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    • 4. 发明专利
    • Compound for organic thin film transistor and organic thin film transistor using the same
    • 有机薄膜晶体管及其有机薄膜晶体管的化合物
    • JP2012067051A
    • 2012-04-05
    • JP2010215346
    • 2010-09-27
    • Idemitsu Kosan Co Ltd出光興産株式会社
    • IKEDA YOICHISAITO MASATOSHIKONDO HIROSHITERAI KOTA
    • C07C15/20H01L29/786H01L51/05H01L51/30H01L51/40
    • PROBLEM TO BE SOLVED: To provide a compound for an organic thin film transistor, having oxidation stability and solubility applicable to a coating process.SOLUTION: The compound for an organic thin film transistor is represented by formula (1) (wherein R-Rare each a hydrogen atom, a halogen atom, 1C-30C alkyl, 2C-30C alkenyl, 2C-30C alkynyl, 1C-30C haloalkyl, 1C-30C alkoxy, 1C-30C haloalkoxy, 1C-30C thioalkyl, 1C-30C haloalkylthio, 1C-30C alkylamino, 2C-60C dialkylamino (alkyls may be mutually bound to form a nitrogen-containing ring structure), ring-forming 6C-30C arylamino, 1C-30C alkylsulfonyl, 1C-30C haloalkylsulfonyl, a ring-forming 6C-60C aromatic hydrocarbon group, a ring-forming 5C-60C aromatic heterocyclic group, 3C-20C alkylsilyl, 5C-60C alkylsilylethynyl or cyano and these groups each may contain a substituent, with proviso that a case in which all of R-Rare hydrogen atoms is omitted).
    • 要解决的问题:提供一种有机薄膜晶体管的化合物,其具有适用于涂覆工艺的氧化稳定性和溶解度。 解决方案:用于有机薄膜晶体管的化合物由式(1)表示(其中R 1 -R 12 各自为氢原子,卤素原子,1C-30C烷基,2C-30C烯基,2C-30C炔基,1C-30C卤代烷基,1C-30C烷氧基,1C-30C卤代烷氧基,1C-30C硫代烷基,1C-30C卤代烷硫基 ,1C-30C烷基氨基,2C-60C二烷基氨基(烷基可以相互结合形成含氮环结构),形成环的6C-30C芳基氨基,1C-30C烷基磺酰基,1C-30C卤代烷基磺酰基, 60C芳族烃基,成环5C-60C芳族杂环基,3C-20C烷基甲硅烷基,5C-60C烷基甲硅烷基乙炔基或氰基,这些基团各自可以含有取代基,条件是所有的R 1 -R 12 是省略氢原子。 版权所有(C)2012,JPO&INPIT
    • 9. 发明专利
    • Sputtering target
    • 飞溅目标
    • JP2011181722A
    • 2011-09-15
    • JP2010045046
    • 2010-03-02
    • Idemitsu Kosan Co Ltd出光興産株式会社
    • EBATA KAZUAKIYANO KIMINORITERAI KOTA
    • H01L21/363C23C14/34
    • PROBLEM TO BE SOLVED: To provide a sputtering target capable of suppressing a nodule generated when performing sputtering film formation using a target added with a minute amount of Cu, and stably obtaining an oxide semiconductor film with high repeatability. SOLUTION: The sputtering target is formed of a metal oxide sintered body which contains an In element and a Cu element and may further contains a Zn element. In the sputtering target, an atom ratio Cu/all metal elements of a Cu element to all metal elements in the metal oxide sintered body is 0.001-0.09. COPYRIGHT: (C)2011,JPO&INPIT
    • 要解决的问题:提供一种能够抑制使用添加有少量Cu的靶进行溅射成膜时产生的结节的溅射靶,并且稳定地获得具有高重复性的氧化物半导体膜。 解决方案:溅射靶由含有In元素和Cu元素的金属氧化物烧结体形成,并且还可以含有Zn元素。 在溅射靶中,金属氧化物烧结体中Cu元素与所有金属元素的原子比Cu /全部金属元素为0.001-0.09。 版权所有(C)2011,JPO&INPIT