会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明专利
    • Polarization separating film, illuminator for liquid crystal display element and liquid crystal display device
    • 极化分离膜,液晶显示元件和液晶显示器件的照明器
    • JP2007219363A
    • 2007-08-30
    • JP2006042101
    • 2006-02-20
    • Asahi Glass Co Ltd旭硝子株式会社
    • SHIN NAOKOOYAMA TAKUJI
    • G02B5/30G02F1/1335
    • PROBLEM TO BE SOLVED: To provide a polarization separating film through which a large quantity of p-waves is transmitted, an illuminator for a liquid crystal display element, of which the rate of p-waves contained in emitted light is large, and a liquid crystal display device with high luminance. SOLUTION: The polarization separating film 10 has a film base material 12, and niobium oxide layers 14 formed on both faces of the film base material 12. The illuminator for the liquid crystal display element is equipped with a light guide plate, a light source arranged on the side face of the light guide plate, the polarization separating film disposed on the light emission side of the light guide plate, and a light reflection body disposed opposite to the polarization separating film with the light guide plate interposed in between. The liquid crystal display device is equipped with the liquid crystal display element, and the illuminator for the liquid crystal display element disposed on the rear face side of the liquid crystal display element. COPYRIGHT: (C)2007,JPO&INPIT
    • 要解决的问题:为了提供透射大量p波的偏振分离膜,发射光中包含的p波的速率大的液晶显示元件用照明器, 以及具有高亮度的液晶显示装置。 解决方案:偏振分离膜10具有膜基材12和形成在膜基材12的两面上的铌氧化物层14.用于液晶显示元件的照明器配备有导光板, 布置在导光板的侧面上的光源,设置在导光板的发光侧的偏振分离膜和与偏振分离膜相对设置的光反射体,导光板插入其间。 液晶显示装置配备有液晶显示元件和设置在液晶显示元件的背面侧的液晶显示元件用照明器。 版权所有(C)2007,JPO&INPIT
    • 4. 发明专利
    • LIGHT ABSORBING REFLECTION PREVENTING FILM
    • JP2000193801A
    • 2000-07-14
    • JP37128198
    • 1998-12-25
    • ASAHI GLASS CO LTD
    • OYAMA TAKUJI
    • B32B7/02C03C17/34G02B1/11G02B1/115
    • PROBLEM TO BE SOLVED: To satisfy low surface resistance and proper visible ray absorbtance and obtain light absorbing reflection preventing film whose reflectance is low against incidental light from the film surface and the reflection side by forming on a base plate in order from the base plate side a first light absorbing film, minute absorbing high refractive index film, a second light absorbing film, and a transparent low refractive index film. SOLUTION: On a base plate 10, in the order from the base plate 10 side, a first light absorbing film 11, a minute absorbing high refractive index film 12, a second light absorbing film 13, and a transparent low refractive index film 14 are formed, and hence a light absorbing reflection preventing film is formed. At this time, for the geometrical film thickness of the first light absorbing film 11, it is desirable to be in the range of 10-30 nm for realizing low reflection. Further, the film thickness of the minute absorbing high refractive index film 12 on the upper layer is desirable to be between 5 and 20 nm. Meanwhile for the film thickness of the second light absorbing film 13, it is desirable to be 1-8 nm. Further for the film thickness of the transparent low refractive index film 14 is desirable to be in the range of 50-90 nm in a viewpoint of preventing reflection.
    • 9. 发明专利
    • VAPOR DEPOSITION DEVICE
    • JPH06340967A
    • 1994-12-13
    • JP15614193
    • 1993-06-02
    • ASAHI GLASS CO LTD
    • SHIMIZU JUNICHIHASHIMOTO NAOKIOYAMA TAKUJI
    • C23C14/32C23C14/54
    • PURPOSE:To develop a vapor deposition device excellent in reproducibility, working rate and mass-productivity at the time of forming a deposited film on the surface of a substrate in a plasma current utilizing an arc discharge by arranging a permanent magnet under a vapor-deposition material and vertically moving the magnet. CONSTITUTION:A substrate 2 of glass, plastics, etc., with the face to be formed with a film turned downward is arranged in a plasma film forming chamber 1. The chamber 1 is evacuated, a gaseous reactant 11 such as oxygen and nitrogen is introduced, and a vapor deposition material 3 in a vessel 4 is irradiated with a plasma current from a plasma gun 5 by means of a coil 6 and a magnetic field generated by a permanent magnet 7 and vaporized to form the film of the material 3 on the lower face 2. In this case, the magnet 7 is moved in the vertical direction 9 by a position control mechanism 8, hence the magnetic flux density is kept constant on the material surface even if the material 3 is vaporized and reduced in volume and the surface is lowered, a stabilized deposition reaction is maintained, and a deposited film is formed with excellent reproducibility, working rate and mass-productivity.
    • 10. 发明专利
    • TRANSMISSION TYPE SOLAR CELL
    • JPH05145096A
    • 1993-06-11
    • JP33400591
    • 1991-11-22
    • ASAHI GLASS CO LTD
    • ADACHI KUNIHIKOMATSUI TAKESHIOYAMA TAKUJI
    • H01L31/04
    • PURPOSE:To improve the transmittance of a transmission solar cell without sacrificing a solar cell formation area by a method wherein the constitution of a rear electrode is formed into a multilayer structure, which is obtained by laminating in order an inorganic compound film, a metal film and an inorganic compound film and consists of the three layers. CONSTITUTION:When a rear electrode is formed into a three-layer structure of an inorganic compound film 4, a metal film 5 and an inorganic compound film 6, the spectral reflectivity of light, which is reflected in a photoactive layer by the rear electrode and returns, is changed by the constitutions of the respective film thicknesses of the three layers of the films 4, 5 and 6. The spectral transmittance of light, which is reflected from the rear electrode to the photoactive layer, and the spectral transmittance of light, which is transmitted to the side of the atmosphere through the rear electrode, are specified by limiting the film thickness of each layer of this rear electrode in a specified range. The wavelength of the light at the minimum point of reflection is decided by the film thickness of the film 4 and the wavelength of the light at the maximum point of reflection and the reflectivity of the light are decided by the film thickness of the film 6. It is desirable that the film thickness of the film 4 is 600 to 800Angstrom or 1500 to 2000Angstrom from the viewpoint of a conversion efficiency, and is 1500 to 2000Angstrom from the viewpoint of a transmittance. Accordingly, it is desirable that it is finally 1500 to 2000Angstrom .