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71. 发明专利

JPH10125278A ION TRAP TYPE MASS SPECTROMETER 失效
公开(公告)号：JPH10125278A
公开(公告)日：1998-05-15
申请号：JP27327396
申请日：1996-10-16
申请人： HITACHI LTD
发明人： NISHIDA TETSUYA
IPC分类号： H01J49/34
摘要： PROBLEM TO BE SOLVED: To determine the proper ionization time for obtaining a sufficient ion quantity with no saturation by applying a fixed signal to the trap field, and excluding the ions other than the aimed peak ions. SOLUTION: The ions ionized by an ionizing device 1 are guided by a guide signal generator 2 to the trap field 3 formed by an RF signal generator (RF)4 and trapped. A signal is applied here by an FF signal generator 5, and the ions other than the ions in the necessary mass range are excluded. The signal applied to the trap field 3 is scanned by the RF 4, and the aimed peak derived ions are discharged from the trap field 3. The ions are detected by an ion detector 6 to obtain a mass spectrum. The timing of these signals is controlled by a control device 7.

72. 发明专利

JPH09274885A MASS SPECTROMETER 失效
公开(公告)号：JPH09274885A
公开(公告)日：1997-10-21
申请号：JP8118696
申请日：1996-04-03
申请人： HITACHI LTD
发明人： TAKADA YASUAKI , SAKAIRI MINORU , NABESHIMA TAKAYUKI , HIRABAYASHI YUKIKO , KOIZUMI HIDEAKI
IPC分类号： G01N27/62 , H01J49/04 , H01J49/06 , H01J49/34 , H01J49/42
摘要： PROBLEM TO BE SOLVED: To provide a mass spectrometer, which can use high drift voltage and of which detecting sensitivity for detecting high-polarity material such as peptide is improved, by providing a potential difference for decelerating ion between an electrode formed with a second narrow hole and an end cap formed with an ion taking. port. SOLUTION: Voltage V to be applied to an electrode 8 formed with a second narrow hole 8 is set lower than the voltage V' to be applied to an end cap 12 formed with an ion taking port 14. The ion decelerated by a potential difference between the voltages V, V' enters a mass spectrometer 11 with the low incident energy, and collides with the collision gas inside 21 of the mass spectrometer and the energy thereof is lost and the ion is sealed in the mass spectrometer, but since the incident energy of the ion is low, the sealing efficiency is improved. With this structure, even in the case where high drift voltage is used, ion can be efficiently accumulated in an ion trap mass spectrometer 11, and a mass spectrometer, of which detecting sensitivity for detecting high polarity material such as peptide is improved, can be obtained.

73. 发明专利

JPH05174783A MASS-SPECTROGPAPHIC DEVICE 失效
公开(公告)号：JPH05174783A
公开(公告)日：1993-07-13
申请号：JP35790791
申请日：1991-12-25
申请人： SHIMADZU CORP
发明人： TANAKA YASUFUMI
IPC分类号： G01N27/62 , H01J49/34
摘要： PURPOSE:To acquire data of the whole mass-spectrum at one time without making mass scan and eliminate necessity for any high grade techniques by furnishing a pulse modulation means, deflecting electrode, ion sensor, saw-teeth wave oscillator, etc. CONSTITUTION:A chopping electrode 4 and a slit 5 constitute a pulse modulation means for ion beam, which is left incident to the slit 5 around the period in which the ion beam is passing by the slit 5, and this is taken into a control data processing device 6 as an all-ion sensing signal. The ion beam emitted to the righthand space of the slit 5 during the pulse period proceeds straight, passes between deflecting electrodes 7, and enters an ion sensor 8. Because a saw-teeth voltage is impressed from a saw-teeth wave oscillator 9 between the two electrodes 7 situated opposedly, the sensor 8 feeds the data processing device 6 with the output from its unitary element while no saw-teeth voltage exists, and this is accumulated as data in a memory 10. The data of the whole mass-spectrum is thereby acquired without making mass scan.

74. 发明专利

JPH0354828B2 失效
公开(公告)号：JPH0354828B2
公开(公告)日：1991-08-21
申请号：JP10428483
申请日：1983-06-13
IPC分类号： H01J49/34 , G01L21/32 , G01N27/62 , H01J49/02 , H01J49/26

75. 实用新型

JPS6436964U 失效
公开(公告)号：JPS6436964U
公开(公告)日：1989-03-06
申请号：JP13262587
申请日：1987-08-31
IPC分类号： G01N27/62 , H01J27/20 , H01J49/14 , H01J49/34

76. 实用新型

JPS6436962U 失效
公开(公告)号：JPS6436962U
公开(公告)日：1989-03-06
申请号：JP13262887
申请日：1987-08-31
IPC分类号： G01N27/62 , H01J49/06 , H01J49/14 , H01J49/34

77. 实用新型

JPS6423866U 失效
公开(公告)号：JPS6423866U
公开(公告)日：1989-02-08
申请号：JP11797687
申请日：1987-07-31
IPC分类号： G01N27/62 , H01J49/12 , H01J49/34

78. 实用新型

JPS6420670U 失效
公开(公告)号：JPS6420670U
公开(公告)日：1989-02-01
申请号：JP11614387
申请日：1987-07-29
IPC分类号： G01N27/62 , H01J49/12 , H01J49/34

79. 发明专利

JPS62256354A APPARATUS FOR ISOMER SEPARATION OR MASS-ANALIZING BY MAGNETIC FIELD 失效
公开(公告)号：JPS62256354A
公开(公告)日：1987-11-09
申请号：JP9500687
申请日：1987-04-17
申请人： COMMISSARIAT ENERGIE ATOMIQUE
发明人： KURISUTOFU JIRU , KURISUCHIYAN GONURA , PIEERU RUBE
IPC分类号： G01N27/62 , B01D59/44 , H01J49/34 , H01J49/38

80. 发明专利

JPS6244947A ION SOURCE FOR MASS SPECTROMETER 失效
公开(公告)号：JPS6244947A
公开(公告)日：1987-02-26
申请号：JP18486685
申请日：1985-08-21
申请人： SHIMADZU CORP
发明人： KUBODERA TOSHIYA , ITOI HIROTO
IPC分类号： G01N27/62 , H01J49/10 , H01J49/14 , H01J49/34 , H01J49/42
摘要： PURPOSE:To prevent intrusion of such ion as having no interest into the analyzing section by forming the ion source box with three-dimensional tetra electrodes while making an ion take-out hole through one endcap and taking out such ions as higher/lower than specific m/z. CONSTITUTION:Analyzing sample is led through a gap between a ring electrode 4 and an endcap electrode 6 into an ion source where it is impinged against an electron beam and ionized. When applying voltage onto the ring electrode 4 and the endcap electrodes 6, 8, m/z ions having unstable Z-axis are projected through an ion take-out hole 14 then taken out through ion take-out electrode 16 and led through an aperture 18 to the analyzing section 20. When employing this ion source as chemical ionization ion source, reaction gas as well as analyzing sample are led into the ion source where the reaction gas led through a gap between the ring electrode 4 and the endcap electrode 6 into the ion source. When applying high frequency voltage and D.C. voltage, three-dimensional tetra electrode can stabilize/unstabilize the ions within random m/z range.

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