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1. 发明专利

JP2006179587A Apd photon detector 有权
标题翻译： APD光电探测器
公开(公告)号：JP2006179587A
公开(公告)日：2006-07-06
申请号：JP2004369570
申请日：2004-12-21
申请人： Anritsu Corp , アンリツ株式会社
发明人： TANIMOTO TAKAO , TSUDA YUKIO , OTANI AKIHITO , KUBOTA KAZUO
IPC分类号： H01L31/107 , H01L31/10
摘要： PROBLEM TO BE SOLVED: To provide an APD (avalanche photodiode) photon detector particularly speeded up in a detection response speed for photons in an APD photon detector for detecting photons by making use of the avalanche current of the APD.
SOLUTION: The APD photon detector comprises the APD2 for generating an avalanche current by inputting photons thereinto; a DC bias power supply 1 for supplying predetermined DC voltage larger than breakdown voltage to the cathode of the APD2; and a load resistance R1 for converting the avalanche current supplied from the anode of the APD2 to voltage, and outputting the converted voltage as the output signal Vo of the APD2. In the APD photon detector, there is provided quench means 20 for receiving the output signal Vo of the APD2 and, when it is judged from the output signal Vo that the APD2 generates the avalanche current, generating a quench signal P for forcedly quenching the avalanche current, and feeding back it to the cathode of the APD2.
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：提供一种APD（雪崩光电二极管）光子检测器，其以APD光子检测器中的光子的检测响应速度特别地加速，以通过利用APD的雪崩电流来检测光子。解决方案：APD光子检测器包括用于通过在其中输入光子来产生雪崩电流的APD2; 用于将比击穿电压大的预定DC电压提供给APD2的阴极的DC偏压电源1; 以及负载电阻R1，用于将从APD2的阳极供给的雪崩电流转换为电压，并输出转换后的电压作为APD2的输出信号Vo。在APD光子检测器中，提供了用于接收APD2的输出信号Vo的骤冷装置20，并且当从输出信号Vo判断APD2产生雪崩电流时，产生用于强制猝灭雪崩的骤冷信号P 电流，并将其反馈到APD2的阴极。版权所有（C）2006，JPO＆NCIPI

2. 发明专利

JP2008020297A Sampling apparatus and waveform observing apparatus 审中-公开
标题翻译：采样装置和波形观察装置
公开(公告)号：JP2008020297A
公开(公告)日：2008-01-31
申请号：JP2006191788
申请日：2006-07-12
申请人： Anritsu Corp , アンリツ株式会社
发明人： IGAWA TAKAHITO , OTANI AKIHITO , TSUDA YUKIO
IPC分类号： G01R13/34 , G01R13/20
摘要： PROBLEM TO BE SOLVED: To surely generate a clock component signal synchronized with an envelope curve signal obtained by sampling for an input signal in the NRZ (non return to zero) system.
SOLUTION: The sampling apparatus comprises a sampling section 21 which samples an input signal x(t) with a period having a difference with respect to the multiple of the repetition period of its waveform and outputs an envelope curve signal h(t) having a waveform obtained by successively connecting amplitude values obtained by the sampling and a clock component signal generation section 22 for generating and outputting a sinusoidal signal having the same frequency as the bit rate of the envelope curve signal h(t) as a clock component signal. The clock component signal generation section 22 includes a nonlinear circuit 23 which deforms the waveform of the envelope curve signal h(t) and generates a frequency component which is double the fundamental wave component of the envelope curve signal h(t) and a filter 26 for extracting the frequency component which is double the fundamental wave component of the envelope curve signal h(t) out of an output signal g(t) of the nonlinear circuit 23, generating and outputting a clock component signal q(t) from the envelope curve signal h(t) obtained for the input signal x(t) in the NRZ system.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：确保产生与通过对NRZ（不归零）系统中的输入信号进行采样获得的包络线信号同步的时钟分量信号。解决方案：采样装置包括采样部分21，其对具有与其波形的重复周期的倍数相差的周期的输入信号x（t）进行采样，并输出包络线信号h（t）具有通过连续地连接通过采样获得的振幅值和时钟分量信号产生部分22而获得的波形，用于产生和输出具有与包络线信号h（t）的比特率相同的频率的正弦信号作为时钟分量信号。时钟分量信号产生部分22包括使包络线信号h（t）的波形变形的非线性电路23，并产生与包络线信号h（t）的基波分量的两倍的频率成分和滤波器26 用于从非线性电路23的输出信号g（t）中提取出包络线信号h（t）的基波分量的两倍的频率分量，从包络线产生并输出时钟分量信号q（t）对于NRZ系统中的输入信号x（t）获得的曲线信号h（t）。版权所有（C）2008，JPO＆INPIT

3. 发明专利

JP2007010411A Sampling device and waveform observation system 有权
标题翻译：采样设备和波形观测系统
公开(公告)号：JP2007010411A
公开(公告)日：2007-01-18
申请号：JP2005189810
申请日：2005-06-29
申请人： Anritsu Corp , アンリツ株式会社
发明人： TSUDA YUKIO
IPC分类号： G01R13/34 , H03M1/12
摘要： PROBLEM TO BE SOLVED: To constitute inexpensively; to enable a frequency to be synchronized with a signal in a wide frequency range; and to observe stably even a waveform having jitter.
SOLUTION: A specific component included in a signal E
0 outputted from a light sampling part 28 is extracted by a specific component extraction means 30, and each frequency or each phase of the specific component Q and a specified signal H having a theoretical frequency calculated beforehand by an operation means 23 relative to the specific component is compared each other by a comparison means 31. A synchronization control means 32 controls a reference signal generation means 24 so that the specific component Q is frequency-synchronized or phase-synchronized by the specified signal H based on an output Er from the comparison means 31. Since the specific component Q can be outputted from a trigger output terminal 21d, deviation of a waveform data acquisition start timing caused by an influence of jitter of a signal to be measured is suppressed, by applying trigger of a digital oscilloscope 60 by the specific component Q, to thereby enable stable waveform observation.
COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：廉价构成; 以使频率与宽频率范围内的信号同步; 并且即使是具有抖动的波形也能够稳定地观察。解决方案：由光采样部分28输出的信号E 0 中包括的特定分量由特定分量提取装置30提取，并且特定分量Q的每个频率或每个相位通过比较装置31将具有由操作装置23预先计算出的理论频率的指定信号H进行比较。同步控制装置32控制参考信号生成装置24，使得特定分量Q为频率基于来自比较装置31的输出Er，通过指定信号H进行同步或相位同步。由于可以从触发输出端子21d输出特定分量Q，所以由于影响的波动数据获取开始定时的偏差通过利用特定分量Q的数字示波器60的触发来抑制要测量的信号的抖动，从而实现稳定的波形观察。版权所有（C）2007，JPO＆INPIT

4. 发明专利

JP2006003327A Frequency detection method, sampling device and waveform observation system 有权
标题翻译：频率检测方法，采样设备和波形观测系统
公开(公告)号：JP2006003327A
公开(公告)日：2006-01-05
申请号：JP2004182948
申请日：2004-06-21
申请人： Anritsu Corp , アンリツ株式会社
发明人： TSUDA YUKIO
IPC分类号： G01R23/14 , G01R13/34
摘要： PROBLEM TO BE SOLVED: To correctly detect the frequency of an objective signal for measurement.
SOLUTION: The process of this method is described as follows: (S1) sampling the objective signal with a temporally sampling frequency Fs; (S2) detecting the frequency Fh of the specific signal which appears in the band of ≤1/2 sampling frequency Fs; (S3) changing the sampling frequency by prescribed amount ΔFs; (S4) detecting the frequency change ΔFh of the specific signal at that time; and (S5) calculating the frequency Fx of the measurement signal according to the following equation. The equation is Fx=Fh-Fs×ΔFh/ΔFs (if 0>ΔFh), or Fx=-Fh+Fs×ΔFh/ΔFs (if 0
摘要翻译：要解决的问题：正确检测用于测量的物镜信号的频率。解决方案：该方法的过程描述如下：（S1）用时间采样频率Fs对目标信号进行采样; （S2）检测出现在≤1/ 2采样频率Fs的频带内的特定信号的频率Fh; （S3）将采样频率改变规定量ΔF; （S4）检测该时刻的特定信号的频率变化ΔFh; 和（S5）根据下式计算测量信号的频率Fx。方程式为Fx = Fh-Fs×ΔFh/ΔFs（如果0>ΔFh）或Fx = -Fh + Fs×ΔFh/ΔFs（如果0 <ΔFh）。版权所有（C）2006，JPO＆NCIPI

5. 发明专利

JP2005338036A Sampling device and waveform observation system 有权
标题翻译：采样设备和波形观测系统
公开(公告)号：JP2005338036A
公开(公告)日：2005-12-08
申请号：JP2004160983
申请日：2004-05-31
申请人： Anritsu Corp , アンリツ株式会社
发明人： TSUDA YUKIO , OTANI AKIHITO
IPC分类号： G01R13/34
摘要： PROBLEM TO BE SOLVED: To make information observable which has burst-shaped signal waveforms, through their correct acquisition. SOLUTION: Observation of waveforms appearing in burst-like form is made possible through following processes, where pulse signal Eo obtained in a sampling section 26 to inputted light signal P is given to a first channel terminal 60b of a digital oscilloscope 60, clock signal C is given to an external clock terminal 60a of the digital oscilloscope 60, and furthermore, gate signal G inputted externally is received at a second trigger signal generating means 28, second trigger signal Q2 is generated synchronously at a timing of transition of level of the first trigger signal Q1 to a predetermined direction during the period indicating acquisition term of waveform by the gate signal G, and then by inputting Q2 into a second channel terminal 60c of digital oscilloscope 60 to initiate acquisition of waveform data through the second trigger signal Q2. COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：通过正确的采集，使具有突发形状信号波形的信息可以观察到。
解决方案：通过以下处理可以观察以脉冲串形式出现的波形，其中在采样部分26中获得的输入光信号P的脉冲信号Eo被提供给数字示波器60的第一通道端子60b，时钟信号C被提供给数字示波器60的外部时钟端子60a，此外，外部输入的门信号G在第二触发信号发生装置28处被接收，第二触发信号Q2在电平转换的时刻同步产生在通过门信号G指示波形的获取项期间的第一触发信号Q1中的第一触发信号Q1到预定方向，然后通过将Q2输入到数字示波器60的第二通道端子60c中以通过第二触发信号开始采集波形数据 Q2。版权所有（C）2006，JPO＆NCIPI

6. 发明专利

JP2011117871A Optical spectrum analyzer and wavelength calibration method therefor 有权
标题翻译：光谱分析仪和波长校准方法
公开(公告)号：JP2011117871A
公开(公告)日：2011-06-16
申请号：JP2009276552
申请日：2009-12-04
申请人： Anritsu Corp , アンリツ株式会社
发明人： SAKAMOTO HIDEYUKI , TSUDA YUKIO , YAMAZAKI NORIAKI
IPC分类号： G01J3/02 , G01J3/18
摘要： PROBLEM TO BE SOLVED: To specify easily an absorption wavelength of a cell, even when an inexpensive absorption cell having a short passing distance is used.
SOLUTION: While wide band light Pw including a known absorption wavelength of an absorption cell 40 is allowed to enter an incidence part 21 as light to be measured, a difference between a first spectrum characteristic Fa acquired when the absorption cell 40 is allowed to enter some of optical paths from the incidence part 21 to a photoelectric conversion element 34 via a spectral part 25 and subjected to wavelength sweeping, and a second spectrum characteristic Fb acquired when the absorption cell 40 is allowed to retreat from the optical path and subjected to wavelength sweeping is operated, and a spectrum characteristic G peculiar to the absorption cell is determined, and angle wavelength information is corrected from the spectrum characteristic G and the known absorption wavelength.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：即使使用具有短通过距离的便宜的吸收单元，也容易指定电池的吸收波长。解决方案：允许包括吸收单元40的已知吸收波长的宽带光Pw作为待测光进入入射部分21，允许当吸收单元40被允许时获得的第一光谱特性Fa之间的差通过光谱部分25进入从入射部分21到光电转换元件34的一些光路，并进行波长扫描，并且当吸收单元40被允许从光路退回并获得时获得的第二光谱特性Fb 操作波长扫描，并且确定吸收单元特有的光谱特性G，并且从光谱特性G和已知的吸收波长校正角度波长信息。版权所有（C）2011，JPO＆INPIT

7. 发明专利

JP2003075260A Light wavelength-measuring instrument 审中-公开
标题翻译：光波长测量仪器
公开(公告)号：JP2003075260A
公开(公告)日：2003-03-12
申请号：JP2001262245
申请日：2001-08-30
申请人： Anritsu Corp , アンリツ株式会社
发明人： TSUDA YUKIO
IPC分类号： G01J9/02
摘要： PROBLEM TO BE SOLVED: To accurately measure the amount of variation in the wavelength of input light inexpensively by a simple arithmetic operation.
SOLUTION: Input light is branched for irradiating so that optical axes cross each other at a specific angle via two optical paths having different optical path lengths. Interference fringes are generated near the specific position. The position variation according to the change in the wavelength of the input light in the interference fringes is detected by a light reception section 23 comprising a plurality of sets of light receivers 23a(1, 1)-23a(1, 4), 23a(2, 1)-23a(2, 4),..., 23a(4, 1)-23a(4, 4) where each set is arranged at the same interval as an interval (d) of the interference fringes, and synthesis means 23b(1)-23b(4) for synthesizing the light reception signal for each set, thus detecting such wavelength information as the amount of variation and the variation direction in the wavelength of input light based on synthesis signals Vs1-Vs4 for each set.
COPYRIGHT: (C)2003,JPO
摘要翻译：要解决的问题：通过简单的算术运算，廉价地精确地测量输入光的波长的变化量。解决方案：输入光被分支用于照射，使得光轴通过具有不同光程长度的两个光路以特定角度彼此交叉。在特定位置附近产生干涉条纹。根据干涉条纹中的输入光的波长变化的位置变化由包括多组光接收器23a（1,1）-23a（1,4），23a（1）的光接收部23检测， 2，1）-23a（2,4），...，23a（4,1）-23a（4,4）其中每个集合以与干涉条纹的间隔（d）相同的间隔布置，并且合成装置23b（1）-23b（4），用于合成每组的光接收信号，从而基于合成信号Vs1-Vs4检测作为输入光的波长的变化量和变化方向的波长信息组。

8. 发明专利

JP2012167936A Optical spectrum measurement device and optical spectrum measurement method 有权
标题翻译：光谱测量装置和光谱测量方法
公开(公告)号：JP2012167936A
公开(公告)日：2012-09-06
申请号：JP2011026657
申请日：2011-02-10
申请人： Anritsu Corp , アンリツ株式会社
发明人： MAKI TATSUYUKI , TSUDA YUKIO
IPC分类号： G01J3/26
摘要： PROBLEM TO BE SOLVED: To improve PDL performance in an optical spectrum analyzer in which light is passed through a wavelength variable etalon filter for two times.SOLUTION: The optical spectrum measurement device includes polarization controller (15) for making measurement object light into a predetermined polarization direction, a PBS (11) for transmitting the measurement object light incident from the polarization controller and separating light having a polarization direction perpendicular to the polarization direction of the predetermined polarization direction, a wavelength variable etalon filter (12) for extracting light of a set wavelength from the measurement object light having passed through the PBS, and extracting light of the set wavelength from polarization rotation light whose polarization direction of the extracted light is rotated by 90°; and a polarization rotation unit (13) for rotating a polarization direction of the measurement object light extracted by the wavelength variable etalon filter by 90°, and making light with the rotated polarization direction incident to the wavelength variable etalon filter as polarization rotation light; and a light receiver (14) for receiving polarization rotation light extracted by the wavelength variable etalon filter and separated by the PBS.
摘要翻译：要解决的问题：提高光谱分析仪中光通过波长可变标准具过滤器两次的PDL性能。光谱测量装置包括用于使测量对象光进入预定偏振方向的偏振控制器（15），用于透射从偏振控制器入射的测量对象光的PBS（11），并且分离具有偏振方向的光垂直于预定偏振方向的偏振方向的光束，用于从经过PBS的测量对象光中提取设定波长的光的波长可变标准具过滤器（12），并从偏振光的偏振旋转光中提取设定波长的光提取光的方向旋转90°; 以及偏振旋转单元（13），用于将由波长可变标准滤波器提取的测量对象光的偏振方向旋转90°，并使旋转的偏振方向的光入射到波长可变标准具滤光器作为偏振旋转光; 以及用于接收由波长可变标准具过滤器提取并被PBS分离的偏振旋转光的光接收器（14）。版权所有（C）2012，JPO＆INPIT

9. 发明专利

JP2010025669A Optical sampling apparatus 审中-公开
标题翻译：光学采样设备
公开(公告)号：JP2010025669A
公开(公告)日：2010-02-04
申请号：JP2008185795
申请日：2008-07-17
申请人： Anritsu Corp , アンリツ株式会社
发明人： TSUDA YUKIO , OTANI AKIHITO , IGAWA TAKAHITO , HASEGAWA HIROSHI
IPC分类号： G01J11/00
摘要： PROBLEM TO BE SOLVED: To acquire and observe the phase information of signal light as waveform information with high time resolution. SOLUTION: The optical sampling apparatus includes: an optical sampling pulse generator 35 for generating an optical pulse Ps having a predetermined cycle; an optical sampling section 31 for emitting an interfering light component obtained by combining signal light under measurement X and local light L (=Ps) in sync with the optical pulse; an optoelectric conversion section 36 for receiving the emitted light from the sampling section 31 and converting it into an electric signal; an electric sampling section 37 for performing sampling on the electric signal E output from the optoelectric conversion section 36; and a synchronization means 40 for performing synchronization so that the sampling by the electric sampling section 37 is performed on an electric signal corresponding to the interfering light component. COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：以高时间分辨率获取并观察信号光的相位信息作为波形信息。解决方案：光采样装置包括：光采样脉冲发生器35，用于产生具有预定周期的光脉冲Ps; 用于发射通过将测量X下的信号光与局部光L（= Ps）组合而获得的干涉光分量与光脉冲同步的光学采样部31; 光电转换部分36，用于接收来自采样部分31的发射光并将其转换为电信号; 用于对从光电转换部分36输出的电信号E进行采样的电采样部分37; 以及同步装置40，用于执行同步，使得通过电采样部分37对与干涉光分量相对应的电信号进行采样。版权所有（C）2010，JPO＆INPIT

10. 发明专利

JP2006003325A Sampling device and waveform observation system 有权
标题翻译：采样设备和波形观测系统
公开(公告)号：JP2006003325A
公开(公告)日：2006-01-05
申请号：JP2004182946
申请日：2004-06-21
申请人： Anritsu Corp , アンリツ株式会社
发明人： TSUDA YUKIO
IPC分类号： G01R13/34 , G01J11/00 , G01R13/20
摘要： PROBLEM TO BE SOLVED: To acquire waveform information correctly, even for a signal with long recursive period.
SOLUTION: A operation means 22 calculates: integers Q, N satisfying a relation where the difference between an integer N times of the recursive period Tx of the input signal S, and an integer Q times of the sampling period Ts is the same as the offset delay time ΔT; and the sampling period Ts corresponding to the integers Q, N. The light sampling part 25 performs the sampling to the input signal S with the calculated sampling period Ts. The data acquisition means 34 acquires the wave form information of the input signal from the signal Eo obtained by the sampling while synchronizing with the second clock signal C2 having the period of Q times of the sampling period Ts.
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：即使对于具有长递归周期的信号，也能正确获取波形信息。解决方案：操作装置22计算：满足输入信号S的递归周期Tx的整数N倍与采样周期Ts的整数Q倍之间的差的关系的整数Q，N相同作为偏移延迟时间ΔT; 以及与整数Q，N对应的采样周期Ts。光采样部25以计算出的采样周期Ts对输入信号S进行采样。数据采集装置34在与具有采样周期Ts的Q次周期的第二时钟信号C2同步的同时从采样获得的信号Eo中获取输入信号的波形信息。版权所有（C）2006，JPO＆NCIPI

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