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1. 发明专利

JP4944231B2 Solar cell evaluation apparatus and a light source evaluation device used to it 有权
公开(公告)号：JP4944231B2
公开(公告)日：2012-05-30
申请号：JP2010180396
申请日：2010-08-11
申请人：コニカミノルタセンシング株式会社 , 株式会社相馬光学
发明人：力大倉 , 宜弘西川
IPC分类号： H01L31/04 , G01J1/00 , G01J3/02 , G01J3/28 , G01M11/00 , G01R31/26
CPC分类号： G01R31/2605 , G01J1/32 , G01J1/44 , H02S50/10
摘要： With a light source evaluation device 10 according to the present invention and a solar cell evaluation device 1 employing the same, a dependency P (», Ib) for each wavelength » of a short-circuit current Ib generated by white bias light of a measurement target solar cell 2, which is pre-measured at each of a plurality (i) of irradiance levels, is regarded as a spectral responsivity Pi (») at each irradiance level, and a value for adjusting a light quantity of an illumination light source 3 that illuminates the solar cell 2 is computed using a spectral responsivity Ps (»), which is computed using the spectral responsivity Pi (»), a pre-supplied spectral irradiance S (») of reference sunlight, and a pre-measured spectral irradiance L (») of the illumination light source 3. Therefore the light source evaluation device 10 having this configuration and the solar cell evaluation device 1 employing the same can accurately adjust the light quantity of the illumination light source 3 when evaluating the solar cell 2 of which spectral responsivity changes depending on the light quantity.

2. 发明专利

JPWO2010058649A1 太陽電池評価装置および太陽電池評価方法有权
公开(公告)号：JPWO2010058649A1
公开(公告)日：2012-04-19
申请号：JP2010539183
申请日：2009-09-15
申请人：コニカミノルタセンシング株式会社
发明人：宜弘西川 , 宜弘西川
IPC分类号： H01L31/04
CPC分类号： G01R31/045 , H02S50/10
摘要：太陽電池評価装置1では、測定対象の太陽電池2における分光応答度P(λ)が予め測定され、太陽電池2の評価の際には、照明光の分光放射照度L(λ)が測定され、その照明光での太陽電池2の発電電力ELが測定され、そして、この測定された太陽電池2の発電電力ELが基準太陽光による分光放射照度S(λ)の照射光を照射した場合に太陽電池2で発電される発電電力ESに変換される。このため、太陽電池評価装置1は、ソフトウェア的に校正を行うので、太陽電池の種類が変わっても、簡単にかつ費用をかけずに校正することができる。

3. 发明专利

JP4905193B2 Concave diffraction mirror and spectroscopy apparatus using the same 有权
$Concave diffraction mirror and spectroscopy apparatus using the same$
公开(公告)号：JP4905193B2
公开(公告)日：2012-03-28
申请号：JP2007069351
申请日：2007-03-16
申请人：コニカミノルタセンシング株式会社
发明人：健二井村 , 正之山田 , 賢治金野
IPC分类号： G02B17/06 , G01J3/18 , G01J3/36 , G02B5/18 , G02B17/00
CPC分类号： G01J3/04 , G01J3/18 , G01J3/1838 , G02B5/1861

4. 发明专利

JP4876943B2 Wavelength change compensation system and change in wavelength correction method 有权
公开(公告)号：JP4876943B2
公开(公告)日：2012-02-15
申请号：JP2007021956
申请日：2007-01-31
申请人：コニカミノルタセンシング株式会社
发明人：健二井村 , 猛松本
IPC分类号： G01J3/02 , G01J3/18 , G01J3/36 , G02B5/18
CPC分类号： G01J3/18 , G01J3/02 , G01J3/027 , G01J3/28 , G01J3/2803 , G01J2003/2866

5. 发明专利

JP2012026962A Measurement instrument 有权
标题翻译：测量仪器
公开(公告)号：JP2012026962A
公开(公告)日：2012-02-09
申请号：JP2010168173
申请日：2010-07-27
申请人： Konica Minolta Sensing Inc , コニカミノルタセンシング株式会社
发明人： IMURA KENJI
IPC分类号： G01N21/27 , G01N21/33 , G01N21/64
摘要： PROBLEM TO BE SOLVED: To practically and accurately measure spectral characteristics, such as a total spectral emissivity coefficient, of a fluorescent whitening sample under ambient light without using an expensive measurement instrument.SOLUTION: In a weight coefficient setting phase, a non-fluorescent reference sample and a fluorescent reference sample are illuminated by ambient light 4 to acquire spectral distributions Ewe and Ere of light emitted from both samples, and a reference total spectral emissivity coefficient Bre(λ) of the fluorescent reference sample 3 is obtained. The fluorescent reference sample is sequentially illuminated by first and second illuminating light beams to acquire first and second spectral distributions Er1 and Er2, and first and second total spectral emissivity coefficients Br1 and Br2 are obtained. A weight coefficient W(λ) is obtained so as to satisfy Bre(λ)=W(λ)×(Br1(λ)+(1-W(λ)))×Br2(λ). In a measurement phase, a measurement sample 1 is sequentially illuminated by first and second illuminating light beams to obtain first and second total spectral emissivity coefficients Bx1(λ) and Bx2(λ), and a resultant total spectral emissivity coefficient Bc(λ) is obtained in accordance with Bc(λ)=W(λ)×(Bx1(λ)+(1-W(λ)))×Bx2(λ).
摘要翻译：要解决的问题：在不使用昂贵的测量仪器的情况下，在环境光下实际上和精确地测量荧光增白样品的光谱特性，例如总光谱发射率系数。解决方案：在重量系数设定阶段，通过环境光4照射非荧光参考样品和荧光参考样品，以获得从两个样品发射的光的光谱分布Ewe和Ere，以及参考总光谱发射率系数获得荧光基准样品3的Bre（λ）。通过第一和第二照明光束顺序地照射荧光基准样品，以获得第一和第二光谱分布Er1和Er2，并且获得第一和第二总光谱发射率系数Br1和Br2。获得满足Bre（λ）= W（λ）×（Br1（λ）+（1-W（λ）））×Br2（λ）的权重系数W（λ）。在测量阶段，通过第一和第二照明光束顺序地照射测量样品1，以获得第一和第二总光谱发射率系数Bx1（λ）和Bx2（λ），并且所得的总光谱发射率系数Bc（λ）为根据Bc（λ）= W（λ）×（Bx1（λ）+（1-W（λ）））×Bx2（λ）获得。版权所有（C）2012，JPO＆INPIT

6. 发明专利

JP4682630B2 3-dimensional measurement system, inspection method and program 有权
公开(公告)号：JP4682630B2
公开(公告)日：2011-05-11
申请号：JP2005021813
申请日：2005-01-28
申请人：コニカミノルタセンシング株式会社
发明人：伸一堀田 , 浩一藤原 , 修遠山
IPC分类号： G01B21/00 , G01B21/20
摘要： PROBLEM TO BE SOLVED: To provide a technique capable of easily performing inspection by three-dimensional measurements. SOLUTION: This three-dimensional measuring system 1 is provided with a measuring unit 10 for measuring three-dimensional data of an object to be measured; a specification part 34 for specifying the primitive of the object to be measured on the basis of annotation information included in CAD data, and an inspection part 37 for inspecting the dimensions of the object to be measured through the use of data, corresponding to the specified primitive among the three-dimensional data acquired on the object to be measured. COPYRIGHT: (C)2006,JPO&NCIPI

7. 发明专利

JP4639321B2 Biological information measuring device 有权
公开(公告)号：JP4639321B2
公开(公告)日：2011-02-23
申请号：JP2005329259
申请日：2005-11-14
申请人：コニカミノルタセンシング株式会社
发明人：典浩舘田 , 慶郎長井
IPC分类号： A61B5/1455 , A61B5/02 , A61B5/0245
CPC分类号： A61B5/6826 , A61B5/02007 , A61B5/02125 , A61B5/14551 , A61B5/6838
摘要： A vital information measuring device includes: a first light emitter for outputting light having a first wavelength; a second light emitter for outputting light having a second wavelength different from the first wavelength; a light detector for detecting the light outputted from the first light emitter and the light outputted from the second light emitter; an emission controller for controlling the first light emitter and the second light emitter to emit the respective light at sampling frequencies different from each other a detection controller for controlling the light detector to detect the light from the first light emitter and the light from second light emitter in synchronism with the emission timing of the first light emitter and the emission timing of the second light emitter, respectively; and a storage for storing therein a light detection signal outputted from the light detector as measurement data.

8. 发明专利

JP2011035244A Solar simulator 审中-公开
标题翻译：太阳能模拟器
公开(公告)号：JP2011035244A
公开(公告)日：2011-02-17
申请号：JP2009181423
申请日：2009-08-04
申请人： Konica Minolta Sensing Inc , コニカミノルタセンシング株式会社
发明人： NISHIKAWA NOBUHIRO
IPC分类号： H01L31/04
CPC分类号： Y02E10/50
摘要： PROBLEM TO BE SOLVED: To provide a solar simulator for quickly and accurately evaluating an amount of power generation of a solar cell by only controlling a light source without making it necessary to adjust luminance nonuniformity on a light irradiation surface. SOLUTION: By the two-dimensional imaging unit of a solar simulator, the two-dimensional image of a light irradiation surface illuminated is picked up by the illumination unit of the solar simulator, and the light source of the illumination unit is controlled based on the mean value of the output value of each pixel of the acquired two-dimensional image. Thus, it is not necessary to adjust any illumination nonuniformity on the light irradiation surface, and it is possible to provide the solar simulator for quickly and accurately evaluating the amount of power generation of the solar cell by only controlling a light source. COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供一种太阳能模拟器，用于通过仅控制光源而快速且准确地评估太阳能电池的发电量，而不需要调整光照射表面上的亮度不均匀性。解决方案：通过太阳模拟器的二维成像单元，照射的光照射面的二维图像由太阳模拟器的照明单元拾取，照明单元的光源被控制基于所获取的二维图像的每个像素的输出值的平均值。因此，不需要调整光照射面的照射不均匀性，并且可以通过仅控制光源来提供用于快速而准确地评价太阳能电池的发电量的太阳能模拟器。版权所有（C）2011，JPO＆INPIT

9. 发明专利

JP4595042B2 3-dimensional measurement method and a control method and apparatus of the system as well as the manipulator 有权
公开(公告)号：JP4595042B2
公开(公告)日：2010-12-08
申请号：JP2005288227
申请日：2005-09-30
申请人：コニカミノルタセンシング株式会社
发明人：伸一堀田 , 芳久阿部
IPC分类号： G01B11/24 , G01B21/20
CPC分类号： G01B11/25 , G01B11/002

10. 发明专利

JP2010249735A Reflection characteristics measuring device, method therefor, and spectral characteristic measuring device 审中-公开
标题翻译：反射特性测量装置，其方法和光谱特性测量装置
公开(公告)号：JP2010249735A
公开(公告)日：2010-11-04
申请号：JP2009101054
申请日：2009-04-17
申请人： Konica Minolta Sensing Inc , コニカミノルタセンシング株式会社
发明人： SETOGUCHI TOMOMI
IPC分类号： G01J3/50
摘要： PROBLEM TO BE SOLVED: To provide a reflection characteristics measuring device and a method therefor capable of measuring a close spectral reflectance coefficient by visibility, and measuring the reflection characteristics of a sample, based on the spectral reflectance coefficient, and to provide a spectral characteristic measuring device capable of measuring a spectral characteristic of the sample, based on the spectral reflectance coefficient.
SOLUTION: The spectral characteristics measuring device S includes: a measuring part for measuring a first spectral reflectance coefficient of the sample 1, based on a first diffusion illumination condition including regularly reflected light, and measuring a second spectral reflectance coefficient of the sample 1, based on a second diffusion illumination condition which does not include regularly reflected light; and an operation part for determining the spectral reflectance coefficient, by calculating the weighted average of the first spectral reflectance coefficient and the second spectral reflectance coefficient measured by the measuring part.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供一种能够通过可见度测量近光谱反射系数并基于光谱反射系数测量样品的反射特性的反射特性测量装置及其方法，并且提供一种光谱特性测量装置，其能够基于光谱反射系数测量样品的光谱特性。解决方案：光谱特性测量装置S包括：测量部分，用于基于包括规则反射光的第一扩散照明条件测量样品1的第一光谱反射系数，并测量样品的第二光谱反射系数 1，基于不包括规则反射光的第二漫射照明条件; 以及通过计算由测量部分测量的第一光谱反射系数和第二光谱反射系数的加权平均值来确定光谱反射系数的操作部分。版权所有（C）2011，JPO＆INPIT

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