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1. 发明专利

JP2014097526A Connection structure and connection structure 有权
标题翻译：连接结构与连接结构
公开(公告)号：JP2014097526A
公开(公告)日：2014-05-29
申请号：JP2012251277
申请日：2012-11-15
申请人： Auto Network Gijutsu Kenkyusho:Kk , 株式会社オートネットワーク技術研究所 , Sumitomo Wiring Syst Ltd , 住友電装株式会社 , Sumitomo Electric Ind Ltd , 住友電気工業株式会社
发明人： SHIMADA TAKANOBU , ONO JUNICHI , OTSUKA TAKUJI , MIYAMOTO KENJI , OTA TOMOYA , MORISHIGE YOSUKE , MATSUKAWA SHINJI , KURAMOCHI KOJI , NAKAMURA MOTONORI
IPC分类号： B23K20/00 , H01R4/62 , H01R13/03
摘要： PROBLEM TO BE SOLVED: To provide a connection structure that increases strength of connection between dissimilar metals.SOLUTION: A connection structure 11 comprises: a first metal part 12 that is made of one metal; a second metal part 13 that is made of another metal different from the one metal; an intermediate part 14 that is formed between the first and second metal parts 12 and 13 to connect the first and second metal parts 12 and 13 together; and a continuous phase 15 that is formed in the intermediate part 14 and made of another metal and that continues from the second metal part 13 to the vicinity of the first metal part 12.
摘要翻译：要解决的问题：提供提高异种金属之间的连接强度的连接结构。解决方案：连接结构11包括：由一种金属制成的第一金属部分12; 第二金属部分13，其由与该金属不同的另一种金属制成; 形成在第一和第二金属部件12和13之间以将第一和第二金属部件12和13连接在一起的中间部分14; 以及形成在中间部分14中并由另一种金属制成并从第二金属部分13延伸到第一金属部分12附近的连续相15。

2. 发明专利

JP2014086250A Analysis sample conveyance device and analysis sample conveyance method 审中-公开
标题翻译：分析样品输送装置和分析样品输送方法
公开(公告)号：JP2014086250A
公开(公告)日：2014-05-12
申请号：JP2012233928
申请日：2012-10-23
申请人： Sumitomo Electric Ind Ltd , 住友電気工業株式会社
发明人： MATSUKAWA SHINJI , FUJIOKA HIROYUKI , MORISHIGE YOSUKE
IPC分类号： H01J37/20 , G01N1/00 , G01N23/225
摘要： PROBLEM TO BE SOLVED: To provide an analysis sample conveyance device comprising a sample holder including a sample table and a cover body, in which, when conveying in a sample, the cover body can be removed without requiring operation from the outside of an analyzer and when conveying the sample out of the analyzer, the sample can also be conveyed to another analyzer without exposing the sample in atmospheric air, and an analysis sample conveyance method using the analysis sample conveyance device.SOLUTION: The analysis sample conveyance device comprises: a sample table; a cover body which is fitted with the sample table so as to form a sealed space to hold a sample therein; cover body lifting means for moving the cover body in a vertical direction; sample table slide means for moving the sample table horizontally; lock means for locking the horizontal movement of the sample table just under the cover body; and a hermetic material for blocking outside air into the sealed space when the sample table and the cover body are fitted. The analysis sample conveyance method using the analysis sample conveyance device is also disclosed.
摘要翻译：要解决的问题：提供一种分析样品输送装置，其包括具有样品台和盖体的样品保持器，其中当在样品中输送时，可以从盖子外部去除盖体，而不需要从分析仪的外部进行操作，当将样品从分析仪输送出来时，也可以将样品输送到另一分析器而不将样品暴露在大气中，并使用分析样品输送装置进行分析样品输送方法。解决方案：分析样品输送装置包括：样品表; 盖体，其安装有样品台，以便形成用于将样品保持在其中的密封空间; 用于沿着垂直方向移动盖体的盖体提升装置; 用于水平移动样品台的样品台滑动装置; 锁定装置，用于将样品台的水平运动锁定在盖体正下方; 以及密封材料，用于当样品台和盖体装配时，将外部空气阻挡到密封空间中。还公开了使用分析样品输送装置的分析样品输送方法。

3. 发明专利

JP2009085943A Icp emission spectral analysis method 有权
标题翻译： ICP发射光谱分析方法
公开(公告)号：JP2009085943A
公开(公告)日：2009-04-23
申请号：JP2008225069
申请日：2008-09-02
申请人： Sumitomo Electric Ind Ltd , 住友電気工業株式会社
发明人： MORISHIGE YOSUKE , NAKAMURA MOTONORI
IPC分类号： G01N21/73
摘要： PROBLEM TO BE SOLVED: To provide an ICP emission spectral analysis method for easily, efficiently and accurately implementing a quantitative analysis of an element to be measured, even if a sample solution to be measured contains elements other than the element to be measured.
SOLUTION: In the ICP emission spectral analysis method, components within the sample solution are excited by introducing the sample solution into a high frequency plasma, after the sample solution is nebulized, each element emits a light with a characteristic wavelength, and quantitative analysis of the elements inside the sample solution is implemented, based on emission spectra obtained by separating the light. The same element other than the element to be measured is added to both a standard sample solution having the element to be measured with a known concentration and the sample solution to be measured so that they are at the same concentration. Quantitative analysis of the to-be-measured element to be measured is implemented, based on emission intensities of the element to be measured in both solutions.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：为了提供一种ICP发射光谱分析方法，用于容易，有效和准确地实现待测元素的定量分析，即使要测量的样品溶液含有除被测元素之外的元素。
解决方案：在ICP发射光谱分析方法中，通过将样品溶液引入高频等离子体来激发样品溶液中的组分，样品溶液雾化后，每个元素发出特征波长的光，并定量基于通过分离光获得的发射光谱来实现样品溶液中元素的分析。将具有待测量元素的标准样品溶液与待测元素以外的相同元素加入到具有已知浓度的待测元素和待测量的样品溶液使其处于相同浓度。要测量的要测量元素的定量分析基于两个解决方案中要测量的元素的发射强度来实现。版权所有（C）2009，JPO＆INPIT

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