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    • 5. 发明专利
    • Wiring board and a method of manufacturing the same
    • 空值
    • JP4983113B2
    • 2012-07-25
    • JP2006178142
    • 2006-06-28
    • 株式会社トッパンNecサーキットソリューションズ
    • 博文 中村卓 石岡
    • H05K3/46H01L23/12
    • H01L24/97H01L2224/04105H01L2224/18H01L2224/32225H01L2224/73267H01L2224/92244H01L2224/97H01L2224/83
    • PROBLEM TO BE SOLVED: To provide a wiring substrate with a built-in electron device that has high reliability in electrical connection of vias connected to the electron device in the wiring substrate with a built-in electron device, and to provide its manufacturing method. SOLUTION: A thermal expansion coefficient in a first region 11 is lower than that in a second region 12 other than the first region 11 in an insulating layer contacting with at least one face of the electron device 2. It is preferable that the insulating layer is a prepreg, and a reinforcement-material density in the first region 11 is higher than that of in the second region 12. By this, it is possible to improve reliability in connection of the vias while reducing a thermal-expansion-coefficient difference between the electron device 2 and the first region 11. COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:为了提供具有内置电子器件的布线基板,其具有与内置电子器件连接到布线基板中的电子器件的通孔的电连接的高可靠性,并且提供其 制造方法。 解决方案:在与电子器件2的至少一个表面接触的绝缘层中,第一区域11中的热膨胀系数低于除第一区域11之外的第二区域12中的热膨胀系数。优选地, 绝缘层是预浸料坯,并且第一区域11中的增强材料密度高于第二区域12中的增强材料密度。由此,可以提高通孔连接的可靠性,同时降低热膨胀系数 电子设备2和第一区域11之间的差异。版权所有(C)2008,JPO&INPIT
    • 10. 发明专利
    • Subunit substrate
    • 子电子基板
    • JP2007242879A
    • 2007-09-20
    • JP2006063001
    • 2006-03-08
    • Nec Toppan Circuit Solutions Inc株式会社トッパンNecサーキットソリューションズ
    • KIKUCHI HIDEOSHIMA TOSHIYUKIKAMATA MITSUAKI
    • H01L23/12
    • PROBLEM TO BE SOLVED: To provide a subunit substrate effective to reduce a ground bounce generated by the resonance of an LC resonance circuit composed of parasitic capacitance and parasitic inductance.
      SOLUTION: The subunit substrate 1 has a region where a sub substrate power supply layer 3 having a sub substrate power supply pattern 35 and a sub substrate ground layer 2 having a ground pattern 21 face each other via an insulating layer. For a sub-substrate power supply pattern with a size D half or more of the size of the subunit substrate the number n of sub-substrate power supply terminals connected to the sub-substrate power supply pattern is 2.9*h/t or more, where (h) is the height of the sub-substrate power supply terminal and (t) is an interval between the sub-substrate power supply pattern and the ground pattern or an overlapping area of the sub-substrate power supply pattern, and the ground pattern is 0.25 or less of the area of the subunit substrate and is 0.35*(n*t/h) or more.
      COPYRIGHT: (C)2007,JPO&INPIT
    • 要解决的问题:提供一种有效地减少由寄生电容和寄生电感组成的LC谐振电路的谐振产生的接地反弹的子单元基板。 解决方案:子单元基板1具有通过绝缘层具有副基板电源图案35的副基板电源层3和具有接地图案21的副基板接地层2的区域。 对于尺寸为子单元基板尺寸的半数以上的子基板电源图案,与子基板电源图案连接的子基板电源端子的数量n为2.9×h / t以上, 其中(h)是子基板电源端子的高度,(t)是子基板电源图案和接地图案之间的间隔或者子基板电源图案的重叠区域,以及地面 图案为亚基底物面积的0.25以下,为0.35 *(n * t / h)以上。 版权所有(C)2007,JPO&INPIT