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1. 发明专利

JPH07260436A THICKNESS MEASURING APPARATUS FOR TRANSPARENT PLATE 失效
公开(公告)号：JPH07260436A
公开(公告)日：1995-10-13
申请号：JP7533494
申请日：1994-03-22
申请人： ASAHI GLASS CO LTD , EISHIN KOGYO KK
发明人： YAMAUCHI HIDEO , ENDO AKIRA
IPC分类号： G01B11/06
摘要： PURPOSE:To suppress measurement error caused by the fluctuation of distance between an objective transparent plate and a measuring apparatus as low as possible. CONSTITUTION:The focal distance (f) of a scanning lens 3 and the distance (m) between the scanning lens 3 and a thickness measuring point on the surface of a transparent plate 6 are set such that m /d.

2. 发明专利

JPH06213627A PLATE THICKNESS MEASUREMENT METHOD FOR PLATE TRANSPARENT BODY 失效
公开(公告)号：JPH06213627A
公开(公告)日：1994-08-05
申请号：JP26106593
申请日：1993-10-19
申请人： ASAHI GLASS CO LTD
发明人： YAMAUCHI HIDEO , TANI HIDETO , SANO YOSHIHIKO
IPC分类号： G01B11/06
摘要： PURPOSE:To measure a plate thickness precisely even when the position of transparent plate is displaced or it is inclined by correcting an apparent plate thickness of the transparent plate to be measured by a correction value found by using the transparent plate whose plate thickness is previously known. CONSTITUTION:In the first place, the transparent plate 1, whose plate thickness is previously known, is set in the predetermined position, and a reflecting mirror 3 is rotated so as to scan a light beam from a light source 2. An apparent plate thickness is found by an operation device 7 on the basis of a time leg between the arrival of a light beam reflected on the front face of the transparent plate 1 and the arrival of a light beam reflected on the back face of the transparent plate 1 in the first light receiving device 6, and a difference between the apparent plate thickness and an actual plate thickness, in other words, a correction value is found. In the second place, the time lag between a light beam reflected on the front face of the transparent plate to be measured 1 and a light beam reflected on the back face of that is found by the operation device 7 in the light receiving device 6, and an apparent plate thickness is found. Then, arrival times of light beams to the light receiving device 6 and to the second light receiving device 10 are found. And consequently, the apparent plate thickness is corrected by finding the previously stored correction value on the basis of these two times by the operation device 7, so that plate thickness without any error is found.

3. 发明专利

JPH03137506A EVALUATING METHOD OF DEGREE OF FLATNESS OF MAGNETIC DISK 失效
公开(公告)号：JPH03137506A
公开(公告)日：1991-06-12
申请号：JP27491189
申请日：1989-10-24
申请人： ASAHI GLASS CO LTD
发明人： YAMAUCHI HIDEO
IPC分类号： G01B21/30 , G11B5/84 , G11B20/14
摘要： PURPOSE:To measure the degree of flatness of a magnetic disk by measuring the amplitude of a harmonic frequency component of a rotational frequency of a plane-vibration waveform of the disk in rotation. CONSTITUTION:A magnetic disk 1 to be measured, a rotary spindle 2 and a magnetic disk fixing metal fitting 3 composed of a spacer ring (a), a clamp metal fitting (b), etc. are provided. A detection signal of a noncontact-type distance sensor 4 is calibrated in a signal processing circuit 5 and further it is subjected to nonlinear correction by the sensor and inputted to a frequency analyzing device 6. A signal of a rotational base angle sensor 7 provided at the rotary spindle 2 is inputted also to the frequency analyzing device 6. The result of analysis of the analyzing device 6 can be obtained on a display with respect to a rotational frequency component, higher components such as secondary and tertiary harmonics and also a vibration component of the magnetic disk not having so much relation with the rotational frequency of the spindle.

4. 发明专利

JPH03115844A DETECTION OF SURFACE DEFECT 失效
公开(公告)号：JPH03115844A
公开(公告)日：1991-05-16
申请号：JP25213989
申请日：1989-09-29
申请人： ASAHI GLASS CO LTD
发明人： YAMAUCHI HIDEO
IPC分类号： G01B11/30 , G01N21/88 , G01N21/89 , G01N21/892 , G01N21/958
摘要： PURPOSE:To discriminate between the flaw and inherent defect on the surface of an object to be inspected in a comparatively easy manner by detecting a part of the mirror surface reflected beam from the surface of the object to be inspected by a detector along with the scattering beam component due to the defect. CONSTITUTION:The laser beam 2 emitted from a laser beam source 1 irradiates the surface 5 of an object to be inspected by a mirror 3 and a condensing lens 4. A visual field limiting element 11 excludes a part of the mirror surface reflected beam 6 from the surface 5 of the object to be inspected and the remaining mirror surface reflected beam 7 is detected by a detector 10 along with the scattering beam 9 due to the defect 8 present on the surface 5 of the object to be inspected. The position of the visual field limiting element 11 is controlled so that 20 - 80% of the quantity of the mirror surface reflected beam from the surface 5 of the object to be inspected is detected by the detector 10. By this constitution, the flaw and protruding defect 8 on the surface 5 of the object to be inspected can be discriminated in a relatively easy manner without applying fast operational processing to the output waveform obtained by the detector 10.

5. 发明专利

JPS63316354A HARD MAGNETIC DISK CLAMPING FITTING 失效
公开(公告)号：JPS63316354A
公开(公告)日：1988-12-23
申请号：JP15014687
申请日：1987-06-18
申请人： ASAHI GLASS CO LTD
发明人： YAMAUCHI HIDEO
IPC分类号： G11B23/03 , G11B17/038 , G11B23/00
摘要： PURPOSE:To prevent a disk medium from being deformed by clamping by setting a contact portion with a hard magnetic disk medium to 20-60% range from an inner peripheral end on the surface of the medium when the width of a spacer ring is 100%. CONSTITUTION:About the assembling parts of a magnetic storage device consisting of a hard magnetic disk 2, a rotary spindle 4, a spacer ring 3, a clamping fitting 1, and a clamping screw 5, the contact portion A with the hard magnetic disk medium 2 is set within 20-60% range from the inner peripheral end on the surface of the medium 2. Consequently, the disk medium 2 can be prevented from being deformed by clamping force.

6. 发明专利

JPS56130606A OPTICAL MEASURING DEVICE FOR THICKNESS OF TRANSPARENT MATERIAL 失效
公开(公告)号：JPS56130606A
公开(公告)日：1981-10-13
申请号：JP3455580
申请日：1980-03-18
申请人： ASAHI GLASS CO LTD
发明人： YAMAUCHI HIDEO
IPC分类号： G01B11/06
摘要： PURPOSE:To measure the thickness of the transparent material without contacting, by measuring light path distances of reflection lights from the surface and the reverse face when the light beam is irradiated to the transparent material. CONSTITUTION:The laser beam from light source 2 consisting of an He-Ne laser oscillator is condensed to the measure position of transparent material 1 by lens 3. Lights reflected by surface S0 and reverse face S1 of transparent material 1 are condensed onto screen 6 by lens 4 and become bright point. Bright points become sharp by arranging lens 4 and screen 6 properly, and the distance between these bright points is measured to obtain the thickness of transparent material 1.

7. 发明专利

JPS5535509A DIGITALLANALOG LOGARITHMIC CONVERTOR CIRCUIT 失效
公开(公告)号：JPS5535509A
公开(公告)日：1980-03-12
申请号：JP10813978
申请日：1978-09-05
申请人： ASAHI GLASS CO LTD
发明人： YAMAUCHI HIDEO
IPC分类号： H03M1/66
摘要： PURPOSE:To convert approximately a digital signal into an analog logarithmic signal uses only resistor and a switch. CONSTITUTION:Four resistors 1-4, auxiliary resistors 6-9 and switches 10-13 are connected as shown in the figure, and the switches 10-13 are drived against 1, 2, 4 and 8 of input digital binary number. The resistors 1-4 and 6-9 have been selected to be same for each of them. Let 1-4 be Ra and 6-9 be Rb, then it is better to select that Rb is 1.0-2.0 times of Ra. The resistance value Z among input terminals 5, 14 including the contact that operated corresponding to input binary number, becomes what was approximately converted into analog logarithmic value from the input binary number.

8. 发明专利

JPS54161985A HUMIDITY DETECTION CIRCUIT 失效
公开(公告)号：JPS54161985A
公开(公告)日：1979-12-22
申请号：JP7040778
申请日：1978-06-13
申请人： ASAHI GLASS CO LTD
发明人： YAMAUCHI HIDEO
IPC分类号： G01N27/12 , G01N27/00 , G01N27/04

9. 发明专利

JPS53109517A CONTINUOUSLY MOLDING MACHINE FOR GLASS TUBES OR RODS 失效
公开(公告)号：JPS53109517A
公开(公告)日：1978-09-25
申请号：JP2435877
申请日：1977-03-08
申请人： ASAHI GLASS CO LTD
发明人： YAMAUCHI HIDEO , NAKAYAMA MINEO
IPC分类号： C03B23/08 , C03B15/14 , C03B17/00 , C03B17/04

10. 发明专利

JPH06281587A DEFECT DETECTING METHOD FOR TRANSPARENT PLATE LIKE BODY 失效
公开(公告)号：JPH06281587A
公开(公告)日：1994-10-07
申请号：JP9229593
申请日：1993-03-26
申请人： ASAHI GLASS CO LTD
发明人： YAMAUCHI HIDEO
IPC分类号： G01N21/88 , G01N21/94 , G01N21/958
摘要： PURPOSE:To detect a defect with high sensitivity by arranging a scattered-light reflecting place at the rear of a body under inspection viewed from an emitted beam, and detecting the reflected light beam from the defect with a light receiving optical system on the same axis of the light beam from the light emitting side. CONSTITUTION:An emitted light beam B is introduced into an optical axis A-A' through a small reflecting mirror M and a rotary mirror RM. A scattering reflecting plane SC is provided at the rear of a body under inspection K. A lens L codenses the reflected light from the reflecting plane SC on a photodetector D. The reflected light of the beam B from the reflecting plane SC is cut off with a cut-off plate ST, which is arranged at the position of the conjugate focal point with the reflecting plane SC. Only scattered reflected light of a defect KB is detected with the photodetector D. Thus, the inspection of the defect of a transparent plate-shaped body can be quickly performed with high sensitivity.

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