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    • 8. 发明专利
    • Non-destructive inspection system having self-aligning probe assembly
    • 具有自我校准探头组件的非破坏性检查系统
    • JP2010276604A
    • 2010-12-09
    • JP2010117920
    • 2010-05-24
    • General Electric Co ゼネラル・エレクトリック・カンパニイGeneral Electric Company
    • LEE BYUNGWOOWU YANYANKRAY NICHOLAS JOSEPH
    • G01N29/26G01N27/90
    • G01B21/20G01N21/9515
    • PROBLEM TO BE SOLVED: To cause sensors to contact and to be substantially normal or perpendicular to the surfaces of structures to be inspected in order to improve inspection accuracy.
      SOLUTION: An inspection system (10) includes: a sensor (16) configured to obtain inspection data of an object; a motion control device (11); a joint assembly (12) coupled to the motion control device (11); and a probe housing (13) coupled to the joint assembly (12) and configured to hold the sensor (16). The inspection system (10) further includes a compliant element (14) coupled to the probe housing (13) and configured to cooperate with the joint assembly (12) and the motion control device (11) to position the sensor (16) relative to the object. A self-aligning probe assembly is also presented.
      COPYRIGHT: (C)2011,JPO&INPIT
    • 要解决的问题:为了提高检测精度,使传感器接触并且基本正常或垂直于要检查的结构的表面。 检测系统(10)包括:传感器(16),被配置为获得物体的检查数据; 运动控制装置(11); 耦合到运动控制装置(11)的联合组件(12); 以及联接到所述接头组件(12)并被配置为保持所述传感器(16)的探针壳体(13)。 检查系统(10)还包括联接到探针壳体(13)并被配置为与接头组件(12)和运动控制装置(11)协作以将传感器(16)相对于 物体。 还提出了自对准探针组件。 版权所有(C)2011,JPO&INPIT