormality when a difference DELTAT between a detection temperature TZ by each thermocamera 4 and a detection temperature TC by the ambient temperature detector 10 is over a preset value. It is thus possible to precisely detect degradation.

2. 发明专利

JPH0142482B2 失效
公开(公告)号：JPH0142482B2
公开(公告)日：1989-09-13
申请号：JP10573682
申请日：1982-06-18
申请人： HITACHI LTD
发明人： MIZUKOSHI AKIO , AKATSU KAORU , SHINDO KATSUJI
IPC分类号： H01C7/12 , H01H33/16

3. 发明专利

JPS63175366A ISOLATOR OF ARRESTOR 失效
公开(公告)号：JPS63175366A
公开(公告)日：1988-07-19
申请号：JP600287
申请日：1987-01-16
申请人： HITACHI LTD
发明人： MIZUKOSHI AKIO , SHINDO KATSUJI
IPC分类号： H01T1/14 , H01C7/12

4. 发明专利

JPS6087611A INSULATING SPACER 失效
公开(公告)号：JPS6087611A
公开(公告)日：1985-05-17
申请号：JP19413783
申请日：1983-10-19
申请人： HITACHI LTD
发明人： YAMAGIWA TOKIO , MIZUKOSHI AKIO , KOBAYASHI SHIGEO , ENDOU FUMIMASA
IPC分类号： H02G5/06

5. 发明专利

JPS58130503A ARRESTER 失效
公开(公告)号：JPS58130503A
公开(公告)日：1983-08-04
申请号：JP1153982
申请日：1982-01-29
申请人： HITACHI LTD
发明人： MIZUKOSHI AKIO , AKATSU KAORU , SHINDOU KATSUJI , OZAWA ATSUSHI , YAMAZAKI TAKEO
IPC分类号： H01C7/12 , H01T1/16

6. 发明专利

JPS55158607A GAPLESS ARRESTER DETERIORATION DETECTOR 失效
公开(公告)号：JPS55158607A
公开(公告)日：1980-12-10
申请号：JP6561779
申请日：1979-05-29
申请人： HITACHI LTD
发明人： SHINDOU KATSUJI , AKATSU KAORU , MIZUKOSHI AKIO , OZAWA ATSUSHI
IPC分类号： G01R31/00 , H01C7/12

7. 发明专利

JPS5351451A LIGHTENING ARRESTOR 失效
公开(公告)号：JPS5351451A
公开(公告)日：1978-05-10
申请号：JP12621776
申请日：1976-10-22
申请人： HITACHI LTD
发明人： MIZUKOSHI AKIO
IPC分类号： H01T1/04
摘要： PURPOSE:To formulate a discharge electrode to endure a long time continuing discharging, by performing discharging repeatedly without heating inside of a same arc extinguishing room using front and back of one sheet arc extinguishing plate.

8. 发明专利

JPS51133750A DISCHARGE GAP MEANS 失效
公开(公告)号：JPS51133750A
公开(公告)日：1976-11-19
申请号：JP5737275
申请日：1975-05-16
申请人： HITACHI LTD
发明人： MIZUKOSHI AKIO , SHINDOU KATSUJI , AKATSU KAORU , OZAWA ATSUSHI
IPC分类号： H01T4/10 , H01T1/00 , H01T4/12
摘要： PURPOSE:To provide a discharge gap means, with which it is possible to readily control the corona imitiation voltage through appropriate adjustment of the intensity of an electric field across the width of a notched groove of an insulating spacer without varying the length thereof.

9. 发明专利

JPH0511398B2 失效
公开(公告)号：JPH0511398B2
公开(公告)日：1993-02-15
申请号：JP5697386
申请日：1986-03-17
申请人： HITACHI LTD
发明人： OKAMOTO EICHI , NISHIKAWA NORIAKI , KOHARA KENJI , SHIRAKAWA SHINGO , MARUYAMA SEIICHI , MIZUKOSHI AKIO
IPC分类号： H02G7/00 , H01B17/46 , H01T1/14 , H01T4/10 , H01T4/14

10. 发明专利

JPS61176869A METHOD FOR TESTING LIGHTNING IMPULSE VOLTAGE OR TRANSFORMER 失效
公开(公告)号：JPS61176869A
公开(公告)日：1986-08-08
申请号：JP1656985
申请日：1985-02-01
申请人： HITACHI LTD
发明人： ENDO KAORU , FURUKAWA SADAO , OZAWA ATSUSHI , MIZUKOSHI AKIO
IPC分类号： G01R31/12
摘要： PURPOSE:To obtain a method for testing which discriminates the dielectric breakdown of a winding by comparison of voltage and current waveforms with good accuracy by carrying out a test while changing non-linear resistors in such a manner that the performance characteristic of the non-linear resistors when a full wave declining voltage is impressed thereto and the performance characteristic when a full wave test voltage is impressed thereto are made the same. CONSTITUTION:Both terminals of the low voltage winding 12 are grounded. One end of the high voltage winding 13 is connected to a voltage impressing terminal 21 and the other end to a tap winding 14. The 2nd non-linear resistor 16 is short circuited by a short circuit device 18 and only the 1st non-linear resistor 15 is shunted and connected to the tap winding 14 to apply the full wave declining voltage thereto. The voltage and current waveforms are then observed on an oscilloscope, etc. by a voltage divider and resistor 22 connected to the terminal 21. The device 18 is opened to impress the full wave test voltage to the resistor and the waveforms are observed. The limiting voltage is so selected that the currents flowing in the non-linear resistors are made approximately equal in each test. The voltage waveform generated at the winding 14 is compared with an approximately resembling waveform and a fault is discriminated from the presence or absence of the waveform distortion.

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