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    • 2. 发明专利
    • MEASURING PROBE UNIT FOR ELECTRIC MEASUREMENT
    • JP2001311742A
    • 2001-11-09
    • JP2000130726
    • 2000-04-28
    • HIOKI ELECTRIC WORKS
    • TOMIYAMA HIDEKIKOBAYASHI KENJI
    • G01R1/06G01R27/02G01R31/28
    • PROBLEM TO BE SOLVED: To provide a measuring probe unit for electric measurement capable of performing accurate measuring work by bringing measuring probes into contact with an object to be measured composed of a large conductor while their positions are fixed at a predetermined interval without holding them with hands. SOLUTION: In the measuring probe unit for electric measurement having a plurality of measuring probes 11 connected electrically and individually by providing cables 52 individually between a measuring instrument 51 and them, each of the measuring probes 11 is provided with a conducting screw rod 18 which can come into contact with the object to be measured 101 composed of long and large conductor and be loaded freely across substantially upper half based on positional relation that it crosses the direction of length of the object to be measured 101 orthogonally and can come into pressure contact with a side face 103 in the direction of length of the object to be measured 101 freely by screw-fitting in and bringing into close adhesion with a female screw hole 14 vided in an opposing section to a side face 103 side.
    • 3. 发明专利
    • CIRCUIT ELEMENT MEASURING DEVICE
    • JP2003172754A
    • 2003-06-20
    • JP2001375874
    • 2001-12-10
    • HIOKI ELECTRIC WORKS
    • TOMIYAMA HIDEKI
    • G01R1/06G01R31/00
    • PROBLEM TO BE SOLVED: To provide a circuit element measuring device capable of setting a chip part easily and accurately, and effective for improvement of measurement accuracy and miniaturization. SOLUTION: A measuring mechanism 22 loaded on a base part 21 of a measuring device body 11 is constituted from one side measuring means 23 on the movable side and the other side measuring means 43 on the fixed side electrically contactable individually with one side end face and the other side end face of the chip part 101 positioned by being dropped into a groove part formed on the base part 21. One side measuring means 23 includes at least one side measuring part 24 equipped with one side measuring pin 25 arranged on the groove part with following motion executable against the biasing force of an internal spring at the artificial retreating time of a pin socket part 31 advancing or retreating along the groove direction of the groove part. The other side measuring means 43 is formed by including at least the other side measuring part 43 equipped with the other side measuring pin 45 positioned on the groove part by being energized by the internal spring so that its tip face abuts on the tip face of the one side measuring pin 25. COPYRIGHT: (C)2003,JPO
    • 4. 发明专利
    • MEASURING DEVICE
    • JP2000131337A
    • 2000-05-12
    • JP30389798
    • 1998-10-26
    • HIOKI ELECTRIC WORKS
    • TOMIYAMA HIDEKI
    • H01R13/52G01R1/04
    • PROBLEM TO BE SOLVED: To prevent drop of measurement accuracy caused by sticking of water droplet to a main body side contact piece and a cable side contact piece and to prevent a failure caused by coming-in of the water droplet into a measuring device main body. SOLUTION: A measuring device 1 comprises a measuring device main body 3 provided with a main body side contact piece 13 and a measuring-device cable 2 provided with a cable side connector 4 comprising a cable side contact piece 5 capable of being fitted to the main body side contact piece 13. Here, a connector insert opening 14 for inserting the cable side connector 4 is formed at the measuring device main body 3, the cable side connector 4 is so configured that it contacts by surface to the inside wall which forms the connector insert opening 14, at engagement of both contact pieces 5 and 13, for closing the connector insert opening 14, and a cylindrical guide member 16 in which one of the contact pieces 5 and 13 is inserted is erected around the other of them.
    • 5. 发明专利
    • PROBE UNIT FOR FOUR-TERMINAL MEASUREMENT
    • JP2001311751A
    • 2001-11-09
    • JP2000131159
    • 2000-04-28
    • HIOKI ELECTRIC WORKS
    • TOMIYAMA HIDEKIKOBAYASHI KENJI
    • G01R1/073G01R27/02
    • PROBLEM TO BE SOLVED: To provide a probe unit for four-terminal measurement suitable for measuring the resistance of a measured object made of a large conductor by a four-terminal measuring method. SOLUTION: A Hi-side current feeding terminal section 12, a Hi-side voltage detecting terminal section 22, a Lo-side current feeding terminal section 32, and a Lo-side voltage detecting terminal section 42 are combined to form this probe unit for four-terminal measurement. The current feeding terminal section 12 and the voltage detecting terminal section 22 are arranged separately from each other at a fixed interval on one side base section 21 made of an insulating material and are integrated into a Hi-side terminal body 11. The voltage detecting terminal section 42 and the current feeding terminal section 32 are arranged separately from each other at a fixed interval on the other side base section 41 and are integrated into a Lo-side terminal body 31. The Hi-side terminal body 11 and the Lo-side terminal body 31 allow the Hi-side voltage detecting terminal section 22 and the Lo-side voltage detecting terminal section 42 to be freely installed face to face with respect to the measured object 51.
    • 6. 发明专利
    • HINGE AND CASE WITH TOP COVER USING THE SAME
    • JPH11208699A
    • 1999-08-03
    • JP3218598
    • 1998-01-29
    • HIOKI ELECTRIC WORKS
    • TOMIYAMA HIDEKI
    • B65D43/16H05K5/03
    • PROBLEM TO BE SOLVED: To provide a case which can be provided at a low cost and in which a top cover can not be easily removed. SOLUTION: In the case 11 wherein a top cover 15 is mounted to a container body 12 through hinges 21, a rotation side hinge part 22 constituting the hinge 21 includes at least a rotation body part 23, an insertion groove part 27 having an introducing hole on one side of the part 23, and a bearing hole part which has a diameter equal to or larger than the groove width of the part 27 and communicates with the part 27 and the hinge part 22 is mounted to the cover 15. A supporting axis side hinge part 32 has a diameter equal to or larger than the groove width of the part 27 and includes at least a supporting axis part to rotatably support the hinge part 22 in a bearing hole part and a pair of supporting leg parts protruding to the left and right of the supporting axis part respectively and the hinge part 32 is mounted to the body 12 to axially support the hinge part 22.
    • 7. 发明专利
    • MEASURING PROBE UNIT FOR ELECTRIC MEASUREMENT
    • JP2001311741A
    • 2001-11-09
    • JP2000130368
    • 2000-04-28
    • HIOKI ELECTRIC WORKS
    • TOMIYAMA HIDEKI
    • G01R1/06G01R27/02G01R31/28
    • PROBLEM TO BE SOLVED: To provide a measuring probe unit for electric measurement eliminating a necessity for holding a measuring probe with hand and performing accurate measuring work by fixing a position of the measuring probe and bringing it into contact with a measuring point of an object to be measured composed of a large conductor. SOLUTION: This measuring probe unit consists of a base part 11 having a recessed loading face 15 determined based on the relation with a cross sectional shape of the object to be measured 101 on a bottom face 14 side and loaded so as to cross the object to be measured 101 and the measuring probe 21 having a pressed and energized contact pin 24 and arranged in the base part 11. The measuring probe 21 is constituted such that the contact pin 24 protrudes from the recessed loading face 15 and is detachably arranged by providing a hole 16 for mounting measuring probe which passes through from substantially central section of an upper face 12a in the base part 11 to the recessed loading face 15.