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    • 72. 发明专利
    • GLYCOPROTEIN ANALYZING DEVICE
    • JPH05223806A
    • 1993-09-03
    • JP2650292
    • 1992-02-13
    • HITACHI LTD
    • SAKAIRI MINORUHIRABAYASHI TSUDOITAKADA YASUAKIOKANO KAZUNOBU
    • G01N30/88
    • PURPOSE:To conduct a primary structural analysis of a sugar chain in glycoprotein. CONSTITUTION:A glycoprotein analyzing device is constituted of a liquid chromatograph 2, mass spectrometer 5a, gas chromatograph 1, control part 8a, data processing part 8b and sample processing part 7. Among different purpose analyses, analyzing means are used in common; a bond position analysis of a sugar chain of glycoprotein is conducted by constitution of the liquid chromatograph and mass spectrometer, a bond position analysis of carbon among the sugar chains, by constitution of the gas chromatograph and mass spectrometer, an arrangement analysis of the sugar chains and anomer analysis, by constitution of the liquid chromatograph and mass spectrometer or liquid chromatograph. In the arrangement analysis of the sugar chains and anomer analysis wherein sample processing operation is complicated, a series of the sample processing operation and analyzing operation from a digestion reaction to concentration and recovery of a digestion reaction solution are automated. The glycoprotein analyzing device capable of labor saving can be provided at a low cost so as to efficiently conduct the glycoprotein analysis.
    • 75. 发明专利
    • MASS SPECTROMETER
    • JP2000164169A
    • 2000-06-16
    • JP33525698
    • 1998-11-26
    • HITACHI LTD
    • TAKADA YASUAKINABESHIMA TAKAYUKISAKAIRI MINORU
    • H01J49/10G01N21/73G01N27/62H05H1/00
    • PROBLEM TO BE SOLVED: To enhance measuring accuracy by measuring a parameter of plasma, and performing mass spectrometry on an ion of a sample ionized by a plasma ion source. SOLUTION: An atomized sample solution is introduced to a sample introducing pipe 4, and then, to plasma 10 through an ion source 5 to be ionized. In the plasma 10, a parameter such as a temperature and density is measured by a measuring instrument 24. A signal obtained from the measuring instrument 24 is sent to either of an atomizing part 3, a plasma gas supply part 6, a microwave generating part 8, a power source 18 and a mass spectrometer control part 20 via a signal line 22' to control the ion source 5 and a mass spectrometer 19. For example, a plasma temperature is measured by the measuring instrument 24, and when the plasma temperature lowers, output of the microwave generating part 8 is enhanced to prevent reduction in ionizing efficiency to improve quantitatively determining accuracy of a sample. When plasma electric potential changes, an ion optical system 17 and the mass spectrometer 19 are controlled by the power source 18 and the mass spectrometer control part 20 on the basis of the signal of the measuring instrument 24.
    • 78. 发明专利
    • ADJUSTING METHOD OF MASS SPECTROGRAPH
    • JPH1164282A
    • 1999-03-05
    • JP22223097
    • 1997-08-19
    • HITACHI LTD
    • SAKAIRI MINORUTOMIOKA MASARUTAKADA YASUAKI
    • G01N27/62H01J49/42
    • PROBLEM TO BE SOLVED: To shorten the rise time of the whole by mainly adjusting parameters which can be adjusted in the state that the vacuum of the interior of the ion trap mass spectrograph has not completely risen separately from parameters which can be adjusted only in the stage that the vacuum has completely risen. SOLUTION: After the transferring in, assembling, and vacuum-drawing of a device, in the stage that the inside of an ion trap mass spectrograph part is not sufficiently evacuated, the adjustment of an ion source and an ion lens, which are parameters having no relation with the interior pressure, is started. A ground potential or a d.c. voltage is impressed on end cap electrodes 11a and 11b and a ring electrode 12. Ions generated at the ion source are transmitted through the end cap electrodes 11a and 11b and the ring electrode 12, and the total amount of a current is measured. The ion source and the ion lens are adjusted so that the value of the current becomes the maximum. When the interior pressure becomes sufficient during the adjustment, the adjustment of an acceleration voltage of ions and the ion trap mass spectrograph part is started.
    • 79. 发明专利
    • MASS SPECTROMETER AND ION SOURCE
    • JPH10255715A
    • 1998-09-25
    • JP5587997
    • 1997-03-11
    • HITACHI LTD
    • TAKADA YASUAKIHIRABAYASHI YUKIKONABESHIMA TAKAYUKISAKAIRI MINORU
    • G01N27/62H01J49/04H01J49/10
    • PROBLEM TO BE SOLVED: To strongly and stably provide the strength of an ion contained in a sample molecule by minimizing the cross-sectional area of the tip of a capillary of a mass spectrometer at its terminal end. SOLUTION: An effluent from a liquid chromatograph 1 is fed to a capillary 11 through a pipeline 2. When the capillary 11 is heated by a heater 10, the effluent is heated and atomized to form jets 16 of a high speed. At this time, if the cross-sectional area of the capillary 11 is gradually diminished toward the tip, air flows 19 are generated at the tip of the capillary 11, thereby preventing any generation of a vacuum space. As a result, the jets 16 are hardly dispersed, and a sufficient quantity of ions can reach a pore 13a even if a distance 15 is long. Consequently, more ions can be taken through the pore 13a, so that the strength of the ion can be observed strongly by a mass spectrometer. Furthermore, since the jetting direction cannot be changed even if nonvolatile foreign matters are deposited, stable jetting can be performed for a long period. Therefore, it is possible to enhance stability and reproducibility of the liquid chromatograph mass spectrometer.