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1. 发明专利

JP4728502B2 Capacitor test equipment 有权
公开(公告)号：JP4728502B2
公开(公告)日：2011-07-20
申请号：JP2001128095
申请日：2001-04-25
申请人：株式会社高見沢サイバネティックス , 株式会社高見沢メックス
发明人：浩幸畠山
IPC分类号： G01R27/26 , G01R31/00 , H01G13/00

2. 发明专利

JP3963727B2 Seismic waveform data collection device and the seismic observation system 有权
公开(公告)号：JP3963727B2
公开(公告)日：2007-08-22
申请号：JP2002006276
申请日：2002-01-15
申请人：株式会社高見沢サイバネティックス , 株式会社高見沢メックス
发明人：芳紀篠原 , 敬明飯森
IPC分类号： G01V1/22 , G01H1/00

3. 发明专利

JP3808480B2 Seismic instrument and seismometer system 有权
公开(公告)号：JP3808480B2
公开(公告)日：2006-08-09
申请号：JP2004188462
申请日：2004-06-25
申请人：株式会社高見沢サイバネティックス , 株式会社高見沢メックス
发明人：正由稲寺
IPC分类号： G01H1/00 , G01P15/18 , G01P21/00 , G01V1/16
摘要： PROBLEM TO BE SOLVED: To provide high-reliability seismoscope and seismometer capable of surely detecting a failure of an acceleration sensor. SOLUTION: The seismoscope 2 is provided with acceleration sensors 21 to 24. The measuring axis direction vectors 21a to 24a of the acceleration sensors 21 to 24 are set to be nearly the same angle with each other. If an acceleration is added to the seismoscope 2, each acceleration sensor 21 to 24 detects acceleration component in accordance with the measuring axis directions 21a to 24a. By arranging the acceleration sensors 21 to 24 in this manner, vector sum of each acceleration component always becomes below a constant value for omnidirectional acceleration. In the case that any of the acceleration sensors fails, this law is not formed and the vector sum of each acceleration component exceeds a constant value. Therefore, a failure of the acceleration sensors 21 to 24 can be surely detected. COPYRIGHT: (C)2006,JPO&NCIPI

4. 发明专利

JP4728498B2 Capacitor test equipment 有权
公开(公告)号：JP4728498B2
公开(公告)日：2011-07-20
申请号：JP2001101087
申请日：2001-03-30
申请人：株式会社高見沢サイバネティックス , 株式会社高見沢メックス
发明人：浩幸畠山
IPC分类号： G01R27/26 , G01R31/00 , H01G13/00

5. 发明专利

JP4191874B2 Uninterruptible power system 有权
公开(公告)号：JP4191874B2
公开(公告)日：2008-12-03
申请号：JP2000085196
申请日：2000-03-24
申请人：株式会社高見沢サイバネティックス , 株式会社高見沢メックス
发明人：正俊油井
IPC分类号： H02J9/06 , H02M3/28

6. 发明专利

JP4022702B2 Battery charge / discharge test apparatus equipped with a charging and discharging unit and the unit for battery testing 失效
公开(公告)号：JP4022702B2
公开(公告)日：2007-12-19
申请号：JP13719798
申请日：1998-05-19
申请人：株式会社高見沢サイバネティックス , 株式会社高見沢メックス
发明人：正俊油井
IPC分类号： G01R31/36 , H02J7/00
CPC分类号： Y02E70/40
摘要： PROBLEM TO BE SOLVED: To remove a power loss and prevent heat generation in a charge and discharge testing device, which is composed by combining a power source device with an electron load, and in which a storage part electrode is activated by repeating charge and discharge several times in order to show a prescribed capacity of a battery. SOLUTION: The subject charge and discharge unit 100 for a battery test has a connection to a battery 1 to be tested, received power for charge from the outside, and a terminal 2 for discharge and for the connection to a power receiving/supplying device from/to its periphery and a control device, and besides, circuits 15, 16, by which charge and discharge can be performed efficiently, are provided in the unit. Excess power is supplied to other apparatus by a control program matched to the characteristics of the battery 1 to be tested by combining with peripheral apparatus, to thereby perform a charge and discharge test efficiently.

7. 发明专利

JP2005121256A Temperature test device 有权
标题翻译：温度测试装置
公开(公告)号：JP2005121256A
公开(公告)日：2005-05-12
申请号：JP2003353952
申请日：2003-10-14
申请人： Takamisawa Cybernetics Co Ltd , Takamisawa Mekkusu:Kk , 株式会社高見沢サイバネティックス , 株式会社高見沢メックス
发明人： TSUCHIDA NAOFUMI , MINOWA YOSHIKAZU , INADERA MASAYOSHI
IPC分类号： G01R31/00 , F24F5/00 , G01N25/00
摘要： PROBLEM TO BE SOLVED: To provide a temperature test device having a structure that a test bath is equipped with an opening and capable of favorably controlling temperature in the test bath in a relatively wide setting temperature range.
SOLUTION: The temperature test device 1 has the test bath 3 with the opening 10. Air curtains A1 and A2 are formed at the opening 10 by a first circulation route 21a, a second circulation route 21b and fans 27a and 27b. A control part 30 controls a first cooling part 12a and a second cooling part 12b and a heater 4. When controlling these, the control part 30 controls operation/non-operation of these according to cooling part control rules which specifies operation/non-operation of the first cooling part 12a and the second cooling part 12b based on a setting temperature SV or an in-bath temperature PV. In addition, the plurality of cooling part control rules (a first to a third cooling part control rules) are specified according to a difference Δ between the setting temperature SV and the in-bath temperature PV.
COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：提供一种温度测试装置，其具有测试浴配备有开口并且能够在相对宽的设定温度范围内有利地控制测试浴中的温度的结构。
解决方案：温度测试装置1具有带有开口10的测试槽3.气幕A1和A2通过第一循环路线21a，第二循环路线21b和风扇27a和27b在开口10处形成。控制部分30控制第一冷却部分12a和第二冷却部分12b和加热器4.当控制部分30进行控制时，控制部分30根据指定操作/不操作的冷却部分控制规则控制它们的操作/不操作的第一冷却部12a和第二冷却部12b基于设定温度SV或槽内温度PV。此外，根据设定温度SV和浴间温度PV之间的差Δ来规定多个冷却部控制规则（第一至第三冷却部控制规则）。版权所有（C）2005，JPO＆NCIPI

8. 发明专利

JP4348159B2 Temperature test equipment 有权
公开(公告)号：JP4348159B2
公开(公告)日：2009-10-21
申请号：JP2003353952
申请日：2003-10-14
申请人：株式会社高見沢サイバネティックス , 株式会社高見沢メックス
发明人：直文土田 , 正由稲寺 , 由和箕輪
IPC分类号： F24F5/00 , G01R31/00 , B01L7/00 , G01N25/00

9. 发明专利

JP4060454B2 Power supply test equipment 有权
公开(公告)号：JP4060454B2
公开(公告)日：2008-03-12
申请号：JP23644498
申请日：1998-08-07
申请人：株式会社高見沢サイバネティックス , 株式会社高見沢メックス
发明人：正俊油井 , 敬明飯森
IPC分类号： G01R31/00 , G05F1/10

10. 发明专利

JP4871458B2 Data conversion devices and telemetry equipment 有权
公开(公告)号：JP4871458B2
公开(公告)日：2012-02-08
申请号：JP2001179006
申请日：2001-06-13
申请人：株式会社高見沢サイバネティックス , 株式会社高見沢メックス
发明人：直則根矢 , 正由稲寺
IPC分类号： G08C19/00 , H03M1/12 , H04Q9/00

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