专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明专利

JP2008111756A Fine particle component analyzer 有权
标题翻译：精细粒子成分分析仪
公开(公告)号：JP2008111756A
公开(公告)日：2008-05-15
申请号：JP2006295713
申请日：2006-10-31
申请人： Central Res Inst Of Electric Power Ind , Mitsubishi Heavy Ind Ltd , National Institute For Environmental Studies , Shibata Kagaku Kk , 三菱重工業株式会社 , 柴田科学株式会社 , 独立行政法人国立環境研究所 , 財団法人電力中央研究所
发明人： DEGUCHI YOSHIHIRO , TANAKA NOBUYUKI , FURUYA MASAHIRO , TSUZAKI MASAHARU , TANABE KIYOSHI , KOBAYASHI SHINJI , IDEYA YOSHIHIRO
IPC分类号： G01N1/00 , G01N1/22 , G01N15/02 , G01N15/06 , G01N27/62 , G01N27/64
摘要： PROBLEM TO BE SOLVED: To provide a fine particle component analyzer capable of rapidly performing calibration even when the component of a fine particle of nano-meter size is analyzed. SOLUTION: The fine particle component analyzer 110 includes a sampling device 111 for sampling atmosphere, an electrostatic classifier 112 for classifying and sending a fine particle 2 of nano-meter size, as a target particle diameter, from the sampling gas 1 sampled by the sampling device 111, a mass spectrometer 114 of a laser ionization flight time type for analyzing the component of the fine particle 2 from the classifier 112, and a calibration object producing device 10 that produces a calibration object 3 to which a defined amount of calibration component 3b is adhered to a metal core 3a of the fine particle with a target number of particles per unit volume and supplies it to the classifier 112. COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：为了提供即使分析纳米尺寸的微粒的组分也能够快速进行校准的微粒成分分析仪。解决方案：细颗粒成分分析器110包括用于取样气体的取样装置111，用于从取样气体1中分选并送出纳米尺寸的微粒2作为目标粒径的静电分级器112 通过采样装置111，分析用于从分类器112分析细粒子2的分量的激光离子化飞行时间类型的质谱仪114以及产生校准对象3的校准对象生成装置10，校准组件3b以每单位体积的目标颗粒数量粘附到细颗粒的金属芯3a，并将其提供给分级器112.（C）2008，JPO＆INPIT

2. 发明专利

JP2014085218A Device and method for measuring environment inside mask body 有权
标题翻译：用于测量面罩内部环境的装置和方法
公开(公告)号：JP2014085218A
公开(公告)日：2014-05-12
申请号：JP2012234142
申请日：2012-10-23
申请人： Shibata Scientific Technology Ltd , 柴田科学株式会社
发明人： SHIBATA MASATOSHI , SAITO SHINJI , TSURUTA YUGO , IDEYA YOSHIHIRO , CHIBA YUJI
IPC分类号： G01N15/08 , G01N15/06
摘要： PROBLEM TO BE SOLVED: To provide a device and a method for measuring environment inside a mask body, which allow a degree of the leak of particles to be confirmed in real time and allow relationship between the leak of particles and breathing of a wearer to be confirmed.SOLUTION: The device for measuring environment inside a mask body includes: an inner particle counter for measuring the number of particles inside mask body covering at least a mouth and a nose; an outer particle counter for measuring the number of particles of outside the mask body; a pressure sensor for measuring the pressure inside the mask body; a calculation part for calculating a comparison value between the number of particles inside the mask body and the number of particles outside the mask body using a measuring result of the inner particle counter and of the outer particle counter, and an output part for outputting a comparison value calculated by the calculation part and the pressure measured by the pressure sensor each in a simultaneously displayable manner in association with the time.
摘要翻译：要解决的问题：提供一种用于测量面罩体内的环境的装置和方法，其允许实时确认颗粒泄漏的程度，并且允许颗粒泄漏与穿着者的呼吸之间的关系为用于测量面罩主体内部环境的装置包括：内部颗粒计数器，用于测量至少覆盖口和鼻部的面罩体内的颗粒数; 用于测量面罩主体外面的颗粒数量的外部颗粒计数器; 用于测量面罩体内的压力的压力传感器; 计算部件，用于使用内部粒子计数器和外部粒子计数器的测量结果计算掩模体内的粒子数与掩模体外的粒子的数量之间的比较值;以及输出部分，用于输出比较由计算部分计算的值和由压力传感器测量的压力各自以可同时显示的方式与时间相关联。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式