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1. 发明专利

JP2003166923A HARDNESS TESTER AND HARDNESS TESTING METHOD 审中-公开
公开(公告)号：JP2003166923A
公开(公告)日：2003-06-13
申请号：JP2001366772
申请日：2001-11-30
申请人： AKASHI CORP , MITUTOYO CORP
发明人： FURUTA EIJI , SATO YASUNORI , TSUJII MASAHARU , KOMATSU KOICHI , YOSHIKI RYOICHI
IPC分类号： G01N3/42
摘要： PROBLEM TO BE SOLVED: To provide a hardness tester and a hardness testing method, capable of efficiently measuring the hardness of samples of different thickness and samples of unspecific shapes and improving the reliability of measurement results. SOLUTION: In the hardness tester 1, the image of a sample surface is photographed by a first imaging means (31) to obtain the image of the sample surface, the contour of the sample is extracted by a contour-extracting means (92) on the basis of the image, and a point of hardness measurement is set by a measurement point setting means (92). The coordinates of a location, at which the point of measurement of the sample is in focus, are determined by focus positioning means (32 and 92). On the basis of the obtained coordinates, by a means (5) for elevating and lowering a hardness measuring part (4), the hardness-measuring part (4) is vertically moved to location, at which the point of measurement of the sample is in focus. Then the sample is horizontally moved by a horizontally moving means (7) to a location, at which the point of measurement of the sample is opposed to an indenter of the hardness measuring part. COPYRIGHT: (C)2003,JPO

2. 发明专利

JPH11351824A COORDINATE SYSTEM CORRECTING METHOD AND IMAGE MEASURING INSTRUMENT 失效
公开(公告)号：JPH11351824A
公开(公告)日：1999-12-24
申请号：JP15952998
申请日：1998-06-08
申请人： MITUTOYO CORP
发明人： KOMATSU KOICHI , YOSHIKI RYOICHI
IPC分类号： G01B11/00
摘要： PROBLEM TO BE SOLVED: To provide an image measuring instrument which automatically corrects the coordinate system of a work and efficiently executes a measuring procedure file. SOLUTION: The image measuring instrument has a noncontact type measuring instrument body 1 and a computer system 2 which drives and controls the measuring instrument body 1 and also processes necessary measurement data. To position works 12 in the same shape when they are measured one after another, a specific area of a picked-up image of a starting work is specified as a pattern template, and saved and registered. For 2nd and succeeding works, a pattern matching process is performed between picked-up images and the registered pattern template to automatically correct position deviation and angle deviation and then the measuring procedure file is executed.

3. 发明专利

JP2000055644A IN-LINE MEASURING SYSTEM 失效
公开(公告)号：JP2000055644A
公开(公告)日：2000-02-25
申请号：JP22844798
申请日：1998-08-12
申请人： MITUTOYO CORP
发明人： KAIEDA MAKOTO , TSUNODA EIICHI , NAKAZAWA NOBUYUKI , KOMATSU KOICHI , SUZUKI KOJI , YOSHIKI RYOICHI
IPC分类号： G01B21/00
摘要： PROBLEM TO BE SOLVED: To reduce idleness for a system, and to eliminate inconvenience for system update. SOLUTION: In this measuring system, a control generalizing device 5 for controlling generally respective in-line measuring instruments 3a, 3b introduces image informations for a work required for recognition of the work from the measuring instruments 3a, 3b, to generate individual informations (work pattern, position, important dimension and the like) of the work based on the image informations. The respective measuring instruments 3a, 3b select parametric part programs based on the individual informations, and execute the respective part programs using the individual informations as arguments. Since recognition processing is conducted generally in the control generalizing device 5, a data base or the like required for the processing is used in common.

4. 发明专利

JP2003202208A IMAGE MEASURING DEVICE AND PROGRAM FOR MEASURING IMAGE 审中-公开
公开(公告)号：JP2003202208A
公开(公告)日：2003-07-18
申请号：JP2002000454
申请日：2002-01-07
申请人： MITUTOYO CORP
发明人： ASANO HIDEMITSU , KOMATSU KOICHI , YOSHIKI RYOICHI , MATSUMIYA SADAYUKI
IPC分类号： G01B11/00 , G01B11/02
摘要： PROBLEM TO BE SOLVED: To speedily and simply carry out an alignment adjustment implemented before measurement. SOLUTION: An image picked up by a CCD camera is displayed on a video window 51. A movement target and the image of its vicinity are displayed on a navigation window 52A and a complete image of an object to be measured is displayed on a navigation window 52B. When a 'move' icon is clicked, the CCD camera is driven by an XYZ driving mechanism in accordance with a position data of the movement target in CAD data and the image of the vicinity of the movement target is displayed on the video window 51. When the movement target is moved to the screen center by using a joystick or the like and a 'measure' icon is clicked, the position of the movement target is detected with detection of gravity center. Accordingly the conversion of a coordinate system is carried out. COPYRIGHT: (C)2003,JPO

5. 发明专利

JPH11351841A NONCONTACT TYPE THREE-DIMENSIONAL MEASURING METHOD 失效
公开(公告)号：JPH11351841A
公开(公告)日：1999-12-24
申请号：JP16109998
申请日：1998-06-09
申请人： MITUTOYO CORP
发明人： MATSUMIYA SADAYUKI , KOMATSU KOICHI , YOSHIKI RYOICHI , ASANO HIDEMITSU , ARIGA KOZO
IPC分类号： G01B11/24 , G01B11/00
摘要： PROBLEM TO BE SOLVED: To three-dimensionally measure the flatness of a ball grid array(BGA) of a fine LSI package at a high accuracy. SOLUTION: Two types of measuring means i.e., a CCD camera used in a picture measuring unit and laser probe for noncontactly measuring the displacement, utilizing a laser beam, are provided to constitute a photographing unit 17 which is driven in directions X, Y, Z, based on each measured value to execute the profiling measurement according to specified top scan (zigzag, spiral etc.), pattern over specified area including the top of each ball 104 of the ball grid array of an LSI package 102 along designated measuring path, using the laser probe to obtain three-dimensional dot array data and the flatness evaluation is executed about the obtd. dot array data.

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