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    • 8. 发明专利
    • DETECTION OF LEAK POINT OF CONTAINER BY GAS INTRODUCTION SYSTEM
    • JPS61246644A
    • 1986-11-01
    • JP8794085
    • 1985-04-24
    • JAPAN ATOMIC ENERGY RES INST
    • NAKAMURA KAZUYUKI
    • G01M3/20
    • PURPOSE:To facilitate detection of a fine leak point, by a method wherein the inside of a container to be detected is exhausted, a gas B different from a container ambient gas A is fed into a container simultaneously with the stoppage of the exhaustion and after it is allowed to stand for a while, the concentration distribution of the gas A contained in the introduced gas B is measured. CONSTITUTION:The inside of a container 4 to be detected is exhausted with an exhauster 7 down to the molecular flow condition (condition of average free stroke of gas molecules more than doubling the max. length of the container 4), for example, below 1X10 Torr. Simultaneously with the stoppage of the exhaustion, a gas B different from the ambient gas A of the container 4 is fed into the container via a valve 6 at the pressure of 200Torr, after the container is allowed to stand for 30min on the condition of restricting the diffusion of the gas A, a tubule 2 mounted a manipulator 3 is operated with a driving source 12 to introduce the gas sampled with the tubule 2 into a mass spectrograph 9. This facilitates the detection of a leak point utilizing that a higher concentration of the gas A is given closer to the leak point 1. Especially, this method is ideal for the detection of a fine leak point of a large and complicated container such as semiconductor manufacturing equipment and spacer ships.