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1. 发明专利

JP5460114B2 X-ray diagnostic apparatus 有权
公开(公告)号：JP5460114B2
公开(公告)日：2014-04-02
申请号：JP2009106839
申请日：2009-04-24
申请人：株式会社東芝 , 東芝メディカルシステムズ株式会社 , 東芝医用システムエンジニアリング株式会社
发明人：学田中 , 直高佐藤 , 悟大石 , 邦夫白石 , 章夫手塚 , 章仁高橋
IPC分类号： A61B6/00

2. 发明专利

JP5513856B2 X-ray diagnostic apparatus 有权
公开(公告)号：JP5513856B2
公开(公告)日：2014-06-04
申请号：JP2009261248
申请日：2009-11-16
申请人：株式会社東芝 , 東芝メディカルシステムズ株式会社
发明人：徹加藤 , 久人竹元 , 章仁高橋
IPC分类号： A61B6/00

3. 发明专利

JP4805659B2 X-ray diagnostic imaging apparatus 有权
公开(公告)号：JP4805659B2
公开(公告)日：2011-11-02
申请号：JP2005326335
申请日：2005-11-10
申请人：東芝メディカルシステムズ株式会社 , 株式会社東芝
发明人：章仁高橋
IPC分类号： A61B6/00 , H04N7/18

4. 发明专利

JP5422171B2 X-ray diagnostic imaging apparatus 有权
公开(公告)号：JP5422171B2
公开(公告)日：2014-02-19
申请号：JP2008256495
申请日：2008-10-01
申请人：株式会社東芝 , 東芝メディカルシステムズ株式会社
发明人：章仁高橋
IPC分类号： A61B6/00

5. 发明专利

JP4744831B2 X-ray diagnostic apparatus 有权
公开(公告)号：JP4744831B2
公开(公告)日：2011-08-10
申请号：JP2004262880
申请日：2004-09-09
申请人：東芝メディカルシステムズ株式会社 , 株式会社東芝
发明人：章仁高橋
IPC分类号： A61B6/00 , H04N7/18

6. 发明专利

JP4734365B2 Parameter adjustment method and apparatus for X-ray flat panel detector, x-rays diagnostic apparatus 有权
公开(公告)号：JP4734365B2
公开(公告)日：2011-07-27
申请号：JP2008076712
申请日：2008-03-24
申请人：株式会社東芝
发明人：邦夫青木 , 章仁高橋
IPC分类号： A61B6/00 , G01T1/20 , G01T1/24 , H04N5/32 , H04N5/335 , H04N5/367 , H04N5/374
摘要： PROBLEM TO BE SOLVED: To provide apparatus which assesses the life of an X-ray planar detector automatically from the temporal transition of temporal transition data of information of the fitting time of an action parameter and such an action parameter. SOLUTION: When adjusting each capacity value of each integral amplifier to amplify each electrical charge which is retrieved from an X-ray planar detector and action parameter which has the gain of each amplifier to amplify output power of each integral amplifier, a pixel value which is outputted from the X-ray planar detector when an X ray is exposed and the reference level range of expected value are compared, the action parameter is determined automatically within the reference level range of the expected value from this comparison result, this determined action parameter and information of the fitting time of such an action parameter are accumulated as temporal transition data, and the life of the X-ray planar detector is assessed automatically from the temporal transition of this temporal transition data. COPYRIGHT: (C)2008,JPO&INPIT

7. 发明专利

JP4550913B2 Parameter adjustment method and apparatus for X-ray flat panel detector, x-rays diagnostic apparatus 有权
公开(公告)号：JP4550913B2
公开(公告)日：2010-09-22
申请号：JP2008076711
申请日：2008-03-24
申请人：株式会社東芝
发明人：邦夫青木 , 章仁高橋
IPC分类号： H04N5/32 , A61B6/00 , G03B42/02 , H04N5/335 , H04N5/365 , H04N5/367
摘要： PROBLEM TO BE SOLVED: To recognize a defect point in an X-ray image and to automatically obtain position information of the defect point. SOLUTION: When adjusting operation parameters including capacitance values of integration amplifiers amplifying charges read from an X-ray plane detector and gains of amplifiers amplifying output of the integration amplifiers, a pixel value which is output from the X-ray plane detector under exposure with X-rays, is compared with a reference level range of expected values. On the basis of a result of the comparison, the operation parameters are automatically determined within the reference level range of expected values and after the determination of the operation parameters, an offset correction coefficient for correcting an offset component of the X-ray plane detector is automatically set. After the offset correction coefficient is completely set, a gain correction coefficient is automatically set so as to provide the pixel value to be output from the X-ray plane detector. After the gain correction coefficient is completely set, X-ray images output from the X-ray plane detector under exposure with X-rays are collected to apply offset correction processing and gain correction processing thereto, a defect point is recognized in these corrected X-ray images, and position information of the defect point is automatically obtained. COPYRIGHT: (C)2009,JPO&INPIT

8. 发明专利

JP4357150B2 Parameter adjustment method and apparatus of the X-ray flat panel detector, x-ray diagnostic apparatus 有权
公开(公告)号：JP4357150B2
公开(公告)日：2009-11-04
申请号：JP2002043485
申请日：2002-02-20
申请人：株式会社東芝
发明人：邦夫青木 , 章仁高橋
IPC分类号： G01T7/00 , H04N5/32 , A61B6/00

9. 发明专利

JP4377571B2 X-ray flat panel detector, x-ray diagnostic imaging apparatus, and the x-ray image correction method 有权
公开(公告)号：JP4377571B2
公开(公告)日：2009-12-02
申请号：JP2002265054
申请日：2002-09-11
申请人：株式会社東芝
发明人：道隆本田 , 章仁高橋
IPC分类号： A61B6/00 , G01T1/17 , A61B6/03 , G06T1/00 , G06T5/00 , G06T5/20 , H01L27/14 , H04N1/409
摘要： PROBLEM TO BE SOLVED: To improve noise correction accuracy and provide a higher quality X-ray diagnostic image less involving horizontal noise than previously. SOLUTION: In a method for correcting X-ray images collected in an X-ray plane detector having a plurality of picture elements arranged in the form of a matrix, a first filter removing a high frequency component is provided in the column direction of the X-ray image, an image for which the first filter is provided is cut off from the X-ray image, a second filter removing a high frequency component is provided in the line direction of the image obtained by the cutoff, and an image for which the second filter is provided is cut off from the X-ray image. COPYRIGHT: (C)2003,JPO

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