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1. 发明专利

JP3557984B2 Dewar and biomagnetic field measuring apparatus using the same 有权
公开(公告)号：JP3557984B2
公开(公告)日：2004-08-25
申请号：JP2000032622
申请日：2000-02-03
申请人：株式会社日立製作所
发明人：典英佐保 , 弘之田中 , 仁笹渕
IPC分类号： A61B5/05 , F17C3/08 , G01R33/035
CPC分类号： F17C3/08 , G01R33/0354 , Y10S505/846

2. 发明专利

JP5520740B2 Consolidated structure and cryogenic storage vessel of the cryogenic storage container 有权
公开(公告)号：JP5520740B2
公开(公告)日：2014-06-11
申请号：JP2010174082
申请日：2010-08-03
申请人：株式会社日立製作所
发明人：弘之田中
IPC分类号： F25B9/00
CPC分类号： F25D19/006 , F25B9/10

3. 发明专利

JP5289784B2 Built-in refrigerator cryogenic container 有权
公开(公告)号：JP5289784B2
公开(公告)日：2013-09-11
申请号：JP2008015018
申请日：2008-01-25
申请人：株式会社日立製作所
发明人：典英佐保 , 尚志磯上 , 弘之田中
IPC分类号： F25B9/14 , F25B21/02 , H01L39/04
CPC分类号： F25B9/14 , F25B21/02 , F25B25/00 , F25B2500/13 , F25D19/006

4. 发明专利

JP4790752B2 Superconducting magnet 有权
公开(公告)号：JP4790752B2
公开(公告)日：2011-10-12
申请号：JP2008116565
申请日：2008-04-28
申请人：株式会社日立製作所
发明人：典英佐保 , 道哉岡田 , 弘之田中 , 尚志磯上 , 雅也高橋
IPC分类号： H01F6/00 , H01L39/20
CPC分类号： H01F6/003 , H01F6/04 , H01L39/20

5. 发明专利

JP4275640B2 Cryogenic cooling equipment 有权
公开(公告)号：JP4275640B2
公开(公告)日：2009-06-10
申请号：JP2005101001
申请日：2005-03-31
申请人：株式会社日立製作所
发明人：典英佐保 , 芳紹堤 , 克彦浅野 , 弘之田中 , 祐三福田
IPC分类号： G01R33/32 , F16L53/00 , F25B9/00
摘要： PROBLEM TO BE SOLVED: To provide an inexpensive cryogenic cooling device, less consuming electric power, and excellent in installability, with the cooling device used for cooling the interior of a low-temperature probe head used in an NMR device. SOLUTION: This cryogenic cooling device is equipped with a first vacuum container having a cooled body within, a freezing machine comprising a plurality of cooling stages, a second vacuum container having a plurality of cooling stages within, first conveyance outward and return pipes 33 and 34 for conveying a cryogenic working medium, and second conveyance outward and return pipes 31 and 32 for conveying a working medium with its temperature lower than that of the working medium. The outward and return pipes 33 and 34 are housed in second conveyance outward and return heat-insulated pipes 81A and 81B, respectively, formed out of flexible tubes and with their interior evacuated. The outward and return pipes 31 and 32, and the heat-insulated pipe 81A and 81B, are non-coaxially housed in a heat-shield pipe 83 so as to have gaps between them severally independently, the pipe 83 formed out of a flexible pipe with its interior filled with a gas. COPYRIGHT: (C)2007,JPO&INPIT

6. 发明专利

JP4006165B2 Elemental analyzer and scanning transmission electron microscope, as well as elemental analysis method 有权
公开(公告)号：JP4006165B2
公开(公告)日：2007-11-14
申请号：JP2000120678
申请日：2000-04-21
申请人：株式会社日立製作所
发明人：弘之田中 , 俊陸田谷 , 成人砂子沢 , 和利鍛示 , 青山　　隆
IPC分类号： G01N23/04 , H01J37/28 , G01N23/06 , H01J37/22 , H01J37/244
摘要： PROBLEM TO BE SOLVED: To provide an element analyzing apparatus capable of displaying an element distribution image of an object to be analyzed with a high contrast, and deciding positions of the element distribution with high precision, and also provide a scanning transmission electron microscope using it, and an element analyzing method. SOLUTION: The element analyzing apparatus is provided with a scattered electron beam detector for detecting electron beams scattered by the object to be analyzed; an electron spectroscope for performing energy dispersion of the electron beam transmitted by the object to be analyzed; an electron detector for detecting the dispersed electron beam; and a control device for analyzing elements of the object to be analyzed based on output signals of the electron beam detected by the electron beam detector, and output signals of the electron beam detected by the scattered electron beam detector. The apparatus is also provided with an electron beam source, an electron beam scanning coil, a scattered electron beam detector, an objective lens, an imaging lens, an expanding magnetic field lens, and a magnetic field lens for focus adjustment. And a control device is also provided, which is capable of observing the element distribution image and a Z contrast image simultaneously in real time, and correcting the element distribution image with the Z contrast image.

7. 发明专利

JP3968211B2 Weak magnetic field measurement Dewar 有权
公开(公告)号：JP3968211B2
公开(公告)日：2007-08-29
申请号：JP2000264379
申请日：2000-08-31
申请人：株式会社日立製作所
发明人：典英佐保 , 弘之田中 , 笹渕　　仁
IPC分类号： H01L39/04 , A61B5/05 , F17C3/08 , F17C3/10 , F17C13/00 , F25J1/00 , G01R33/035
CPC分类号： F25J1/0276 , F17C3/085 , F17C3/10 , F17C2201/0119 , F17C2203/0687 , F17C2221/017 , F17C2223/0161 , F17C2270/0509 , F25J2270/912 , F25J2290/42 , G01R33/0354 , H01F6/04
摘要： A minimal magnetic-field measurement Dewar vessel includes an inner container which contains a superconducting device and cooling medium, a radiation shield which is composed of an electrical insulation substrate and a first and second plurality of thin line stripes provided on opposite surfaces of the electrical insulation substrate so that the first plurality of thin line stripes is electrically insulated from the second plurality of thin line stripes and provided in a high stripe dense state, an outer container, and a cooling apparatus. A width of one portion of at least one of the first and second plurality of thin line stripes arranged in one area of the radiation shield surrounding the superconducting device is smaller than a width of another portion of the at least one of the first and second plurality of thin line stripes arranged in another area of the radiation shield, respectively.

8. 发明专利

JP3732299B2 Transmission electron microscope 失效
公开(公告)号：JP3732299B2
公开(公告)日：2006-01-05
申请号：JP4677897
申请日：1997-02-28
申请人：株式会社日立製作所
发明人：貴之井上 , 智弘大庭 , 弘之田中 , 成人砂子沢
IPC分类号： H01J37/22 , H01J37/295

9. 发明专利

JP5086920B2 Cryogenic storage vessel and cryogenic equipment 有权
公开(公告)号：JP5086920B2
公开(公告)日：2012-11-28
申请号：JP2008173190
申请日：2008-07-02
申请人：株式会社日立製作所
发明人：功萩谷 , 弘之田中 , 武夫根本 , 典英佐保
IPC分类号： H01L39/04 , F25B9/00 , H01F6/00 , H01F6/04
CPC分类号： F25D19/00 , H01F6/04

10. 发明专利

JP5033772B2 Sample low-temperature storage container and biological transport support system 有权
公开(公告)号：JP5033772B2
公开(公告)日：2012-09-26
申请号：JP2008295110
申请日：2008-11-19
申请人：株式会社日立製作所
发明人：直子中山 , 典英佐保 , 功北川 , 紘太郎千葉 , 義人安川 , 大介松家 , 佐知田中 , 弘之田中 , 真実秤 , 梓網野 , 功萩谷 , 浩之豊田 , 章野見山 , 真二郎齋藤
IPC分类号： G01N1/28 , B01L7/00 , B65G1/00 , F25D3/10 , F25D13/00 , G01N35/00 , G01N35/02
CPC分类号： A01N1/0257 , B01L3/508 , B01L7/50 , B01L2200/143 , B01L2200/18 , B01L2300/024 , G01N1/42
摘要： A sample low-temperature storage case enabling the recipient of the sample to easily check a good condition of the sample when the recipient receives the sample and not using a sublime or evaporative cooling medium such as liquid nitrogen and a transportation business supporting system using the sample low-temperature storage case are disclosed. The storage case has a structure in which a sample storage case (S) contained in a storage case (11) is cooled and held at a low temperature by a Stirling refrigerator (15)- A detection elementl(18) is disposed in a room-temperature area of the storage case (100). The chemical or physical property of the detection element (18) varies when a contaminant adheres to the detection element (18). Entrance of a contaminant into the storage case (100) can be checked by contactlessly checking the detection element (18) from the outside of the storage case (100). The storage case (100) includes a server for receiving the result of the check from the detection device (30), storing the result, and setting up connection via a communication line to at least two out of a terminal operable by the forwarder, a terminal operable by the carrier, and a terminal operable by the recipient to transmit the result to the two.

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