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1. 发明专利

JP2013020920A Cable assembly, connector, and semiconductor test device 有权
标题翻译：电缆组件，连接器和半导体测试设备
公开(公告)号：JP2013020920A
公开(公告)日：2013-01-31
申请号：JP2011155964
申请日：2011-07-14
申请人： Advantest Corp , 株式会社アドバンテスト , Molex Japan Co Ltd , 日本モレックス株式会社
发明人： SAKIYAMA SHIN , SUZUKI TERUHITO
IPC分类号： H01R24/38 , G01R31/26
CPC分类号： G01R31/2601 , G01R1/0416 , G01R1/067 , G01R31/2889 , H01R9/05 , H01R9/0512 , H01R9/0518 , H01R12/721 , H01R13/6471 , H01R24/52 , H01R2201/20
摘要： PROBLEM TO BE SOLVED: To provide a connector capable of suppressing deterioration of signal transmission properties while improving terminal density.SOLUTION: In a cable assembly according to the present invention, when an auxiliary ground conductor 4 is arranged so as to face a lower surface of a support insulating member 58, an elastically deformed piece 45, which is in an elastically deformed state, contacts a tip portion of a ground terminal 54 projecting from the lower surface of the support insulating member 58.
摘要翻译：解决的问题：提供能够抑制信号传输性能劣化同时提高终端密度的连接器。解决方案：在根据本发明的电缆组件中，当辅助接地导体4布置成面向支撑绝缘构件58的下表面时，处于弹性变形状态的弹性变形件45 接触从支撑绝缘构件58的下表面突出的接地端子54的尖端部分。（C）2013，JPO和INPIT

2. 发明专利

JP2011014325A Connector, cable assembly, and semiconductor testing device 有权
标题翻译：电缆组件连接器和半导体测试设备
公开(公告)号：JP2011014325A
公开(公告)日：2011-01-20
申请号：JP2009156359
申请日：2009-06-30
申请人： Advantest Corp , Molex Japan Co Ltd , 日本モレックス株式会社 , 株式会社アドバンテスト
发明人： SAKIYAMA SHIN , MOTOHASHI NOBUMASA , MIZUMURA AKINORI , NIITSU TOSHIHIRO , SUZUKI TERUHITO
IPC分类号： H01R24/38 , H01R24/40
CPC分类号： H01R9/0527 , G01R31/2851 , H01R9/038 , H01R12/721 , H01R2201/20
摘要： PROBLEM TO BE SOLVED: To provide a connector capable of attaining improvement in the signal transmission characteristics.SOLUTION: The connector 10 is provided with a case 2, in which an insertion hole is formed into which the top end part of a coaxial cable 50, having a signal terminal 56 and a ground terminal 54 arranged at a part of the surroundings is inserted, and an auxiliary ground conductor 4, which is supported by the case 2 and is electrically connected to the ground terminal 54 and arranged at the other part in the surrounding of the signal terminal 56.
摘要翻译：要解决的问题：提供能够提高信号传输特性的连接器。解决方案：连接器10设置有壳体2，其中形成有插入孔，同轴电缆50的顶端部分，插入具有布置在周围一部分的信号端子56和接地端子54以及辅助接地导体4，其由壳体2支撑并电连接到接地端子54并且布置在另一部分信号端子56的周围。

3. 发明专利

JP2013026145A Connector and semiconductor testing device 有权
标题翻译：连接器和半导体测试设备
公开(公告)号：JP2013026145A
公开(公告)日：2013-02-04
申请号：JP2011162278
申请日：2011-07-25
申请人： Advantest Corp , 株式会社アドバンテスト , Molex Japan Co Ltd , 日本モレックス株式会社
发明人： WAGATA HIROTAKA , SAKIYAMA SHIN , HAMA HIROYUKI , SUZUKI TERUHITO , YAJIMA HIROYUKI , MIZUMURA AKINORI
IPC分类号： H01R24/44 , H01R12/71
CPC分类号： H01R13/629 , H01R13/422 , H01R13/6473 , H01R24/50
摘要： PROBLEM TO BE SOLVED: To provide a connector capable of improving a signal transfer characteristic, and semiconductor testing device.SOLUTION: In a connector 1, a first semi-cylinder part 6 is engaged with an insulation member 5 in a state where the first semi-cylinder part 6 is elastically deformed so that an interval between both end parts in the circumferential direction increases, and a second semi-cylinder part 7 is engaged with the insulation member 5 with which the first semi-cylinder part 6 is engaged in a state where the second semi-cylinder part 7 is elastically deformed so that an interval between both end parts in the circumferential direction increases. A slope that guides the first semi-cylinder part 6 so that an interval between the center parts of the first semi-cylinder part 6 and the second semi-cylinder part 7 in the circumferential direction is decreased as insertion of an assembly 3 proceeds, is provided in an insertion hole 21 of an enclosure 2.
摘要翻译：要解决的问题：提供能够提高信号传递特性的连接器和半导体测试装置。解决方案：在连接器1中，在第一半圆筒部6弹性变形的状态下，第一半圆筒部6与绝缘构件5接合，使得圆周方向两端部之间的间隔并且第二半圆筒部7与在第二半圆筒部7弹性变形的状态下与第一半圆筒部6接合的绝缘构件5接合，使得两端部之间的间隔在圆周方向上增加。引导第一半圆筒部6的斜面，使得随着组件3的插入而在圆周方向上的第一半圆筒部6的中心部和第二半圆筒部7之间的间隔减小，设置在外壳2的插入孔21中。版权所有（C）2013，JPO＆INPIT

4. 发明专利

JP2011014328A Connector, cable assembly, commonalized conductor for connector and semiconductor testing device 有权
标题翻译：连接器和半导体测试设备通用导体电缆组件连接器
公开(公告)号：JP2011014328A
公开(公告)日：2011-01-20
申请号：JP2009156362
申请日：2009-06-30
申请人： Advantest Corp , Molex Japan Co Ltd , 日本モレックス株式会社 , 株式会社アドバンテスト
发明人： SAKIYAMA SHIN , SUZUKI TERUHITO
IPC分类号： H01R24/00
摘要： PROBLEM TO BE SOLVED: To provide a connector capable of improving the signal transmission characteristics.SOLUTION: The connector 10 is provided with a case 2, in which a plurality of insertion holes to be inserted with the tip section of a coaxial cable 50 are formed, and a commonalized conductor 3, which is supported by the case 2 and includes a plurality of contact conductor parts 32 which are in contact with the ground terminal 54, provided at the tip section of each coaxial cable 50 and a common conductor part 34 which are to be connected to the plurality of the contact conductor parts 32.
摘要翻译：要解决的问题：提供能够提高信号传输特性的连接器。解决方案：连接器10设置有壳体2，其中形成有与同轴电缆50的尖端部分一起插入的多个插入孔和由壳体2支撑并且包括设置在每个同轴电缆50的末端部分处的与接地端子54接触的多个接触导体部分32和公共导体部分34的共用导体3，共同导体部分34 要连接到多个接触导体部分32。

5. 发明专利

JP2011014329A Edge connector and semiconductor testing apparatus 有权
标题翻译：边缘连接器和半导体测试装置
公开(公告)号：JP2011014329A
公开(公告)日：2011-01-20
申请号：JP2009156363
申请日：2009-06-30
申请人： Advantest Corp , Molex Japan Co Ltd , 日本モレックス株式会社 , 株式会社アドバンテスト
发明人： SAKIYAMA SHIN , SUZUKI TERUHITO , OKANO MASAHITO
IPC分类号： H01R12/72
摘要： PROBLEM TO BE SOLVED: To provide an edge connector which is easy to install on a circuit board.SOLUTION: In the edge connector, a sticking bar-shape protrusion 24 which is provided in a second contacting member 2 and has a smaller length in the vertical direction than a groove 14d is inserted in the dovetail groove-like groove 14d, which is provided in the case body 1A and extends in the vertical direction with the upper end opened, and the upper end of the groove 14d is covered by a cover plate 4.
摘要翻译：要解决的问题：提供一种易于安装在电路板上的边缘连接器。解决方案：在边缘连接器中，设置在第二接触构件2中并且在第二接触构件2中具有较小长度的粘杆状突起24 垂直方向比槽14d插入设置在壳体主体1A中的燕尾槽状槽14d中，并且在上端打开的同时在垂直方向上延伸，并且槽14d的上端被盖板4。

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